计算机辅助工程Pub Date : 1992-01-01DOI: 10.1109/RMCAE.1992.245512
C. Le Mene, S. Robichez
{"title":"A self-consistent method for the management of FMECA. Application to space telecommunication and observation systems","authors":"C. Le Mene, S. Robichez","doi":"10.1109/RMCAE.1992.245512","DOIUrl":"https://doi.org/10.1109/RMCAE.1992.245512","url":null,"abstract":"ALCATEL ESPACE is the European leader in the design and integration of satellite flight payloads and in the manufacturing of space electronics and antennae. These equipments represent a high level of complexity, cannot be repaired, and must satisfy requirements for long life (over ten years). For each project, the FMECA is an analysis performed for each equipment, subsystem, and system of the satellite. The FMECAs are updated by keeping an ascending coherence until the configuration of every level is finalized. Faced with the ever-increasing complexity of on-board satellite electronic systems, it has become necessary to use software in the production of FMECA. The paper considers how ALCATEL ESPACE decided to develop its own software tool to perform analyses at both equipment and subsystem levels.<<ETX>>","PeriodicalId":59272,"journal":{"name":"计算机辅助工程","volume":"1 1","pages":"63-69"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89476714","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
计算机辅助工程Pub Date : 1992-01-01DOI: 10.1109/RMCAE.1992.245518
G. Langerer
{"title":"Beyond concurrent engineering","authors":"G. Langerer","doi":"10.1109/RMCAE.1992.245518","DOIUrl":"https://doi.org/10.1109/RMCAE.1992.245518","url":null,"abstract":"The author considers how in practice, concurrent engineering has been woven into a complex matrix of contemporary thinking on management, marketing, engineering, and design automation issues. This includes a focus on quality and continuous improvement as well as integration of design environments, both in terms of people and tools. He shows how automated concurrent engineering can deliver appreciable product cost reductions and time to market advantages.<<ETX>>","PeriodicalId":59272,"journal":{"name":"计算机辅助工程","volume":"28 1","pages":"21-22"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79148659","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
计算机辅助工程Pub Date : 1992-01-01DOI: 10.1109/RMCAE.1992.245504
Z. Bluvband, A. Barel
{"title":"Testability analysis module of FMECA processor","authors":"Z. Bluvband, A. Barel","doi":"10.1109/RMCAE.1992.245504","DOIUrl":"https://doi.org/10.1109/RMCAE.1992.245504","url":null,"abstract":"Contemporary concurrent engineering increasingly uses multidisciplinary teams. This results in consideration of tasks related to product assurance requirements early in the design process. These requirements usually include quality assurance, reliability, maintainability and ILS. One of the most powerful tools for these design activities is Failure Mode Effects and Criticality Analysis (FMECA). The authors discuss the integration of testability analysis tasks into FMECA. Reliability data used for FMECA, may be also useful for qualitative and quantitative testability analysis. These data include: product tree (hardware or functional), failure modes, item failure rates, failure mode ratio, detection method. Defining all these data requires considerable effort by the engineer performing FMECA. Even if a computerized tool (FMECA processor) is used to reduce the time required for data entry processing, the engineer must still invest considerable time in constructive thinking. Thus, a program for testability analysis, able to utilize available data from FMECA processor files, is desirable. With the addition of a relatively small amount of data, the program would be able to perform all the main tasks of testability analysis, including BIT coverage analysis, fault isolation resolution analysis. Basic principles and ideas involved in building such a testability analysis module (TAM) are discussed.<<ETX>>","PeriodicalId":59272,"journal":{"name":"计算机辅助工程","volume":"68 1","pages":"109-116"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78645481","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
计算机辅助工程Pub Date : 1992-01-01DOI: 10.1109/RMCAE.1992.245530
S. Keene
{"title":"Managing software reliability and support costs","authors":"S. Keene","doi":"10.1109/RMCAE.1992.245530","DOIUrl":"https://doi.org/10.1109/RMCAE.1992.245530","url":null,"abstract":"There are probably 30 to 50 defects per 1000 lines of source code injected into the code at creation. The bulk of the software development process is aimed at removing these defects. The average 1-3 defects that reach the field are orders of magnitude more expensive to repair than they would have been had they been removed early in the development. A major key to managing life-cycle cost comes from reducing these latent defects that escape development initiatives and are shipped to the field. The major cause of these field-detected defects is failure to capture all the requirements correctly. Several initiatives described in this paper will aid in assuring early in the program that the requirements are correct. They are the design of experiments, failure mode and effect analysis, defect prevention process and change management.<<ETX>>","PeriodicalId":59272,"journal":{"name":"计算机辅助工程","volume":"14 1","pages":"201-205"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78958767","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
计算机辅助工程Pub Date : 1992-01-01DOI: 10.1109/RMCAE.1992.245502
R. A. Marcotte, M. J. Neiberg, J. M. Schoen
{"title":"System-level applications of model-based diagnostic reasoning","authors":"R. A. Marcotte, M. J. Neiberg, J. M. Schoen","doi":"10.1109/RMCAE.1992.245502","DOIUrl":"https://doi.org/10.1109/RMCAE.1992.245502","url":null,"abstract":"Progress in developing adequate diagnostic capabilities for future computing and communications systems has been hampered by the lack of an adequate technological basis. Over the past decade, researchers within the artificial intelligence community have developed model-based diagnostic reasoning techniques. These techniques have the potential to provide comprehensive diagnostic coverage and to automate the design analysis process. MITRE is developing a prototype of the Generic Model-based Diagnostic System (GMODS) that is able to use VHDL models of circuit structure and behavior to diagnose single and multiple points of failure within digital sequential circuits. We provide an overview of GMODS and discuss the remaining research issues that need to be addressed before model-based reasoning systems such as GMODS will be of general utility to the R&M community. We also explore three potential system-level application areas-design analysis, depot-level diagnostics, and embedded diagnostics. We conclude that design analysis and depot-level diagnostics represent the most promising applications during the next few years.<<ETX>>","PeriodicalId":59272,"journal":{"name":"计算机辅助工程","volume":"12 1","pages":"123-130"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74846251","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
计算机辅助工程Pub Date : 1992-01-01DOI: 10.1109/RMCAE.1992.245533
M. V. Jordon
{"title":"Technical and management information system (TMIS) Space Station Freedom program","authors":"M. V. Jordon","doi":"10.1109/RMCAE.1992.245533","DOIUrl":"https://doi.org/10.1109/RMCAE.1992.245533","url":null,"abstract":"Managing distributed design information was one of the major challenges of the Space Station Freedom program. Management responsibility for space station design was distributed among 11 NASA centers managing hundreds of contractors. NASA thus faced an intimidating configuration management challenge. To accomplish the task, NASA hired Boeing Computer Services Inc. with subcontractors that included Intergraph, IBM, Digital Equipment, and Interleaf to provide the technical and management information system. TMIS supports the design, development and, eventually, the operations of the space stations by providing a standard process for sharing and storing information throughout the project's life.<<ETX>>","PeriodicalId":59272,"journal":{"name":"计算机辅助工程","volume":"24 1","pages":"221-222"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77521401","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
计算机辅助工程Pub Date : 1992-01-01DOI: 10.1109/RMCAE.1992.245505
A. Sellars
{"title":"Operational and manufacturing environment CE validation tools","authors":"A. Sellars","doi":"10.1109/RMCAE.1992.245505","DOIUrl":"https://doi.org/10.1109/RMCAE.1992.245505","url":null,"abstract":"The vast majority of failures in electronic systems are due to thermal and vibration stresses. Major improvements in product reliability can be attained by validating the printed circuit board assembly (PCBA) design with respect to the thermal and vibration/shock environments in operation, manufacturing, and test. This PCBA design validation is accomplished with application-specific finite element analysis tools developed by Pacific Numerix Corporation, linked with common CAE/CAD tools in a PCBA level concurrent engineering (CE) system. Also included in this CE system is the capability to validate the PCBA design with respect to electromagnetic parasitics. Designs can be validated before the printed circuit board (PCB) is fabricated and assembled, resulting in a more reliable product, reduced quality costs and reduced product development cycle time. Communication inadequacies between various engineering disciplines and between engineering, manufacturing, and test is one of the major obstacles to concurrent engineering that is improved with this PCBA CE system.<<ETX>>","PeriodicalId":59272,"journal":{"name":"计算机辅助工程","volume":"39 1","pages":"103-107"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77011552","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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