Journal of Research of the National Institute of Standards and Technology最新文献

{"title":"Stress Measurements in Alumina by Optical Fluorescence: Revisited.","authors":"Robert F Cook, Chris A Michaels","doi":"10.6028/jres.124.020","DOIUrl":"10.6028/jres.124.020","url":null,"abstract":"<p><p>Stress measurements in single-crystal and polycrystalline alumina are revisited using a recently developed optical fluorescence energy shift method. The method simultaneously utilizes the R₁ and R₂ Cr-related ruby line shifts in alumina to determine two components of the stress tensor in crystallographic coordinates, independent of the intended or assumed stress state. Measurements from a range of experimental conditions, including high-pressure, shock, quasi-static, and bulk polycrystals containing thermal expansion anisotropy effects, are analyzed. In many cases, the new analysis suggests stress states and stress magnitudes significantly different from those inferred previously, particularly for shock experiments. An implication is that atomistic models relating stress state to fluorescence shift require significant refinement for use in materials-based residual stress distribution analyses. Conversely, the earliest measurements of fluorescence in polycrystalline alumina are shown to be consistent with recent detailed measurements of stress equilibrium and dispersion.</p>","PeriodicalId":54766,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":null,"pages":null},"PeriodicalIF":1.5,"publicationDate":"2019-08-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7340554/pdf/jres-124-020.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"39578674","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Background and Review of Cavity-Enhanced Spontaneous Parametric Down-Conversion.","authors":"Oliver Slattery,&nbsp;Lijun Ma,&nbsp;Kevin Zong,&nbsp;Xiao Tang","doi":"10.6028/jres.124.019","DOIUrl":"https://doi.org/10.6028/jres.124.019","url":null,"abstract":"<p><p>Spontaneous parametric down-conversion (SPDC) in a nonlinear crystal has been a workhorse for the generation of entangled and correlated single-photon pairs used for quantum communications applications for nearly three decades. However, as a naturally broadband process, the ability of SPDC to interface with the very narrow energy transitions in atomic ensembles for implementing quantum memories, which are needed for quantum repeaters to extend the reach of quantum communications, was initially limited. To overcome this limitation, the process was enhanced by placing the nonlinear crystal inside a resonating cavity. This modified process has some important advantages, including narrowing the spectral linewidth of generated photons into brighter resonant modes of the cavity, and the ability to lock the desired mode of the cavity to the targeted transition frequency of the atomic ensemble. This paper presents an overview of the principle of cavity-enhanced SPDC, a review of works to date using this technique, and an example of one of these implementations.</p>","PeriodicalId":54766,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":null,"pages":null},"PeriodicalIF":1.5,"publicationDate":"2019-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.6028/jres.124.019","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"39814339","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Background and Review of Cavity-Enhanced Spontaneous Parametric Down-Conversion.","authors":"O. Slattery, Lijun Ma, Kevin Zong, Xiao Tang","doi":"10.1002/HTTPS://DOI.ORG/10.6028/JRES.124.019","DOIUrl":"https://doi.org/10.1002/HTTPS://DOI.ORG/10.6028/JRES.124.019","url":null,"abstract":"Spontaneous parametric down-conversion (SPDC) in a nonlinear crystal has been a workhorse for the generation of entangled and correlated single-photon pairs used for quantum communications applications for nearly three decades. However, as a naturally broadband process, the ability of SPDC to interface with the very narrow energy transitions in atomic ensembles for implementing quantum memories, which are needed for quantum repeaters to extend the reach of quantum communications, was initially limited. To overcome this limitation, the process was enhanced by placing the nonlinear crystal inside a resonating cavity. This modified process has some important advantages, including narrowing the spectral linewidth of generated photons into brighter resonant modes of the cavity, and the ability to lock the desired mode of the cavity to the targeted transition frequency of the atomic ensemble. This paper presents an overview of the principle of cavity-enhanced SPDC, a review of works to date using this technique, and an example of one of these implementations.","PeriodicalId":54766,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":null,"pages":null},"PeriodicalIF":1.5,"publicationDate":"2019-08-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"44073805","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"X-ray Computed Tomography Instrument Performance Evaluation, Part I: Sensitivity to Detector Geometry Errors.","authors":"Bala Muralikrishnan, Meghan Shilling, Steve Phillips, Wei Ren, Vincent Lee, Felix Kim","doi":"10.6028/jres.124.014","DOIUrl":"10.6028/jres.124.014","url":null,"abstract":"<p><p>X-ray computed tomography (XCT), long used in medical imaging and defect inspection, is now increasingly used for dimensional measurements of geometrical features in engineering components. With widespread use of XCT instruments, there is growing need for the development of standardized test procedures to verify manufacturer specifications and provide pathways to establish metrological traceability. As technical committees within the American Society of Mechanical Engineers (ASME) and the International Organization for Standardization (ISO) are developing documentary standards that include test procedures that are sensitive to all known error sources, we report on work exploring one set of error sources, instrument geometry errors, and their effect on dimensional measurements. In particular, we studied detector and rotation stage errors in cone-beam XCT instruments and determined their influence on sphere center-to-center distance errors and sphere form errors for spheres located in the tomographically reconstructed measurement volume. We developed a novel method, called the single-point ray tracing method, that allows for efficient determination of the sphere center-to-center distance error and sphere form error in the presence of each of the different geometry errors in an XCT instrument. In Part I of this work, we (1) describe the single-point ray tracing method, (2) discuss optimal placement of spheres so that sphere center-to-center distance errors and sphere form errors are sensitive to the different detector geometry errors, and (3) present data validating our method against the more conventional radiograph-based tomographic reconstruction method. In Part II of this work, we discuss optimal placement of spheres so that sphere center-to-center distance errors and sphere form errors are sensitive to error sources associated with the rotation stage. This work is in support of ongoing standards development activity within ASME and ISO for XCT performance evaluation.</p>","PeriodicalId":54766,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":null,"pages":null},"PeriodicalIF":1.5,"publicationDate":"2019-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.6028/jres.124.014","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"39955051","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"X-ray Computed Tomography Instrument Performance Evaluation, Part II: Sensitivity to Rotation Stage Errors.","authors":"B. Muralikrishnan, Megan Shilling, Steve Phillips, Wei Ren, Vincent D. Lee, F. Kim","doi":"10.1002/HTTPS://DOI.ORG/10.6028/JRES.124.015","DOIUrl":"https://doi.org/10.1002/HTTPS://DOI.ORG/10.6028/JRES.124.015","url":null,"abstract":"The development of standards for evaluating the performance of X-ray computed tomography (XCT) instruments is ongoing within the American Society of Mechanical Engineers (ASME) and the International Organization for Standardization (ISO) working committees. A key challenge in developing documentary standards is to identify test procedures that are sensitive to known error sources. In Part I of this work, we described the effect of geometry errors associated with the detector and determined their influence through simulations on sphere center-to-center distance errors and sphere form errors for spheres located in the tomographically reconstructed measurement volume. We also introduced a new simulation method, the single-point ray tracing method, to efficiently perform the distance and form error computations and presented data validating the method. In this second part, also based on simulation studies, we describe the effect of errors associated with the rotation stage on sphere center-to-center distance errors and sphere form errors for spheres located in the tomographically reconstructed measurement volume. We recommend optimal sphere center locations that are most sensitive to rotation stage errors for consideration by documentary standards committees in the development of test procedures for performance evaluation.","PeriodicalId":54766,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":null,"pages":null},"PeriodicalIF":1.5,"publicationDate":"2019-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"41560264","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"X-ray Computed Tomography Instrument Performance Evaluation, Part I: Sensitivity to Detector Geometry Errors.","authors":"B. Muralikrishnan, Megan Shilling, Steve Phillips, Wei Ren, Vincent D. Lee, F. Kim","doi":"10.1002/HTTPS://DOI.ORG/10.6028/JRES.124.014","DOIUrl":"https://doi.org/10.1002/HTTPS://DOI.ORG/10.6028/JRES.124.014","url":null,"abstract":"X-ray computed tomography (XCT), long used in medical imaging and defect inspection, is now increasingly used for dimensional measurements of geometrical features in engineering components. With widespread use of XCT instruments, there is growing need for the development of standardized test procedures to verify manufacturer specifications and provide pathways to establish metrological traceability. As technical committees within the American Society of Mechanical Engineers (ASME) and the International Organization for Standardization (ISO) are developing documentary standards that include test procedures that are sensitive to all known error sources, we report on work exploring one set of error sources, instrument geometry errors, and their effect on dimensional measurements. In particular, we studied detector and rotation stage errors in cone-beam XCT instruments and determined their influence on sphere center-to-center distance errors and sphere form errors for spheres located in the tomographically reconstructed measurement volume. We developed a novel method, called the single-point ray tracing method, that allows for efficient determination of the sphere center-to-center distance error and sphere form error in the presence of each of the different geometry errors in an XCT instrument. In Part I of this work, we (1) describe the single-point ray tracing method, (2) discuss optimal placement of spheres so that sphere center-to-center distance errors and sphere form errors are sensitive to the different detector geometry errors, and (3) present data validating our method against the more conventional radiograph-based tomographic reconstruction method. In Part II of this work, we discuss optimal placement of spheres so that sphere center-to-center distance errors and sphere form errors are sensitive to error sources associated with the rotation stage. This work is in support of ongoing standards development activity within ASME and ISO for XCT performance evaluation.","PeriodicalId":54766,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":null,"pages":null},"PeriodicalIF":1.5,"publicationDate":"2019-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"41899820","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"X-ray Computed Tomography Instrument Performance Evaluation, Part II: Sensitivity to Rotation Stage Errors.","authors":"Bala Muralikrishnan, Meghan Shilling, Steve Phillips, Wei Ren, Vincent Lee, Felix Kim","doi":"10.6028/jres.124.015","DOIUrl":"10.6028/jres.124.015","url":null,"abstract":"<p><p>The development of standards for evaluating the performance of X-ray computed tomography (XCT) instruments is ongoing within the American Society of Mechanical Engineers (ASME) and the International Organization for Standardization (ISO) working committees. A key challenge in developing documentary standards is to identify test procedures that are sensitive to known error sources. In Part I of this work, we described the effect of geometry errors associated with the detector and determined their influence through simulations on sphere center-to-center distance errors and sphere form errors for spheres located in the tomographically reconstructed measurement volume. We also introduced a new simulation method, the single-point ray tracing method, to efficiently perform the distance and form error computations and presented data validating the method. In this second part, also based on simulation studies, we describe the effect of errors associated with the rotation stage on sphere center-to-center distance errors and sphere form errors for spheres located in the tomographically reconstructed measurement volume. We recommend optimal sphere center locations that are most sensitive to rotation stage errors for consideration by documentary standards committees in the development of test procedures for performance evaluation.</p>","PeriodicalId":54766,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":null,"pages":null},"PeriodicalIF":1.5,"publicationDate":"2019-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7339642/pdf/jres-124-015.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"39702553","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Translator from Extended SysML to Physical Interaction and Signal Flow Simulation Platforms.","authors":"Raphael Barbau,&nbsp;Conrad Bock,&nbsp;Mehdi Dadfarnia","doi":"10.6028/jres.124.017","DOIUrl":"https://doi.org/10.6028/jres.124.017","url":null,"abstract":"","PeriodicalId":54766,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":null,"pages":null},"PeriodicalIF":1.5,"publicationDate":"2019-07-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.6028/jres.124.017","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"39702554","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Translator from Extended SysML to Physical Interaction and Signal Flow Simulation Platforms.","authors":"Raphael Barbau, C. Bock, M. Dadfarnia","doi":"10.1002/HTTPS://DOI.ORG/10.6028/JRES.124.017","DOIUrl":"https://doi.org/10.1002/HTTPS://DOI.ORG/10.6028/JRES.124.017","url":null,"abstract":"Designing complex systems often requires engineers from multiple disciplines\u0000 (mechanical, electrical, production, and so on) to communicate with each other and\u0000 exchange system design information. Systems engineering models are a\u0000 cross-disciplinary foundation for this process, but are not well-integrated with\u0000 specialized engineering information, leading to redundant and inconsistent system\u0000 specifications. The software provided here translates system models in the Systems\u0000 Modeling Language (SysML) to physical interaction and signal flow (also known as\u0000 lumped-parameter, one-dimensional, or network) files on two simulation platforms\u0000 used in many engineering domains.","PeriodicalId":54766,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":null,"pages":null},"PeriodicalIF":1.5,"publicationDate":"2019-07-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49264676","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Detailed Derivations of Formulas for Heat Release Rate Calculations Revisited: A Pedagogical and Systematic Approach.","authors":"Jiann C Yang","doi":"10.6028/jres.124.016","DOIUrl":"https://doi.org/10.6028/jres.124.016","url":null,"abstract":"<p><p>The derivations of the formulas for heat release rate calculations are revisited based on the oxygen consumption principle. A systematic, structured, and pedagogical approach to formulate the problem and derive the generalized formulas with fewer assumptions is used. The operation of oxygen consumption calorimetry is treated as a chemical flow process, the problem is formulated in matrix notation, and the associated material balances using the tie component concept commonly used in chemical engineering practices are solved. The derivation procedure described is intuitive and easy to follow. Inclusion of other chemical species in the measurements and calculations can be easily implemented using the generalized framework developed here.</p>","PeriodicalId":54766,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":null,"pages":null},"PeriodicalIF":1.5,"publicationDate":"2019-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.6028/jres.124.016","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"39814337","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}