Zihan Zhang;Alina Gorbunova;Keunho Rhew;Jianjun Shi
{"title":"A Review of Prognostics Methods for Electronic Packages: From a Structure-Aware System-Level Perspective","authors":"Zihan Zhang;Alina Gorbunova;Keunho Rhew;Jianjun Shi","doi":"10.1109/TR.2025.3558449","DOIUrl":null,"url":null,"abstract":"Prognostics for electronic packages is an evolving field critical to predicting the reliability and lifespan of electronic systems. This article proposes a novel “structure-aware system-level (SASL)” approach, addressing the limitations of traditional methods that treat components or subsystems as isolated black boxes. SASL examines how individual component degradation propagates, interacts within the package structure, and collectively determines the system's lifetime. The article reviews three key areas: component-level prognostics, package structure, and system-level analysis, offering guidance for future research. It advocates interdisciplinary collaboration to develop practical and interpretable prognostics methods, driving innovation in industries reliant on complex electronic systems.","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"74 3","pages":"4116-4130"},"PeriodicalIF":5.7000,"publicationDate":"2025-04-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Reliability","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10975844/","RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
Prognostics for electronic packages is an evolving field critical to predicting the reliability and lifespan of electronic systems. This article proposes a novel “structure-aware system-level (SASL)” approach, addressing the limitations of traditional methods that treat components or subsystems as isolated black boxes. SASL examines how individual component degradation propagates, interacts within the package structure, and collectively determines the system's lifetime. The article reviews three key areas: component-level prognostics, package structure, and system-level analysis, offering guidance for future research. It advocates interdisciplinary collaboration to develop practical and interpretable prognostics methods, driving innovation in industries reliant on complex electronic systems.
期刊介绍:
IEEE Transactions on Reliability is a refereed journal for the reliability and allied disciplines including, but not limited to, maintainability, physics of failure, life testing, prognostics, design and manufacture for reliability, reliability for systems of systems, network availability, mission success, warranty, safety, and various measures of effectiveness. Topics eligible for publication range from hardware to software, from materials to systems, from consumer and industrial devices to manufacturing plants, from individual items to networks, from techniques for making things better to ways of predicting and measuring behavior in the field. As an engineering subject that supports new and existing technologies, we constantly expand into new areas of the assurance sciences.