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IEEE Connects You to a Universe of Information! IEEE将您连接到信息的宇宙!
IF 2.1 4区 工程技术
IEEE Technology and Society Magazine Pub Date : 2025-01-17 DOI: 10.1109/MTS.2024.3522796
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引用次数: 0
On Caring About What We Pretend to Be 关于关心我们假装的样子
IF 2.1 4区 工程技术
IEEE Technology and Society Magazine Pub Date : 2025-01-17 DOI: 10.1109/MTS.2024.3497134
G. Pascal Zachary
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引用次数: 0
A Note From the Editor: Finding Hope in Local Action 编者的话在地方行动中寻找希望
IF 2.1 4区 工程技术
IEEE Technology and Society Magazine Pub Date : 2025-01-17 DOI: 10.1109/MTS.2024.3518194
Ketra Schmitt
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引用次数: 0
IEEE Technology and Society Magazine Publication Information IEEE 技术与社会》杂志出版信息
IF 2.1 4区 工程技术
IEEE Technology and Society Magazine Pub Date : 2025-01-17 DOI: 10.1109/MTS.2024.3517777
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引用次数: 0
The Anxious Generation: How the Rewiring of Childhood Is Causing an Epidemic of Mental Illness—Jonathan Haidt (New York, NY, USA: Penguin Press, 2024, 400 pp.) Digital Object 焦虑的一代:童年的重新布线如何导致精神疾病的流行-乔纳森·海特(纽约,纽约,美国:企鹅出版社,2024年,400页)
IF 2.1 4区 工程技术
IEEE Technology and Society Magazine Pub Date : 2025-01-17 DOI: 10.1109/MTS.2024.3402711
Margaret A. Manion
{"title":"The Anxious Generation: How the Rewiring of Childhood Is Causing an Epidemic of Mental Illness—Jonathan Haidt (New York, NY, USA: Penguin Press, 2024, 400 pp.) Digital Object","authors":"Margaret A. Manion","doi":"10.1109/MTS.2024.3402711","DOIUrl":"https://doi.org/10.1109/MTS.2024.3402711","url":null,"abstract":"Presents reviews for the following list of books, The Anxious Generation: How the Rewiring of Childhood Is Causing an Epidemic of Mental Illness—Jonathan Haidt (New York, NY, USA: Penguin Press, 2024, 400 pp.) Digital Object.","PeriodicalId":55016,"journal":{"name":"IEEE Technology and Society Magazine","volume":"43 4","pages":"53-54"},"PeriodicalIF":2.1,"publicationDate":"2025-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10845009","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143184233","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
On Time: A History of Western Timekeeping—Ken Mondschein (Baltimore, MD, USA: Johns Hopkins Univ. Press, 2020, 256 pp.) On Time: A History of Western Timekeeping-Ken Mondschein(美国马里兰州巴尔的摩:约翰霍普金斯大学出版社,2020年,256页)
IF 2.1 4区 工程技术
IEEE Technology and Society Magazine Pub Date : 2025-01-17 DOI: 10.1109/MTS.2024.3493920
Eric P. Wenaas
{"title":"On Time: A History of Western Timekeeping—Ken Mondschein (Baltimore, MD, USA: Johns Hopkins Univ. Press, 2020, 256 pp.)","authors":"Eric P. Wenaas","doi":"10.1109/MTS.2024.3493920","DOIUrl":"https://doi.org/10.1109/MTS.2024.3493920","url":null,"abstract":"Presents reviews for the following list of books, On Time: A History of Western Timekeeping—Ken Mondschein (Baltimore, MD, USA: Johns Hopkins Univ. Press, 2020, 256 pp.).","PeriodicalId":55016,"journal":{"name":"IEEE Technology and Society Magazine","volume":"43 4","pages":"47-49"},"PeriodicalIF":2.1,"publicationDate":"2025-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10845024","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143184436","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Emerging Space Norms: A Crucial Initiative for Global Security 新兴空间规范:全球安全的关键倡议
IF 2.1 4区 工程技术
IEEE Technology and Society Magazine Pub Date : 2025-01-17 DOI: 10.1109/MTS.2024.3497139
Duncan Blake;Mark Hilborne;Michelle Chase;Diana M. Bowman
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引用次数: 0
The Hidden Multiplier: Unraveling the True Cost of the Global AI Skills Gap 隐藏的乘数:揭示全球AI技能差距的真实成本
IF 2.1 4区 工程技术
IEEE Technology and Society Magazine Pub Date : 2025-01-17 DOI: 10.1109/MTS.2024.3505618
Yanyi Wu;Chenghua Lin
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引用次数: 0
Call for Papers: ISTAS 2025 征文:ISTAS 2025
IF 2.1 4区 工程技术
IEEE Technology and Society Magazine Pub Date : 2025-01-17 DOI: 10.1109/MTS.2024.3517775
{"title":"Call for Papers: ISTAS 2025","authors":"","doi":"10.1109/MTS.2024.3517775","DOIUrl":"https://doi.org/10.1109/MTS.2024.3517775","url":null,"abstract":"","PeriodicalId":55016,"journal":{"name":"IEEE Technology and Society Magazine","volume":"43 4","pages":"C2-C2"},"PeriodicalIF":2.1,"publicationDate":"2025-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10845031","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143184442","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Call for EIC/Co-EICs of IEEE Transactions on Technology and Society IEEE技术与社会学报EIC/ co -EIC征集
IF 2.1 4区 工程技术
IEEE Technology and Society Magazine Pub Date : 2025-01-17 DOI: 10.1109/MTS.2024.3517783
{"title":"Call for EIC/Co-EICs of IEEE Transactions on Technology and Society","authors":"","doi":"10.1109/MTS.2024.3517783","DOIUrl":"https://doi.org/10.1109/MTS.2024.3517783","url":null,"abstract":"","PeriodicalId":55016,"journal":{"name":"IEEE Technology and Society Magazine","volume":"43 4","pages":"C4-C4"},"PeriodicalIF":2.1,"publicationDate":"2025-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10845006","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142993321","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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