2011 Annual Report Conference on Electrical Insulation and Dielectric Phenomena最新文献_第2页

Modelling electroluminescence in insulating polymers under sinusoidal stress: Effect of applied voltage, frequency and offset 正弦应力下绝缘聚合物的电致发光建模:外加电压、频率和偏移的影响

2011 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2011-10-16 DOI: 10.1109/CEIDP.2011.6232782

F. Baudoin, D. Mills, P. Lewin, S. Le Roy, G. Teyssèdre, C. Laurent

引用次数: 4

Partial discharge behaviour within two spherical cavities in a dielectric material 介电材料中两个球腔内的局部放电行为

2011 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2011-10-16 DOI: 10.1109/CEIDP.2011.6232693

H. Illias, G. Chen, P. Lewin

引用次数: 14

An investigation into improving the breakdown strength and thermal conduction of an epoxy system using boron nitride 氮化硼提高环氧体系击穿强度和导热性能的研究

2011 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2011-10-16 DOI: 10.1109/CEIDP.2011.6232737

M. Reading, Alun Vaughan, Paul Lewin

引用次数: 29

Impulse breakdown of extruded cable insulation materials 挤压式电缆绝缘材料的脉冲击穿

2011 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2011-10-01 DOI: 10.1109/CEIDP.2011.6232708

Rongsheng Liu, G. Dominguez, A. Farkas

{"title":"Impulse breakdown of extruded cable insulation materials","authors":"Rongsheng Liu, G. Dominguez, A. Farkas","doi":"10.1109/CEIDP.2011.6232708","DOIUrl":"https://doi.org/10.1109/CEIDP.2011.6232708","url":null,"abstract":"A new test cell is designed for making breakdown test on solid insulation materials for DC cables. Different from a conventional method, the new system uses a specially designed test chamber instead of insulation oil as ambient medium in order to prevent experiment failure from external flashover. The measure eliminates the need of the liquid and has ability to create breakdown data closer to the nature of solid insulation. Lightning impulse breakdown tests were performed on selected insulation materials. Breakdown strength of 400 kV/mm has been obtained for films about 100 μm in thickness. The data was compared with those of model cables tested with a larger thickness of insulation. Breakdown volume theory and up-scale effect are discussed. Power curve fit was made between breakdown strength and the thickness of insulation. A good correlation has been found, which makes it possible to predict the low probability value of breakdown of extruded DC cables at any thickness of insulation. A hypothesis is proposed which indicates that the propagation velocity of breakdown made contributions to the lightning impulse breakdown strength of an insulation material. Higher breakdown strength was found with a lower propagation velocity of a breakdown. The breakdown results show good agreement with data reported by others for the similar materials, and for polyethylene with inorganic fillers the breakdown strength might be slightly decreased.","PeriodicalId":6317,"journal":{"name":"2011 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":"70 1","pages":"518-521"},"PeriodicalIF":0.0,"publicationDate":"2011-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73193068","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Enhancement of electrical insulation performance in power equipment based on dielectric material techniques 基于介电材料技术的电力设备电气绝缘性能的提高

2011 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2011-10-01 DOI: 10.1109/CEIDP.2011.6232785

H. Okubo

引用次数: 5

Dielectric properties of epoxy/Montmorillonite nanocomposites and nanostructured epoxy/SiO2/Montmorillonite microcomposites 环氧/蒙脱土纳米复合材料和纳米结构环氧/SiO2/蒙脱土微复合材料的介电性能

2011 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2011-10-01 DOI: 10.1109/CEIDP.2011.6232667

H. Couderc, S. Savoie, M. Frechette, É. David, F. Guastavino, A. S. Thelakkadan, G. Coletti, A. Fina

{"title":"Dielectric properties of epoxy/Montmorillonite nanocomposites and nanostructured epoxy/SiO2/Montmorillonite microcomposites","authors":"H. Couderc, S. Savoie, M. Frechette, É. David, F. Guastavino, A. S. Thelakkadan, G. Coletti, A. Fina","doi":"10.1109/CEIDP.2011.6232667","DOIUrl":"https://doi.org/10.1109/CEIDP.2011.6232667","url":null,"abstract":"Microcomposites are a well known class of materials. The enhancement of polymer matrix properties can be explained by the classical mixing law. But if the inclusion size is decreased to reach the nanometric range, the improvement of properties is no more due to mixing effect but to the influence of interface of nanoparticles on the matrix. A new emerging class of materials is composites reinforced with microparticles using a polymer matrix reinforced by nanoparticles. In order to study dielectric properties of such new materials, epoxy composites have been prepared using quartz as micro filler and organically modified Montmorillonite as nanofiller. Transmission Electron Microscopy has been used to determine the structure of the composites, which is neither exfoliated nor intercalated although the C30B stacks thickness is in the nanometric range. Differential Scanning Calorimetry experiments have been carried out to highlight the nano and microparticles effect on the epoxy matrix amorphous structure. The glass transition temperature is slightly affected by C30B addition but the microparticles inclusion produces a drastic decrease from 357K to 325K. The heat capacity step is rather unchanged except for the microcomposite. And finally, the dielectric properties of the materials have been studied by Broadband Dielectric Spectroscopy at different temperatures and frequencies. The relaxation times and the dielectric strengths associated with local β and γ relaxations and main α relaxation have been studied.","PeriodicalId":6317,"journal":{"name":"2011 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":"35 1","pages":"346-352"},"PeriodicalIF":0.0,"publicationDate":"2011-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74045796","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 4

Analysis of influence of thermal and voltage treatments on silicone/mica electrical insulation by FT-IR ATR 热、电压处理对硅/云母电绝缘影响的FT-IR ATR分析

2011 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2011-10-01 DOI: 10.1109/CEIDP.2011.6232729

R. Polanský, P. Prosr, V. Mentlík

引用次数: 0

Post-electronic irradiation measurements by PEA and FLIMM methods on dielectric films 电介质薄膜的PEA和FLIMM后电子辐照测量

2011 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2011-10-01 DOI: 10.1109/CEIDP.2011.6232780

T. X. Nguyen, S. Bouchareb, V. Griseri, L. Berquez

引用次数: 8

Parameters affecting the DC breakdown strength of parylene F thin films 影响聚对二甲苯F薄膜直流击穿强度的参数

2011 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2011-10-01 DOI: 10.1109/CEIDP.2011.6232762

R. Khazaka, M. Bechara, S. Diaham, M. Locatelli

{"title":"Parameters affecting the DC breakdown strength of parylene F thin films","authors":"R. Khazaka, M. Bechara, S. Diaham, M. Locatelli","doi":"10.1109/CEIDP.2011.6232762","DOIUrl":"https://doi.org/10.1109/CEIDP.2011.6232762","url":null,"abstract":"The effect of some experimental parameters (electrode area, thickness, temperature and voltage rising rate) on the breakdown strength of films of poly(α,α, α',α'-tetrafluoro-p-xylylene), a fluorinated parylene (PA-F), has been studied. The measurements were performed in air on 20 capacitor structures for each condition and the two parameters of the Weibull distribution (α and β) were fitted to the data. The influences of electrode area (0.28, 4.5 and 18 mm2), film thickness (1.4, 5.0, 9.8, 21.5 and 49.4 μm), for a temperature range from 25°C to 350°C and voltage rising rate between 10 V/s and 100 V/s, have been investigated and discussed for the thinnest films. The thickness increases up to 5 μm leads to an increase in the dielectric strength with increasing the thickness whereas a continuous decrease is observed for higher thicknesses. Those results are correlated to the thickness dependent crystallinity of parylene films. The effect of electrode area, measured on the thinnest films, on the PA-F dielectric strength does not impact the Weibull parameters at 25 °C for high dielectric breakdown field values, whereas it induces a decrease in the β values at low field with increasing electrode area. This highlights the presence of randomly distributed defects in the tested structures. The temperature dependence of the dielectric strength was also investigated between 25°C and 350°C for two different thicknesses (1.4 and 5 μm) and shows negative temperature dependence in both cases. Finally, the effect of the rate of the applied field rising between 0.07 and 0.7 MV/cm.s on the thin films was studied at 25°C and 300°C and does not show any remarkable effect on the Weibull parameters.","PeriodicalId":6317,"journal":{"name":"2011 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":"43 1","pages":"740-743"},"PeriodicalIF":0.0,"publicationDate":"2011-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80047298","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 8

A deeper insight into the application of the enlargement law to HVDC cable lines 扩大定律在高压直流电缆线路中的应用

2011 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2011-10-01 DOI: 10.1109/CEIDP.2011.6232705

M. Marzinotto, G. Mazzanti

引用次数: 7