Applied Physics B最新文献_第10页

Biomimetic moth-eye structures fabricated by double-exposure lithography using coplanar three-beam laser interference 用共面三束激光干涉双曝光光刻制备仿生蛾眼结构

IF 2 3区物理与天体物理

Applied Physics B Pub Date : 2025-05-09 DOI: 10.1007/s00340-025-08474-3

Litong Dong, Xiangyu Li, Mengnan Liu, Lu Wang, Zuobin Wang, Dayou Li

引用次数: 0

Quantum entanglement in two-photon Rabi Stark model 双光子Rabi Stark模型中的量子纠缠

IF 2 3区物理与天体物理

Applied Physics B Pub Date : 2025-05-08 DOI: 10.1007/s00340-025-08470-7

Zakaria Boutakka, Zoubida Sakhi, Mohamed Bennai

{"title":"Quantum entanglement in two-photon Rabi Stark model","authors":"Zakaria Boutakka, Zoubida Sakhi, Mohamed Bennai","doi":"10.1007/s00340-025-08470-7","DOIUrl":"10.1007/s00340-025-08470-7","url":null,"abstract":"<div><p>In this study, we delve into the critical quantum phenomena of the two-photon Rabi-Stark model (<i>2pRSM</i>), thereby establishing a foundational basis for the development of more effective and scalable quantum sensing technologies. Our analysis explores how variations in coupling strengths and Stark coupling parameters influence the quantum dynamics within the system. Through a detailed numerical investigation, we uncover the phenomenon of spectral collapse in the <i>2pRSM</i>, analyzing its dependence on the qubit-cavity field coupling strength to provide further physical insights. We further employ the Wigner function as a tool to visualize and quantify the system’s non-classical characteristics, highlighting the ground state’s negativity as an indicator of its quantum characteristics. Additionally, the dynamics of entanglement are rigorously investigated across a range of Stark coupling strengths using von Neumann entropy, thereby emphasizing the pivotal role of Stark interactions in modulating quantum entanglement. By clarifying these fundamental quantum features, our work bridges theoretical insights with practical implications, establishing a solid foundation for advancements in quantum information science and enabling transformative applications in quantum sensing and related fields.</p></div>","PeriodicalId":474,"journal":{"name":"Applied Physics B","volume":"131 6","pages":""},"PeriodicalIF":2.0,"publicationDate":"2025-05-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143919270","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Randomness in quantum random number generator from vacuum fluctuations with source-device-independence 源-设备无关真空涨落量子随机数发生器的随机性

IF 2 3区物理与天体物理

Applied Physics B Pub Date : 2025-05-07 DOI: 10.1007/s00340-025-08471-6

Megha Shrivastava, Mohit Mittal, Isha Kumari, Venkat Abhignan

引用次数: 0

Design of a measurement system for the radius of curvature, thickness, and refractive index of spherical transparent materials 球形透明材料曲率半径、厚度和折射率测量系统的设计

IF 2 3区物理与天体物理

Applied Physics B Pub Date : 2025-05-07 DOI: 10.1007/s00340-025-08469-0

Fan-Hsi Hsu, Chien-Sheng Liu, Yi-Chi Li

{"title":"Design of a measurement system for the radius of curvature, thickness, and refractive index of spherical transparent materials","authors":"Fan-Hsi Hsu, Chien-Sheng Liu, Yi-Chi Li","doi":"10.1007/s00340-025-08469-0","DOIUrl":"10.1007/s00340-025-08469-0","url":null,"abstract":"<div><p>To address the limitations of current technologies and equipment in simultaneously measuring multiple parameters of spherical transparent materials, this study proposes an innovative optical measurement system to simultaneously measure the radius of curvature, thickness, and refractive index of spherical transparent materials. While existing methods for measuring spherical transparent materials can independently determine the radius of curvature, thickness, and refractive index, they are typically costly and limited in scope. Using image processing techniques, such as the maximum value and centroid methods, the positions of reflected and refracted light spots under different incident beam angles are extracted for analysis. Moreover, the skew ray tracing method combined with homogeneous coordinate transformation matrices is employed to establish measurement algorithms. Furthermore, simulations and experimental verifications are also conducted. According to the verification results, the accuracy and measurement ranges of each parameter are as follows: radius of curvature (100–940 mm, ± 0.01 mm), central thickness (1–10 mm, ± 0.0001 mm), and refractive index (1–3.6, ± 0.001). Finally, it is worth emphasizing that the proposed robust and cost-effective measurement system achieves high accuracy and stability.</p></div>","PeriodicalId":474,"journal":{"name":"Applied Physics B","volume":"131 6","pages":""},"PeriodicalIF":2.0,"publicationDate":"2025-05-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143913948","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Looking for optimal materials for whispering gallery modes applications at the 2 μm window 寻找在2 μm窗口处低语廊模式应用的最佳材料

IF 2 3区物理与天体物理

Applied Physics B Pub Date : 2025-05-04 DOI: 10.1007/s00340-025-08472-5

Lorena Velazquez-Ibarra, Juan Barranco

{"title":"Looking for optimal materials for whispering gallery modes applications at the 2 μm window","authors":"Lorena Velazquez-Ibarra, Juan Barranco","doi":"10.1007/s00340-025-08472-5","DOIUrl":"10.1007/s00340-025-08472-5","url":null,"abstract":"<div><p>The diverse applications of whispering gallery modes in spherical microresonators are strongly related to the sphere size and material composition. Their design should therefore be optimized to ensure that parameters such as the quality factor and the free spectral range are maximized. Because of the imminent capacity crisis of the optical communication systems operating at the 1550 nm wavelength regime, it is time to explore optical communications at the 2 <span>(upmu text {m})</span> wavelength window. In this work, we analytically investigate key resonator parameters—quality factor and free spectral range—as a function of wavelength, aiming to establish a methodology to help identify optimal materials for whispering gallery mode sensors, with special attention at the 2 <span>(upmu text {m})</span> wavelength window. Specifically, we examine three materials: fused silica, AsSe chalcogenide glass and calcium fluoride, and we perform a comparison between them in order to identify the region in the parameter space of resonant wavelengths and sphere radius, <span>((lambda _R,R)</span>), where the WGM resonators are optimal at wavelengths <span>(1.8,upmu text{ m }<lambda <2.1,upmu text{ m })</span>.</p></div>","PeriodicalId":474,"journal":{"name":"Applied Physics B","volume":"131 5","pages":""},"PeriodicalIF":2.0,"publicationDate":"2025-05-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143902802","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Measurement of the global surface reflectance at 1572 nm using spaceborne aerosol and carbon dioxide detection lidar 利用星载气溶胶和二氧化碳探测激光雷达测量1572 nm处的全球表面反射率

IF 2 3区物理与天体物理

Applied Physics B Pub Date : 2025-05-03 DOI: 10.1007/s00340-025-08473-4

Cheng Chen, Chuncan Fan, Zitong Wu, Yuan Xie, Jianbo Hu, Juxin Yang, Xiaopeng Zhu, Jiqiao Liu, Weibiao Chen

{"title":"Measurement of the global surface reflectance at 1572 nm using spaceborne aerosol and carbon dioxide detection lidar","authors":"Cheng Chen, Chuncan Fan, Zitong Wu, Yuan Xie, Jianbo Hu, Juxin Yang, Xiaopeng Zhu, Jiqiao Liu, Weibiao Chen","doi":"10.1007/s00340-025-08473-4","DOIUrl":"10.1007/s00340-025-08473-4","url":null,"abstract":"<div><p>This study employs the Aerosol and Carbon dioxide Detection Lidar (ACDL) instrument on the Atmospheric Environment Monitoring Satellite to measure the global surface reflectance at 1572 nm. The ACDL utilizes the integrated path differential absorption method at this wavelength for atmospheric carbon dioxide column concentration measurements, with the ground echo signals providing additional data on surface reflectance. The results are compared with those derived from the MOD09CMG dataset with a correlation coefficient of 91.71%. The global surface reflectance results reveal seasonal and geographical variations. The highest reflectance values were observed in the Sahara Desert, while icy regions such as Antarctica exhibited lower reflectance. Analysis of different terrain types, including water bodies, glaciers, and bare land, showed distinct reflectance characteristics influenced by factors such as wind speed, elevation, and seasonality. The results are important for the development and performance evaluation of the integrated path differential absorption (IPDA) Lidar or laser altimeter at 1.6 μm in the future.</p></div>","PeriodicalId":474,"journal":{"name":"Applied Physics B","volume":"131 5","pages":""},"PeriodicalIF":2.0,"publicationDate":"2025-05-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143900765","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Microsphere probe for in-situ high-resolution thickness measurement 用于原位高分辨率厚度测量的微球探头

IF 2 3区物理与天体物理

Applied Physics B Pub Date : 2025-04-26 DOI: 10.1007/s00340-025-08468-1

Shuai Xing, Xinyu Zhang, Tianci Shen, Lin Dou, Jiaxin Yu, Fuxing Gu

{"title":"Microsphere probe for in-situ high-resolution thickness measurement","authors":"Shuai Xing, Xinyu Zhang, Tianci Shen, Lin Dou, Jiaxin Yu, Fuxing Gu","doi":"10.1007/s00340-025-08468-1","DOIUrl":"10.1007/s00340-025-08468-1","url":null,"abstract":"<div><p>Precise thickness measurement of nanometer-scale dielectrics is crucial for the manufacturing and packaging of high-performance integrated optoelectronic devices. Traditional methods, such as atomic force microscopy, ellipsometry, and evanescent wave sensing techniques, are renowned for their precision but face challenges, such as the need for reference surfaces, precise knowledge of the material’s optical properties, and difficulties with large-area, non-uniform measurements. Here, we propose a high-resolution, full-field thickness measurement technique utilizing the evanescent fields of high-order cavity modes in microsphere resonators. By exploiting the discrepancy in sensitivity among different modes, this method directly achieves consistent thickness measurements across extensive lateral dimensions without requiring reference surfaces. Compared to other optical methods, it offers a simple design and efficient readout, while maintaining a precision of about 0.10 nm per nanometer of spectral shift. When combined with optical manipulation and machine learning algorithms, this technique could provide an alternative solution for real-time monitoring of dielectric layers in semiconductor manufacturing.</p></div>","PeriodicalId":474,"journal":{"name":"Applied Physics B","volume":"131 5","pages":""},"PeriodicalIF":2.0,"publicationDate":"2025-04-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143875292","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Transfer of diode pumped Er:YLF laser radiation by hollow glass waveguides 二极管泵浦Er:YLF激光辐射在中空玻璃波导中的传输

IF 2 3区物理与天体物理

Applied Physics B Pub Date : 2025-04-24 DOI: 10.1007/s00340-025-08467-2

Zuzana Fialková, Michal Němec, Jan Šulc, Helena Jelínková, Katsumasa Iwai, Hiroyuki Takaku, Mitsonobu Miyagi

引用次数: 0

A feasible method for real-time measuring the refractive index of micron-scale biological silks at different humidity 一种实时测量不同湿度下微米尺度生物丝折射率的可行方法

IF 2 3区物理与天体物理

Applied Physics B Pub Date : 2025-04-22 DOI: 10.1007/s00340-025-08425-y

Yu Zhang, Yutong Zhao, Siying Cheng, Min Zhang, Yifan Qin, Yaxun Zhang, Zhihai Liu

{"title":"A feasible method for real-time measuring the refractive index of micron-scale biological silks at different humidity","authors":"Yu Zhang, Yutong Zhao, Siying Cheng, Min Zhang, Yifan Qin, Yaxun Zhang, Zhihai Liu","doi":"10.1007/s00340-025-08425-y","DOIUrl":"10.1007/s00340-025-08425-y","url":null,"abstract":"<div><p>Biological silk is a natural optical waveguide with humidity-sensitive properties. The refractive index (RI) is a critical parameter that determines the optical properties of waveguides and is greatly affected by humidity. In this article, we propose an optical method for real-time measuring the RI of micron-scale biological silks at different humidity. We employ a section of single-mode fiber (SMF) and a section of biological silk to configure an F-P cavity structure. By recording the spectrum and diameter of the silk under different humidity, we can obtain the relationship among free spectral range (FSR)、diameter, and relative humidity (RH). Based on this relationship, we calculate the variation of RI with humidity. We measure three materials in the 30–80% RH range. The measurement results indicate that during this process, the RI of spider egg sac silk (SESS) ranges from 1.491 ± 0.003 to 1.412 ± 0.009, mulberry silk is 1.551 ± 0.009 to 1.473 ± 0.005, and radial silk is 1.549 ± 0.005 to 1.479 ± 0.003. The relative uncertainty in the range ± 5 × 10<sup>− 3</sup> to ± 7 × 10<sup>− 3</sup> is achieved for these challenging samples. This rapid and convenient measurement method provides a new perspective for applying biological silks.</p></div>","PeriodicalId":474,"journal":{"name":"Applied Physics B","volume":"131 5","pages":""},"PeriodicalIF":2.0,"publicationDate":"2025-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143856630","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Difference frequency generation in CdSe quantum dots CdSe量子点的差频产生

IF 2 3区物理与天体物理

Applied Physics B Pub Date : 2025-04-21 DOI: 10.1007/s00340-025-08462-7

Komal Jain, Deepti Maikhuri, Anshuman Sahai

引用次数: 0