IEEE Transactions on Reliability最新文献

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IEEE Reliability Society Publication Information IEEE可靠性协会出版信息
IF 5.7 2区 计算机科学
IEEE Transactions on Reliability Pub Date : 2025-09-05 DOI: 10.1109/TR.2025.3600980
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引用次数: 0
RobFace: A Test Suite for Efficient Robustness Evaluation of Face Recognition Systems RobFace:一个有效的人脸识别系统鲁棒性评估测试套件
IF 5.7 2区 计算机科学
IEEE Transactions on Reliability Pub Date : 2025-06-23 DOI: 10.1109/TR.2025.3554575
Ruihan Zhang;Jun Sun
{"title":"RobFace: A Test Suite for Efficient Robustness Evaluation of Face Recognition Systems","authors":"Ruihan Zhang;Jun Sun","doi":"10.1109/TR.2025.3554575","DOIUrl":"https://doi.org/10.1109/TR.2025.3554575","url":null,"abstract":"Face recognition is a widely used authentication technology in practice, where robustness is required. It is thus essential to have an efficient and easy-to-use method for evaluating the robustness of (possibly third-party) trained face recognition systems. Existing approaches to evaluating the robustness of face recognition systems are either based on empirical evaluation (e.g., measuring attacking success rate using state-of-the-art attacking methods) or formal analysis (e.g., measuring the Lipschitz constant). While the former demands significant user efforts and expertise, the latter is extremely time-consuming. In pursuit of a comprehensive, efficient, easy-to-use, and scalable estimation of the robustness of face recognition systems, we take an old-school alternative approach and introduce <sc>RobFace</small>, i.e., evaluation using an optimized test suite. It contains transferable adversarial face images that are designed to comprehensively evaluate a face recognition system’s robustness along a variety of dimensions. <sc>RobFace</small> is system-agnostic and still consistent with system-specific empirical evaluation or formal analysis. We support this claim through extensive experimental results with various perturbations on multiple face recognition systems. To our knowledge, <sc>RobFace</small> is the first system-agnostic robustness estimation test suite.","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"74 3","pages":"3615-3628"},"PeriodicalIF":5.7,"publicationDate":"2025-06-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144998082","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Editorial Strengthening Resilience and Security With Zero Trust 零信任强化韧性和安全
IF 5 2区 计算机科学
IEEE Transactions on Reliability Pub Date : 2025-06-03 DOI: 10.1109/TR.2025.3570180
Winston Shieh
{"title":"Editorial Strengthening Resilience and Security With Zero Trust","authors":"Winston Shieh","doi":"10.1109/TR.2025.3570180","DOIUrl":"https://doi.org/10.1109/TR.2025.3570180","url":null,"abstract":"","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"74 2","pages":"2501-2502"},"PeriodicalIF":5.0,"publicationDate":"2025-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11023011","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144205855","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Corrections to “Probabilistic Modeling of Variation in Pilot Performance during Flight Training” 对“飞行训练中飞行员表现变化的概率建模”的修正
IF 5 2区 计算机科学
IEEE Transactions on Reliability Pub Date : 2025-06-03 DOI: 10.1109/TR.2025.3549285
Kento Yamada;Harumi Ikeshita;Yuta Kyoya;Makoto Ueno
{"title":"Corrections to “Probabilistic Modeling of Variation in Pilot Performance during Flight Training”","authors":"Kento Yamada;Harumi Ikeshita;Yuta Kyoya;Makoto Ueno","doi":"10.1109/TR.2025.3549285","DOIUrl":"https://doi.org/10.1109/TR.2025.3549285","url":null,"abstract":"This addresses errors in [1]. Due to the error containing the count data of first officer applicants who had not answered the informed consent at that time, the following figures, tables, and texts are corrected. The corrected texts are highlighted in bold.","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"74 2","pages":"2498-2500"},"PeriodicalIF":5.0,"publicationDate":"2025-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11023012","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144206013","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Reliability Society Publication Information IEEE可靠性协会出版信息
IF 5 2区 计算机科学
IEEE Transactions on Reliability Pub Date : 2025-06-03 DOI: 10.1109/TR.2025.3570890
{"title":"IEEE Reliability Society Publication Information","authors":"","doi":"10.1109/TR.2025.3570890","DOIUrl":"https://doi.org/10.1109/TR.2025.3570890","url":null,"abstract":"","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"74 2","pages":"C2-C2"},"PeriodicalIF":5.0,"publicationDate":"2025-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11023009","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144206117","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Importance Inference of Optimal Test Planning for Degradation Analysis 退化分析中最优测试规划的重要性推断
IF 5.7 2区 计算机科学
IEEE Transactions on Reliability Pub Date : 2025-04-30 DOI: 10.1109/TR.2025.3556481
Yi-Shian Dong;Chien-Yu Peng
{"title":"Importance Inference of Optimal Test Planning for Degradation Analysis","authors":"Yi-Shian Dong;Chien-Yu Peng","doi":"10.1109/TR.2025.3556481","DOIUrl":"https://doi.org/10.1109/TR.2025.3556481","url":null,"abstract":"Determination of the decision variables such as the inspection period, number of measurements, and sample size is crucial for planning an efficient degradation test. For widely used stochastic processes, the necessary and sufficient conditions for the explicit expression of optimal decision variables can be derived by minimizing the approximate variance of an estimator of interest under a limited budget. The importance of the decision variable is proposed to study the rate at which the objective function improves with the decision variable. The necessary and sufficient conditions for determining the importance of the optimal decision variables are theoretically investigated to elucidate the effect of the experimental costs and model parameters. Furthermore, the relative rankings of the importance of the optimal decision variables are illustrated through numerical examples.","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"74 3","pages":"4426-4440"},"PeriodicalIF":5.7,"publicationDate":"2025-04-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144998201","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Enhancing Fine-Grained Smart Contract Vulnerability Detection Through Domain Features and Transparent Interpretation 通过领域特征和透明解释增强细粒度智能合约漏洞检测
IF 5.7 2区 计算机科学
IEEE Transactions on Reliability Pub Date : 2025-04-24 DOI: 10.1109/TR.2025.3551356
Qing Huang;Yu He;Zhenchang Xing;Min Yu;Xiwei Xu;Qinghua Lu
{"title":"Enhancing Fine-Grained Smart Contract Vulnerability Detection Through Domain Features and Transparent Interpretation","authors":"Qing Huang;Yu He;Zhenchang Xing;Min Yu;Xiwei Xu;Qinghua Lu","doi":"10.1109/TR.2025.3551356","DOIUrl":"https://doi.org/10.1109/TR.2025.3551356","url":null,"abstract":"Smart contracts, which automatically execute transactions based on predefined conditions, play a crucial role in asset and money exchanges. Due to their involvement in significant financial transactions, these contracts are attractive targets for hackers, leading to substantial financial losses through exploitable vulnerabilities. While various program analysis methods such as Oyente, Mythril, and Securify have been proposed to address these security concerns, they rely on rule-based patterns that are time-consuming to develop and offer limited coverage. Deep learning methods present an alternative by automatically learning code features to detect vulnerabilities. However, existing approaches face critical challenges, including feature limitations and lack of interpretability. To address these gaps, we propose the interpretable smart contract vulnerability detector, a Graph Isomorphism Network (GIN)-based vulnerability prediction model for smart contracts, enhanced with code subgraph explanations. Our approach identifies and incorporates 43 domain-specific features, augmenting GIN with domain knowledge attention mechanisms to improve vulnerability prediction. In addition, we develop an interpreter called SubgraphV, which provides explanations for vulnerability predictions through interpreted subgraphs. Our model demonstrates superior performance over traditional tools, achieving F1 score improvements from 0.254 to 0.489 on a dataset of 103 smart contract function vulnerabilities. SubgraphV outperforms existing explainability methods like GNNexplainer, PGExplainer, and SubgraphX in pinpointing vulnerabilities, accurately reflecting vulnerability patterns, and enhancing the understanding of vulnerabilities.","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"74 3","pages":"4207-4221"},"PeriodicalIF":5.7,"publicationDate":"2025-04-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144998071","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Review of Prognostics Methods for Electronic Packages: From a Structure-Aware System-Level Perspective 电子封装预测方法综述:从结构感知的系统级视角
IF 5.7 2区 计算机科学
IEEE Transactions on Reliability Pub Date : 2025-04-24 DOI: 10.1109/TR.2025.3558449
Zihan Zhang;Alina Gorbunova;Keunho Rhew;Jianjun Shi
{"title":"A Review of Prognostics Methods for Electronic Packages: From a Structure-Aware System-Level Perspective","authors":"Zihan Zhang;Alina Gorbunova;Keunho Rhew;Jianjun Shi","doi":"10.1109/TR.2025.3558449","DOIUrl":"https://doi.org/10.1109/TR.2025.3558449","url":null,"abstract":"Prognostics for electronic packages is an evolving field critical to predicting the reliability and lifespan of electronic systems. This article proposes a novel “structure-aware system-level (SASL)” approach, addressing the limitations of traditional methods that treat components or subsystems as isolated black boxes. SASL examines how individual component degradation propagates, interacts within the package structure, and collectively determines the system's lifetime. The article reviews three key areas: component-level prognostics, package structure, and system-level analysis, offering guidance for future research. It advocates interdisciplinary collaboration to develop practical and interpretable prognostics methods, driving innovation in industries reliant on complex electronic systems.","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"74 3","pages":"4116-4130"},"PeriodicalIF":5.7,"publicationDate":"2025-04-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144998200","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Fine-Grained Code Clone Detection by Keywords-Based Connection of Program Dependency Graph 基于关键字连接的程序依赖图细粒度代码克隆检测
IF 5.7 2区 计算机科学
IEEE Transactions on Reliability Pub Date : 2025-04-17 DOI: 10.1109/TR.2025.3550747
Yueming Wu;Wenqi Suo;Siyue Feng;Cong Wu;Deqing Zou;Hai Jin
{"title":"Fine-Grained Code Clone Detection by Keywords-Based Connection of Program Dependency Graph","authors":"Yueming Wu;Wenqi Suo;Siyue Feng;Cong Wu;Deqing Zou;Hai Jin","doi":"10.1109/TR.2025.3550747","DOIUrl":"https://doi.org/10.1109/TR.2025.3550747","url":null,"abstract":"Code clone detection is intended to identify functionally similar code fragments, a matter of escalating significance in contemporary software engineering. Numerous methodologies have been proffered for the detection of code clones, among which graph-based approaches exhibit efficacy in addressing semantic code clones. However, they all only consider the feature extraction of a single sample and ignore the semantic connection between different samples, resulting in the detection effect being unsatisfactory. Simultaneously, the majority of existing methods can only ascertain the presence of clones, lacking the capability to provide nuanced insights into which lines of code exhibit greater similarity. In this article, we advocate a novel PDG-based semantic clone detection method, namely, <italic>Keybor</i> which can locate specific cloned lines of code by providing a fine-grained analysis of clone pairs. The highlight of the approach is to consider keywords as a bridge to connect PDG nodes of the target program to retain more semantic information about the functional code. To examine the effectiveness of <italic>Keybor</i>, we assess it on a widely used <italic>BigCloneBench</i> dataset. Experimental results indicate that <italic>Keybor</i> is superior to 14 advanced code clone detection tools (i.e., <italic>CCAligner</i>, <italic>SourcererCC</i>, <italic>Siamese</i>, <italic>NIL</i>, <italic>NiCad</i>, <italic>LVMapper</i>, <italic>CCFinder</i>, <italic>CloneWorks</i>, <italic>Oreo</i>, <italic>Deckard</i>, <italic>CCGraph</i>, <italic>Code2Img</i>, <italic>GPT-3.5-turbo</i>, and <italic>GPT-4</i>).","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"74 3","pages":"3427-3441"},"PeriodicalIF":5.7,"publicationDate":"2025-04-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144998189","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Reliability Study of Critical Structural Redistribution Layers in Advanced Packaging: A Review 先进封装中关键结构重分布层可靠性研究综述
IF 5.7 2区 计算机科学
IEEE Transactions on Reliability Pub Date : 2025-04-11 DOI: 10.1109/TR.2025.3556255
Jiajie Jin;Peisheng Liu;Yaohui Deng;Zhao Zhang
{"title":"Reliability Study of Critical Structural Redistribution Layers in Advanced Packaging: A Review","authors":"Jiajie Jin;Peisheng Liu;Yaohui Deng;Zhao Zhang","doi":"10.1109/TR.2025.3556255","DOIUrl":"https://doi.org/10.1109/TR.2025.3556255","url":null,"abstract":"The continuous evolution of semiconductor packaging demands highly reliable redistribution layer (RDL) architectures to support next-generation electronic systems. However, ensuring RDL reliability remains a formidable challenge due to multiphysics interactions, including mechanical stress-induced fatigue, thermal expansion mismatches, and high-frequency signal integrity degradation. This article presents a comprehensive review of RDL reliability across mechanical, thermal, and electrical domains, identifying key failure mechanisms and research gaps. To address these challenges, we introduce an AI-driven optimization framework that integrates machine learning–assisted chip layout optimization, adaptive thermal management, and real-time signal integrity enhancement. Utilizing deep reinforcement learning and graph neural networks, this study demonstrates how AI can dynamically optimize RDL routing, enhance power distribution networks, and mitigate localized heating effects. Furthermore, we explore the integration of AI-driven predictive modeling into electronic design automation tools, enabling real-time multiphysics co-optimization of RDL architectures. This study establishes a structured framework for future research, bridging the gap between theoretical modeling and practical fabrication. By incorporating AI-assisted design methodologies, next-generation RDL architectures can achieve superior reliability, enhanced performance, and improved scalability, supporting applications in 5G communications, high-performance computing, and heterogeneous integration technologies.","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"74 3","pages":"3371-3382"},"PeriodicalIF":5.7,"publicationDate":"2025-04-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144998054","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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