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2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems最新文献

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Electrical fundamentals 电气基础
2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems Pub Date : 2019-11-07 DOI: 10.1201/9780367822651-1
M. Tooley
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引用次数: 2
The PIC microcontroller PIC微控制器
2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems Pub Date : 2019-11-07 DOI: 10.1201/9780367822651-17
M. Tooley
{"title":"The PIC microcontroller","authors":"M. Tooley","doi":"10.1201/9780367822651-17","DOIUrl":"https://doi.org/10.1201/9780367822651-17","url":null,"abstract":"","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":"88 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2019-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77590372","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
D.C. circuits 华盛顿特区的电路
2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems Pub Date : 2019-11-07 DOI: 10.1201/9780367822651-3
Michael H. Tooley
{"title":"D.C. circuits","authors":"Michael H. Tooley","doi":"10.1201/9780367822651-3","DOIUrl":"https://doi.org/10.1201/9780367822651-3","url":null,"abstract":"","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":"48 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2019-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76220555","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Alternating voltage and current 交流电压和电流
2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems Pub Date : 2019-11-07 DOI: 10.1201/9780367822651-4
M. Tooley
{"title":"Alternating voltage and current","authors":"M. Tooley","doi":"10.1201/9780367822651-4","DOIUrl":"https://doi.org/10.1201/9780367822651-4","url":null,"abstract":"","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":"61 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2019-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84122358","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Electronic applications and the Raspberry Pi 电子应用和树莓派
2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems Pub Date : 2019-11-07 DOI: 10.1201/9780367822651-18
M. Tooley
{"title":"Electronic applications and the Raspberry Pi","authors":"M. Tooley","doi":"10.1201/9780367822651-18","DOIUrl":"https://doi.org/10.1201/9780367822651-18","url":null,"abstract":"","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2019-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89089533","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Amplifiers 放大器
2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems Pub Date : 2018-12-14 DOI: 10.1017/cbo9781107705852.011
MICHAEL TOOLEY
{"title":"Amplifiers","authors":"MICHAEL TOOLEY","doi":"10.1017/cbo9781107705852.011","DOIUrl":"https://doi.org/10.1017/cbo9781107705852.011","url":null,"abstract":"","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":"4 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2018-12-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86920844","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The 555 timer 555定时器
2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems Pub Date : 2012-05-04 DOI: 10.1201/9780367822651-12
M. Tooley
{"title":"The 555 timer","authors":"M. Tooley","doi":"10.1201/9780367822651-12","DOIUrl":"https://doi.org/10.1201/9780367822651-12","url":null,"abstract":"","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":"30 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2012-05-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87975470","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Effective mars rover platform design with Hardware / Software co-design 有效的火星探测器平台设计与硬件/软件协同设计
2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems Pub Date : 2009-04-15 DOI: 10.1109/DDECS.2009.5012117
G. Marosy, Z. Kovács, Gyula Horváth
{"title":"Effective mars rover platform design with Hardware / Software co-design","authors":"G. Marosy, Z. Kovács, Gyula Horváth","doi":"10.1109/DDECS.2009.5012117","DOIUrl":"https://doi.org/10.1109/DDECS.2009.5012117","url":null,"abstract":"Nowadays in embedded system design it is essential to use Hardware/Software (HW/SW) co-design. This paper is about the development of an autonomic mobile navigation with HW/SW co-design. We managed to design such a system that won the first prize at one of the greatest mars rover competitions in Hungary. The paper demonstrates how to keep the project costs and system design process time low with this methodology. The hardware-software partitioning is discussed in details. This paper is going to deal with the possible and already used technologies in details by emphasizing their advantages.","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":"67 1","pages":"148-151"},"PeriodicalIF":0.0,"publicationDate":"2009-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81620460","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
An efficient fault simulation technique for transition faults in non-scan sequential circuits 一种有效的非扫描顺序电路过渡故障仿真技术
2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems Pub Date : 2009-04-15 DOI: 10.1109/DDECS.2009.5012098
A. Bosio, P. Girard, S. Pravossoudovitch, P. Bernardi, M. Reorda
{"title":"An efficient fault simulation technique for transition faults in non-scan sequential circuits","authors":"A. Bosio, P. Girard, S. Pravossoudovitch, P. Bernardi, M. Reorda","doi":"10.1109/DDECS.2009.5012098","DOIUrl":"https://doi.org/10.1109/DDECS.2009.5012098","url":null,"abstract":"This paper proposes an efficient technique for transition delay fault coverage measurement in synchronous sequential circuits. The proposed strategy is based on a combination of multi-valued algebra simulation, critical path tracing and deductive fault simulation. The main advantages of the proposed approach are that it is highly computationally efficient with respect to state-of-the-art fault simulation techniques, and that it encompasses different delay sizes in one simulation pass without resorting to an improved transition fault model. Preliminary results on ITC99 benchmarks show that the gain in terms of CPU time is up to one order of magnitude compared to previous existing techniques.","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":"7 1","pages":"50-55"},"PeriodicalIF":0.0,"publicationDate":"2009-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84486717","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
High-level symbolic simulation for automatic model extraction 用于自动模型提取的高级符号仿真
2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems Pub Date : 2009-04-15 DOI: 10.1109/DDECS.2009.5012132
F. Ouchet, D. Borrione, K. Morin-Allory, L. Pierre
{"title":"High-level symbolic simulation for automatic model extraction","authors":"F. Ouchet, D. Borrione, K. Morin-Allory, L. Pierre","doi":"10.1109/DDECS.2009.5012132","DOIUrl":"https://doi.org/10.1109/DDECS.2009.5012132","url":null,"abstract":"This paper describes VSYML, a symbolic simulator that extracts formal models from VHDL descriptions. The generated models are adequate to formal reasoning in various frameworks. VSYML is a reimplementation of its ancestor Theosim; it brings various improvements e.g., with regard to arrays and other complex data types.","PeriodicalId":6325,"journal":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","volume":"24 1","pages":"218-221"},"PeriodicalIF":0.0,"publicationDate":"2009-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78287552","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
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