热、电压处理对硅/云母电绝缘影响的FT-IR ATR分析

2011 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2011-10-01 DOI:10.1109/CEIDP.2011.6232729

R. Polanský, P. Prosr, V. Mentlík

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引用次数: 0

摘要

分析了热处理和电压处理对云母硅基高温电绝缘材料性能的影响。测试材料用于在极高温和电场应力下的操作。主要目的是描述高温和电场对材料内部结构的影响。采用320℃不重复热应力模拟热处理500小时。材料也暴露在电场强度从9.6到15.9千伏/毫米，时间从7到280小时。通过傅里叶变换红外光谱、衰减全反射(FT-IR ATR)技术和显微分析对样品进行分析。测量结果表明，加速热处理对内部组织无明显影响。相反，电压处理导致材料的表现性退化。

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Analysis of influence of thermal and voltage treatments on silicone/mica electrical insulation by FT-IR ATR

An influence of thermal and voltage treatments on properties of high-temperature electrical insulating material based on mica and silicone binder was analyzed. Tested material is intended for an operation at extremely high temperatures along with electric field stress. The main aim was to describe the high temperature and electric field influence on the material inner structure. Thermal treatment was simulated by unrepeated thermal stress of 320°C for the time of 500 hours. The material was also exposed to electric field intensities ranging from 9.6 to 15.9 kV/mm for times ranging from 7 to 280 hours. The samples were analyzed via Fourier Transform Infrared Spectroscopy, using the Attenuated Total Reflectance (FT-IR ATR) technique, and also via Microscopic Analysis. According to the measurement, accelerated thermal treatment has no significant effect on the inner structure. On the contrary, voltage treatment causes expressive degradation of the material.

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2011 Annual Report Conference on Electrical Insulation and Dielectric Phenomena

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