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IEICE Transactions on Electronics最新文献

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Class-E Synchronous RF Rectifier: Circuit Formulation, Geodesic Trajectory, Time-Domain Simulation, and Prototype Experiment e类同步射频整流器:电路配方、测地线轨迹、时域仿真及原型实验
IF 0.5 4区 工程技术
IEICE Transactions on Electronics Pub Date : 2023-01-01 DOI: 10.1587/transele.2023mmp0004
Ryoya Honda, M. Mizutani, Masaya Tamura, T. Ohira
{"title":"Class-E Synchronous RF Rectifier: Circuit Formulation, Geodesic Trajectory, Time-Domain Simulation, and Prototype Experiment","authors":"Ryoya Honda, M. Mizutani, Masaya Tamura, T. Ohira","doi":"10.1587/transele.2023mmp0004","DOIUrl":"https://doi.org/10.1587/transele.2023mmp0004","url":null,"abstract":"","PeriodicalId":50384,"journal":{"name":"IEICE Transactions on Electronics","volume":"1 1","pages":"698-706"},"PeriodicalIF":0.5,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67306752","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Ferrule endface dimension optimization for standard outer diameter 4-core fiber connector 标准外径4芯光纤连接器护套端面尺寸优化
4区 工程技术
IEICE Transactions on Electronics Pub Date : 2023-01-01 DOI: 10.1587/transele.2023emp0001
Kiyoshi KAMIMURA, Yuki FUJIMAKI, Kentaro MATSUDA, Ryo NAGASE
{"title":"Ferrule endface dimension optimization for standard outer diameter 4-core fiber connector","authors":"Kiyoshi KAMIMURA, Yuki FUJIMAKI, Kentaro MATSUDA, Ryo NAGASE","doi":"10.1587/transele.2023emp0001","DOIUrl":"https://doi.org/10.1587/transele.2023emp0001","url":null,"abstract":"Physical contact (PC) optical connectors realize long-term stability by maintaining contact with the optical fiber even during temperature fluctuations caused by the microscopic displacement of the ferrule endface. With multicore fiber (MCF) connectors, stable PC connection conditions need to be newly investigated because MCFs have cores other than at the center. In this work, we investigated the microscopic displacement of connected ferrule endfaces using the finite element method (FEM). As a result, by using MCF connectors with an apex offset, we found that the allowable fiber undercut where all the cores make contact is slightly smaller than that of single-mode fiber (SMF) connectors. Therefore, we propose a new equation for determining the allowable fiber undercut of MCF connectors. We also fabricated MCF connectors with an allowable fiber undercut and confirmed their reliability using the composite temperature/humidity cyclic test.","PeriodicalId":50384,"journal":{"name":"IEICE Transactions on Electronics","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135843506","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A 0.6-V 41.3-GHz Power-Scalable Sub-Sampling PLL in 55-nm CMOS DDC 基于55nm CMOS DDC的0.6 v 41.3 ghz功率可扩展子采样锁相环
IF 0.5 4区 工程技术
IEICE Transactions on Electronics Pub Date : 2023-01-01 DOI: 10.1587/transele.2022cts0001
Sangyeop Lee, K. Takano, S. Amakawa, T. Yoshida, M. Fujishima
{"title":"A 0.6-V 41.3-GHz Power-Scalable Sub-Sampling PLL in 55-nm CMOS DDC","authors":"Sangyeop Lee, K. Takano, S. Amakawa, T. Yoshida, M. Fujishima","doi":"10.1587/transele.2022cts0001","DOIUrl":"https://doi.org/10.1587/transele.2022cts0001","url":null,"abstract":"","PeriodicalId":50384,"journal":{"name":"IEICE Transactions on Electronics","volume":"106 1","pages":"533-537"},"PeriodicalIF":0.5,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67306320","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Novel Trench MOS Barrier Schottky Contact Super Barrier Rectifier 一种新型沟槽MOS势垒肖特基触点超级势垒整流器
IF 0.5 4区 工程技术
IEICE Transactions on Electronics Pub Date : 2023-01-01 DOI: 10.1587/transele.2022ecp5059
Peijian Zhang, K. Zhu, Wensuo Chen
{"title":"A Novel Trench MOS Barrier Schottky Contact Super Barrier Rectifier","authors":"Peijian Zhang, K. Zhu, Wensuo Chen","doi":"10.1587/transele.2022ecp5059","DOIUrl":"https://doi.org/10.1587/transele.2022ecp5059","url":null,"abstract":"","PeriodicalId":50384,"journal":{"name":"IEICE Transactions on Electronics","volume":"1 1","pages":""},"PeriodicalIF":0.5,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67306380","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Capacitive Wireless Power Transfer System with Misalignment Tolerance in Flowing Freshwater Environments 流动淡水环境中容差电容式无线输电系统
IF 0.5 4区 工程技术
IEICE Transactions on Electronics Pub Date : 2023-01-01 DOI: 10.1587/transele.2023ecp5018
Yasumasa Naka, Akihiko Ishiwata, Masaya Tamura
{"title":"Capacitive Wireless Power Transfer System with Misalignment Tolerance in Flowing Freshwater Environments","authors":"Yasumasa Naka, Akihiko Ishiwata, Masaya Tamura","doi":"10.1587/transele.2023ecp5018","DOIUrl":"https://doi.org/10.1587/transele.2023ecp5018","url":null,"abstract":"","PeriodicalId":50384,"journal":{"name":"IEICE Transactions on Electronics","volume":"1 1","pages":""},"PeriodicalIF":0.5,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67306712","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Encouraging Innovation in Analog IC Design 鼓励模拟集成电路设计创新
IF 0.5 4区 工程技术
IEICE Transactions on Electronics Pub Date : 2023-01-01 DOI: 10.1587/transele.2022cti0001
C. Mangelsdorf
{"title":"Encouraging Innovation in Analog IC Design","authors":"C. Mangelsdorf","doi":"10.1587/transele.2022cti0001","DOIUrl":"https://doi.org/10.1587/transele.2022cti0001","url":null,"abstract":"SUMMARY Recent years have seen a decline in the art of analog IC de-sign even though analog interface and analog signal processing remain just as essential as ever. While there are many contributing factors, four specific pressures which contribute the most to the loss of creativity and innovation within analog practice are examined: process evolution, risk aversion, digitally assisted analog, and corporate culture. Despite the potency of these forces, none are found to be insurmountable obstacles to reinvigorating the industry. A more creative future is within our reach.","PeriodicalId":50384,"journal":{"name":"IEICE Transactions on Electronics","volume":"106 1","pages":"516-520"},"PeriodicalIF":0.5,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67305500","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A 58-%-Lock-Range Divide-by-9 Injection-Locked Frequency Divider Using Harmonic-Control Technique 采用谐波控制技术的58%锁程/ 9注入锁频分频器
IF 0.5 4区 工程技术
IEICE Transactions on Electronics Pub Date : 2023-01-01 DOI: 10.1587/transele.2022cts0003
Sangyeop Lee, S. Amakawa, T. Yoshida, M. Fujishima
{"title":"A 58-%-Lock-Range Divide-by-9 Injection-Locked Frequency Divider Using Harmonic-Control Technique","authors":"Sangyeop Lee, S. Amakawa, T. Yoshida, M. Fujishima","doi":"10.1587/transele.2022cts0003","DOIUrl":"https://doi.org/10.1587/transele.2022cts0003","url":null,"abstract":"","PeriodicalId":50384,"journal":{"name":"IEICE Transactions on Electronics","volume":"106 1","pages":"529-532"},"PeriodicalIF":0.5,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67306407","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An SOI-Based Lock-in Pixel with a Shallow Buried Channel for Reducing Parasitic Light Sensitivity and Improving Modulation Contrast 基于soi的浅埋通道锁相像素降低寄生光灵敏度和提高调制对比度
IF 0.5 4区 工程技术
IEICE Transactions on Electronics Pub Date : 2023-01-01 DOI: 10.1587/transele.2022ctp0003
Tatsuya Kobayashi, K. Yasutomi, Naoki Takada, S. Kawahito
{"title":"An SOI-Based Lock-in Pixel with a Shallow Buried Channel for Reducing Parasitic Light Sensitivity and Improving Modulation Contrast","authors":"Tatsuya Kobayashi, K. Yasutomi, Naoki Takada, S. Kawahito","doi":"10.1587/transele.2022ctp0003","DOIUrl":"https://doi.org/10.1587/transele.2022ctp0003","url":null,"abstract":"","PeriodicalId":50384,"journal":{"name":"IEICE Transactions on Electronics","volume":"106 1","pages":"538-545"},"PeriodicalIF":0.5,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67306133","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Simplified Method for Determining Mathematical Representation of Microwave Oscillator Load Characteristics 一种确定微波振荡器负载特性数学表示的简化方法
4区 工程技术
IEICE Transactions on Electronics Pub Date : 2023-01-01 DOI: 10.1587/transele.2023ecs6009
Katsumi FUKUMOTO
{"title":"A Simplified Method for Determining Mathematical Representation of Microwave Oscillator Load Characteristics","authors":"Katsumi FUKUMOTO","doi":"10.1587/transele.2023ecs6009","DOIUrl":"https://doi.org/10.1587/transele.2023ecs6009","url":null,"abstract":"","PeriodicalId":50384,"journal":{"name":"IEICE Transactions on Electronics","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134980029","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Universal Angle Visibility Realized by a Volumetric 3D Display Using a Rotating Mirror-Image Helix Screen 利用旋转镜像螺旋屏的三维立体显示实现的通用角度可见性
IF 0.5 4区 工程技术
IEICE Transactions on Electronics Pub Date : 2023-01-01 DOI: 10.1587/transele.2023dii0003
Karin Wakatsuki, C. Fujikawa, M. Omodani
{"title":"Universal Angle Visibility Realized by a Volumetric 3D Display Using a Rotating Mirror-Image Helix Screen","authors":"Karin Wakatsuki, C. Fujikawa, M. Omodani","doi":"10.1587/transele.2023dii0003","DOIUrl":"https://doi.org/10.1587/transele.2023dii0003","url":null,"abstract":"","PeriodicalId":50384,"journal":{"name":"IEICE Transactions on Electronics","volume":"1 1","pages":""},"PeriodicalIF":0.5,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67306856","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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