Journal of Research of the National Institute of Standards and Technology最新文献

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Viscosity Measurements of Three Base Oils and One Fully Formulated Lubricant and New Viscosity Correlations for the Calibration Liquid Squalane. 三种基础油和一种全配方润滑油的粘度测量及校正液角鲨烷的新粘度关系式。
IF 1.5 4区 工程技术
Journal of Research of the National Institute of Standards and Technology Pub Date : 2019-02-13 DOI: 10.1002/HTTPS://DOI.ORG/10.6028/JRES.124.002
A. Laesecke, Clemens Junker, D. Lauria
{"title":"Viscosity Measurements of Three Base Oils and One Fully Formulated Lubricant and New Viscosity Correlations for the Calibration Liquid Squalane.","authors":"A. Laesecke, Clemens Junker, D. Lauria","doi":"10.1002/HTTPS://DOI.ORG/10.6028/JRES.124.002","DOIUrl":"https://doi.org/10.1002/HTTPS://DOI.ORG/10.6028/JRES.124.002","url":null,"abstract":"The viscosities of three pentaerythritol tetraalkanoate ester base oils and one fully formulated lubricant were measured with an oscillating piston viscometer in the overall temperature range from 275 K to 450 K with pressures up to 137 MPa. The alkanoates were pentanoate, heptanoate, and nonanoate. Three sensing cylinders covering the combined viscosity range from 1 mPa·s to 100 mPa·s were calibrated with squalane. This required a re-correlation of a squalane viscosity data set in the literature that was measured with a vibrating wire viscometer, with an estimated extended uncertainty of 2 %, because the squalane viscosity formulations in the literature did not represent this data set within its experimental uncertainty. In addition, a new formulation for the viscosity of squalane at atmospheric pressure was developed that represents experimental data from 169.5 K to 473 K within their estimated uncertainty over a viscosity range of more than eleven orders of magnitude. The viscosity of squalane was measured over the entire viscometer range, and the results were used together with the squalane correlations to develop accurate calibrating functions for the instrument. The throughput of the instrument was tripled by a custom-developed LabVIEW application. The measured viscosity data for the ester base oils and the fully formulated lubricant were tabulated and compared with literature data. An unpublished viscosity data set for pentaerythritol tetrapentanoate measured in this laboratory in 2006 at atmospheric pressure from 253 K to 373 K agrees with the new data within their experimental uncertainty and confirms the deviations from the literature data. The density data measured in this project for the three base oils deviate from the literature data in a way that is by sign and magnitude consistent with the deviations of the viscosity data. This points to differences in the sample compositions as the most likely cause for the deviations.","PeriodicalId":54766,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":"124 1","pages":"1-41"},"PeriodicalIF":1.5,"publicationDate":"2019-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47973285","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Design, Manufacturing, and Inspection Data for a Three-Component Assembly. 三部件组件的设计、制造和检验数据。
IF 1.5 4区 工程技术
Journal of Research of the National Institute of Standards and Technology Pub Date : 2019-02-12 DOI: 10.1002/HTTPS://DOI.ORG/10.6028/JRES.124.004
Thomas Hedberg, Jr., M. Sharp, T. Maw, Mostafizur Rahman, Swati Jadhav, James J. Whicker, A. B. Feeney, M. Helu
{"title":"Design, Manufacturing, and Inspection Data for a Three-Component Assembly.","authors":"Thomas Hedberg, Jr., M. Sharp, T. Maw, Mostafizur Rahman, Swati Jadhav, James J. Whicker, A. B. Feeney, M. Helu","doi":"10.1002/HTTPS://DOI.ORG/10.6028/JRES.124.004","DOIUrl":"https://doi.org/10.1002/HTTPS://DOI.ORG/10.6028/JRES.124.004","url":null,"abstract":"To better understand and address the challenges faced in linking all stages of a\u0000 manufacturing and design process, an investigative fabrication process was designed\u0000 and enacted as part of a collaboration between the National Institute of Standards\u0000 and Technology (NIST) and the Manufacturing Technology Centre (MTC). This\u0000 collaboration sought to test selected open standards’ ability to integrate the\u0000 product-lifecycle stages of engineering design, manufacturing, and quality assurance\u0000 through a thorough implementation of a small scale model-based enterprise (MBE). A\u0000 dataset was generated as a result of the collaboration. This article provides\u0000 details about the dataset and instructions for how to access and/or retrieve\u0000 it.","PeriodicalId":54766,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":"124 1","pages":"1-4"},"PeriodicalIF":1.5,"publicationDate":"2019-02-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45227546","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Design, Manufacturing, and Inspection Data for a Three-Component Assembly. 三组件装配的设计、制造和检验数据。
IF 1.5 4区 工程技术
Journal of Research of the National Institute of Standards and Technology Pub Date : 2019-02-12 eCollection Date: 2019-01-01 DOI: 10.6028/jres.124.004
Thomas D Hedberg, Michael E Sharp, Toby M M Maw, Mostafizur M Rahman, Swati Jadhav, James J Whicker, Allison Barnard Feeney, Moneer Helu
{"title":"Design, Manufacturing, and Inspection Data for a Three-Component Assembly.","authors":"Thomas D Hedberg, Michael E Sharp, Toby M M Maw, Mostafizur M Rahman, Swati Jadhav, James J Whicker, Allison Barnard Feeney, Moneer Helu","doi":"10.6028/jres.124.004","DOIUrl":"https://doi.org/10.6028/jres.124.004","url":null,"abstract":"","PeriodicalId":54766,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":"124 ","pages":"1-4"},"PeriodicalIF":1.5,"publicationDate":"2019-02-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.6028/jres.124.004","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"39955056","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
X-ray Metrology for the Semiconductor Industry Tutorial. 半导体工业x射线计量教程。
IF 1.5 4区 工程技术
Journal of Research of the National Institute of Standards and Technology Pub Date : 2019-02-01 DOI: 10.1002/HTTPS://DOI.ORG/10.6028/JRES.124.003
D. Sunday, Wen-Li Wu, S. Barton, R. Joseph Kline
{"title":"X-ray Metrology for the Semiconductor Industry Tutorial.","authors":"D. Sunday, Wen-Li Wu, S. Barton, R. Joseph Kline","doi":"10.1002/HTTPS://DOI.ORG/10.6028/JRES.124.003","DOIUrl":"https://doi.org/10.1002/HTTPS://DOI.ORG/10.6028/JRES.124.003","url":null,"abstract":"The semiconductor industry is in need of new, in-line dimensional metrology\u0000 methods with higherspatial resolution for characterizing their next generation\u0000 nanodevices. The purpose of this short course is to train the semiconductor industry\u0000 on the NIST-developed critical dimension small angle X-ray scattering (CDSAXS)\u0000 method. The topics will include both data processing and instrumentation. The short\u0000 course will also provide an opportunity for discussion of the requirements for\u0000 CDSAXS and the necessary improvements in X-ray source technology. Expected audience\u0000 include semiconductor manufacturers, equipment manufacturers, and component\u0000 manufacturers. The presentations were made at “X-ray Metrology for the Semiconductor\u0000 Industry” short course at the National Institute of Standards and Technology on Aug.\u0000 25, 2016.","PeriodicalId":54766,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":"124 1","pages":"1-3"},"PeriodicalIF":1.5,"publicationDate":"2019-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43868121","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
X-ray Metrology for the Semiconductor Industry Tutorial. 半导体工业x射线计量教程。
IF 1.5 4区 工程技术
Journal of Research of the National Institute of Standards and Technology Pub Date : 2019-02-01 eCollection Date: 2019-01-01 DOI: 10.6028/jres.124.003
Daniel F Sunday, Wen-Li Wu, Scott Barton, R Joseph Kline
{"title":"X-ray Metrology for the Semiconductor Industry Tutorial.","authors":"Daniel F Sunday, Wen-Li Wu, Scott Barton, R Joseph Kline","doi":"10.6028/jres.124.003","DOIUrl":"https://doi.org/10.6028/jres.124.003","url":null,"abstract":"","PeriodicalId":54766,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":"124 ","pages":"1-3"},"PeriodicalIF":1.5,"publicationDate":"2019-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.6028/jres.124.003","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"39955054","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Proceedings of the First Workshop on Standards for Microfluidics. 第一届微流体标准研讨会论文集。
IF 1.5 4区 工程技术
Journal of Research of the National Institute of Standards and Technology Pub Date : 2019-01-28 eCollection Date: 2019-01-01 DOI: 10.6028/jres.124.001
Darwin R Reyes, Henne van Heeren
{"title":"Proceedings of the First Workshop on Standards for Microfluidics.","authors":"Darwin R Reyes,&nbsp;Henne van Heeren","doi":"10.6028/jres.124.001","DOIUrl":"https://doi.org/10.6028/jres.124.001","url":null,"abstract":"<p><p>In the last two decades, the microfluidics/lab-on-a-chip field has evolved from the concept of micro total analysis systems, where systems with integrated pretreatment and analysis of chemicals were envisioned, to what is known today as lab-on-a-chip, which is expected to be modular. This field has shown great potential for the development of technologies that can make, and to some extent are making, a big difference in areas such as <i>in vitro</i> diagnostics, point of care testing, organ on a chip, and many more. Microfluidics plays an essential role in these systems, and determining the standards needed in this area is critical for enabling new markets and products, and to advance research and development. Our goal was to bring together stakeholders from industry, academia, and government to discuss and define the needs within the field for the development of standards. This publication contains a summary of the workshop, abstracts from each presentation, and a summary of the breakout sessions from the National Institute of Standards and Technology Workshop on Standards for Microfluidics, held on June 1-2, 2017. The workshop was attended by 46 persons from 26 organizations and 11 countries. This was a unique and exciting opportunity for stakeholders from all over the world to join in the discussion of future developments towards standardization in the microfluidics arena.</p>","PeriodicalId":54766,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":"124 ","pages":"1-22"},"PeriodicalIF":1.5,"publicationDate":"2019-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.6028/jres.124.001","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"39578670","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Proceedings of the First Workshop on Standards for Microfluidics. 第一届微流体标准研讨会论文集。
IF 1.5 4区 工程技术
Journal of Research of the National Institute of Standards and Technology Pub Date : 2019-01-28 DOI: 10.1002/HTTPS://DOI.ORG/10.6028/JRES.124.001
D. R. Reyes, H. van Heeren
{"title":"Proceedings of the First Workshop on Standards for Microfluidics.","authors":"D. R. Reyes, H. van Heeren","doi":"10.1002/HTTPS://DOI.ORG/10.6028/JRES.124.001","DOIUrl":"https://doi.org/10.1002/HTTPS://DOI.ORG/10.6028/JRES.124.001","url":null,"abstract":"In the last two decades, the microfluidics/lab-on-a-chip field has evolved from the concept of micro total analysis systems, where systems with integrated pretreatment and analysis of chemicals were envisioned, to what is known today as lab-on-a-chip, which is expected to be modular. This field has shown great potential for the development of technologies that can make, and to some extent are making, a big difference in areas such as in vitro diagnostics, point of care testing, organ on a chip, and many more. Microfluidics plays an essential role in these systems, and determining the standards needed in this area is critical for enabling new markets and products, and to advance research and development. Our goal was to bring together stakeholders from industry, academia, and government to discuss and define the needs within the field for the development of standards. This publication contains a summary of the workshop, abstracts from each presentation, and a summary of the breakout sessions from the National Institute of Standards and Technology Workshop on Standards for Microfluidics, held on June 1-2, 2017. The workshop was attended by 46 persons from 26 organizations and 11 countries. This was a unique and exciting opportunity for stakeholders from all over the world to join in the discussion of future developments towards standardization in the microfluidics arena.","PeriodicalId":54766,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":"124 1","pages":"1-22"},"PeriodicalIF":1.5,"publicationDate":"2019-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45037416","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
A Model for the Binding of Fluorescently Labeled Anti-Human CD4 Monoclonal Antibodies to CD4 Receptors on Human Lymphocytes. 人淋巴细胞上荧光标记的抗人CD4单克隆抗体与CD4受体结合的模型。
IF 1.5 4区 工程技术
Journal of Research of the National Institute of Standards and Technology Pub Date : 2018-12-14 eCollection Date: 2018-01-01 DOI: 10.6028/jres.123.022
Lili Wang, Adolfas K Gaigalas, Paul C DeRose
{"title":"A Model for the Binding of Fluorescently Labeled Anti-Human CD4 Monoclonal Antibodies to CD4 Receptors on Human Lymphocytes.","authors":"Lili Wang,&nbsp;Adolfas K Gaigalas,&nbsp;Paul C DeRose","doi":"10.6028/jres.123.022","DOIUrl":"https://doi.org/10.6028/jres.123.022","url":null,"abstract":"<p><p>The CD4 glycoprotein is a component of the T cell receptor complex which plays an important role in the human immune response. This manuscript describes the measurement and modeling of the binding of fluorescently labeled anti-human CD4 monoclonal antibodies (mAb; SK3 clone) to CD4 receptors on the surface of human peripheral blood mononuclear cells (PBMC). CD4 mAb fluorescein isothiocyanate (FITC) and CD4 mAb allophycoerythrin (APC) conjugates were obtained from commercial sources. Four binding conditions were performed, each with the same PBMC sample and different CD4 mAb conjugate. Each binding condition consisted of the PBMC sample incubated for 30 min in labeling solutions containing progressively larger concentrations of the CD4 mAb-label conjugate. After the incubation period, the cells were re-suspended in PBS-based buffer and analyzed using a flow cytometer to measure the mean fluorescence intensity (MFI) of the labeled cell populations. A model was developed to estimate the equilibrium concentration of bound CD4 mAb-label conjugates to CD4 receptors on PBMC. A set of parameters was obtained from the best fit of the model to the measured MFI data and the known number of CD4 receptors on PBMC surface. Divalent and monovalent binding had to be invoked for the APC and FITC CD4 mAb conjugates, respectively. This suggests that the mAb binding depends on the size of the label, which has significant implications for quantitative flow cytometry. The study supports the National Institute of Standards and Technology program to develop quantitative flow cytometry measurements.</p>","PeriodicalId":54766,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":"123 ","pages":"1-23"},"PeriodicalIF":1.5,"publicationDate":"2018-12-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.6028/jres.123.022","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"39701123","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
"What is The SI?" A Proposal for an Educational Adjunct to the Redefinition of the International System of Units. “SI是什么?”关于重新定义国际单位制的教育附属机构的建议。
IF 1.5 4区 工程技术
Journal of Research of the National Institute of Standards and Technology Pub Date : 2018-12-14 DOI: 10.1002/HTTPS://DOI.ORG/10.6028/JRES.123.024
N. Zimmerman, D. Newell
{"title":"\"What is The SI?\" A Proposal for an Educational Adjunct to the Redefinition of the International System of Units.","authors":"N. Zimmerman, D. Newell","doi":"10.1002/HTTPS://DOI.ORG/10.6028/JRES.123.024","DOIUrl":"https://doi.org/10.1002/HTTPS://DOI.ORG/10.6028/JRES.123.024","url":null,"abstract":"We discuss how the impending redefinition of the SI system of units might affect the ability of students to understand the link between the units and the new system. The redefinition will no longer define a set of base units, but rather a set of constants of nature, such as the elementary charge, e. We point out that this list of constants need not be the only way to introduce students to the subject, either in class or in textbooks. We suggest an alternative way to introduce high school and undergraduate students to the redefined SI, by suggesting a list of experiments for some units; this list would be completely compatible with the redefined SI, and would have all of the same scientific and technological advantages. We demonstrate by questionnaire results that this alternative is more appealing to students. We hope to spur a discussion amongst teachers regarding this important topic for high school and undergraduate physics courses.","PeriodicalId":54766,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":" ","pages":"1-11"},"PeriodicalIF":1.5,"publicationDate":"2018-12-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45078131","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
"What is The SI?" A Proposal for an Educational Adjunct to the Redefinition of the International System of Units. “SI是什么?”国际单位制重新定义的教育辅助建议。
IF 1.5 4区 工程技术
Journal of Research of the National Institute of Standards and Technology Pub Date : 2018-12-14 eCollection Date: 2018-01-01 DOI: 10.6028/jres.123.024
Neil M Zimmerman, David B Newell
{"title":"\"What is The SI?\" A Proposal for an Educational Adjunct to the Redefinition of the International System of Units.","authors":"Neil M Zimmerman,&nbsp;David B Newell","doi":"10.6028/jres.123.024","DOIUrl":"https://doi.org/10.6028/jres.123.024","url":null,"abstract":"<p><p>We discuss how the impending redefinition of the SI system of units might affect the ability of students to understand the link between the units and the new system. The redefinition will no longer define a set of base units, but rather a set of constants of nature, such as the elementary charge, <i>e</i>. We point out that this list of constants need not be the only way to introduce students to the subject, either in class or in textbooks. We suggest an alternative way to introduce high school and undergraduate students to the redefined SI, by suggesting a list of experiments for some units; this list would be completely compatible with the redefined SI, and would have all of the same scientific and technological advantages. We demonstrate by questionnaire results that this alternative is more appealing to students. We hope to spur a discussion amongst teachers regarding this important topic for high school and undergraduate physics courses.</p>","PeriodicalId":54766,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":"123 ","pages":"1-11"},"PeriodicalIF":1.5,"publicationDate":"2018-12-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7339778/pdf/jres-123-024.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"39701122","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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