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Small-Sized Hyperspectrometers with On-Line Image Recording 带在线图像记录功能的小型高光谱仪
IF 0.4
Optoelectronics Instrumentation and Data Processing Pub Date : 2024-03-26 DOI: 10.3103/s8756699023060018
S. M. Borzov, P. E. Kotlyar, O. I. Potaturkin
{"title":"Small-Sized Hyperspectrometers with On-Line Image Recording","authors":"S. M. Borzov, P. E. Kotlyar, O. I. Potaturkin","doi":"10.3103/s8756699023060018","DOIUrl":"https://doi.org/10.3103/s8756699023060018","url":null,"abstract":"<h3 data-test=\"abstract-sub-heading\">Abstract</h3><p>Based on an analysis of the main modern trends in the design of hyperspectral equipment, it is shown that when creating new small-sized devices for using in ground-based observation systems, the use of integrated optoelectronic circuits and optical components in planar design is promising. In particular, the expediency of using micromirror arrays in scanning systems and Mach–Zehnder planar interferometers in spectrum separation systems was noted. This makes it possible to abandon bulky, slow, and not always reliable mechanical components and create devices with on-line hyperspectral image recording.</p>","PeriodicalId":44919,"journal":{"name":"Optoelectronics Instrumentation and Data Processing","volume":"28 1","pages":""},"PeriodicalIF":0.4,"publicationDate":"2024-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140300410","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Structure and Thermal Conductivity of Thin Films of the Si $${}_{{1-x}}$$ Ge $${}_{{x}}$$ Alloy Formed by Electrochemical Deposition of Germanium into Porous Silicon 电化学沉积锗到多孔硅中形成的 Si ${$}_{{1-x}}$ Ge ${$}_{{x}}$ 合金薄膜的结构和导热率
IF 0.4
Optoelectronics Instrumentation and Data Processing Pub Date : 2024-03-26 DOI: 10.3103/s8756699023060043
D. L. Goroshko, I. M. Gavrilin, A. A. Dronov, O. A. Goroshko, L. S. Volkova
{"title":"Structure and Thermal Conductivity of Thin Films of the Si $${}_{{1-x}}$$ Ge $${}_{{x}}$$ Alloy Formed by Electrochemical Deposition of Germanium into Porous Silicon","authors":"D. L. Goroshko, I. M. Gavrilin, A. A. Dronov, O. A. Goroshko, L. S. Volkova","doi":"10.3103/s8756699023060043","DOIUrl":"https://doi.org/10.3103/s8756699023060043","url":null,"abstract":"<h3 data-test=\"abstract-sub-heading\">Abstract</h3><p>Continuous and porous films of Si<span>({}_{1-x})</span>Ge<span>({}_{x})</span> alloys with a germanium content of about 40<span>(%)</span> and a thickness of 3–4 <span>(mu)</span>m formed on single-crystal silicon by electrochemical deposition into the porous silicon matrix with a subsequent rapid thermal annealing at a temperature of 950<span>({}^{circ})</span>C have been investigated by the Raman scattering spectroscopy and scanning electron microscopy methods. Based on the spectra in the Stokes and anti-Stokes frequency bands with the use of the Boltzmann statistics and the Fourier thermal conductivity law, the film thermal conductivity coefficients have been determined; their values are 7–9 and 3–6 W/(m K) for the continuous and porous films, respectively. The low thermal conductivity of the porous film is explained by an additional phonon scattering at a developed surface of pores. The possibility of application of such films in thermoelectric converters is provided by the simplicity and scalability of the procedure of alloy producing and its low thermal conductivity</p>","PeriodicalId":44919,"journal":{"name":"Optoelectronics Instrumentation and Data Processing","volume":"233 1","pages":""},"PeriodicalIF":0.4,"publicationDate":"2024-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140300387","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Raman Scattering Spectroscopy and Photoluminescence of GaAs Nanowires 砷化镓纳米线的拉曼散射光谱学和光致发光
IF 0.4
Optoelectronics Instrumentation and Data Processing Pub Date : 2024-03-26 DOI: 10.3103/s8756699023060055
I. V. Kalachev, I. A. Milekhin, E. A. Emel’yanov, V. V. Preobrazhenskii, V. S. Tumashev, A. G. Milekhin, A. V. Latyshev
{"title":"Raman Scattering Spectroscopy and Photoluminescence of GaAs Nanowires","authors":"I. V. Kalachev, I. A. Milekhin, E. A. Emel’yanov, V. V. Preobrazhenskii, V. S. Tumashev, A. G. Milekhin, A. V. Latyshev","doi":"10.3103/s8756699023060055","DOIUrl":"https://doi.org/10.3103/s8756699023060055","url":null,"abstract":"<h3 data-test=\"abstract-sub-heading\">Abstract</h3><p>Experimental data on studying the phonon and optical properties of GaAs nanowires with orientation (111) located on a gold substrate with the help of Raman scattering spectroscopy (RSS) and photoluminescence (PL) are presented. Structural parameters of nanowires are determined by the atomic-force microscopy (AFM) and scanning electron microscopy (SEM) methods. In the micro-RSS and micro-PL spectra of a single GaAs nanowire, the modes of optical phonons of GaAs and their overtones up to the third order and an exciton luminescence band are observed. In the micro-PL spectra, anisotropy of the PL intensity is observed; the maximum/minimum signal is observed at the polarization-vector direction along/across the wire. Mapping of nano-PL of a single GaAs nanowire is performed with a spatial resolution of 20 nm, which is significantly smaller than the diffraction limit. When passing to the nanometer scale, a plasmon amplification of the signal of the near-field exciton nano-PL conditioned by the metallized AFM-needle is revealed.</p>","PeriodicalId":44919,"journal":{"name":"Optoelectronics Instrumentation and Data Processing","volume":"32 1","pages":""},"PeriodicalIF":0.4,"publicationDate":"2024-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140300300","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Masked Faces Recognition Using Deep Learning Models and the Structural Similarity Measure 利用深度学习模型和结构相似性度量识别蒙面人脸
IF 0.4
Optoelectronics Instrumentation and Data Processing Pub Date : 2024-03-26 DOI: 10.3103/s8756699023060146
Ouahab Abdelwhab
{"title":"Masked Faces Recognition Using Deep Learning Models and the Structural Similarity Measure","authors":"Ouahab Abdelwhab","doi":"10.3103/s8756699023060146","DOIUrl":"https://doi.org/10.3103/s8756699023060146","url":null,"abstract":"<h3 data-test=\"abstract-sub-heading\">Abstract</h3><p>Wearing a mask is an important element to prevent infection with Corona disease. With the widespread adoption of face masks as a preventive measure, traditional face recognition systems encounter challenges in accurately identifying individuals. In this paper, we proposed a methodology that uses different deep learning models with pretrained weights on ImageNet to extract features and the structural similarity measure (SSIM) to recognize masked faces. Ten deep learning models were used, which are VGG16, VGG19, ReseNet50, Inception, InpectionV3, MobileNet, DenseNet201, NasNetMobile, EfficientNetB7, and InceptionResNet. The classification accuracy is used to evaluate the performance of each model. VGG-16, VGG-19, MobileNet and EfficientNetB7 gave the best results with an accuracy of 98<span>(%)</span> which means that these methods are more appropriate for masked face recognition.</p>","PeriodicalId":44919,"journal":{"name":"Optoelectronics Instrumentation and Data Processing","volume":"22 1","pages":""},"PeriodicalIF":0.4,"publicationDate":"2024-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140300168","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Determination of the Pore Direction in a Crystalline Metal-Organic Framework by Raman Spectroscopy and Periodic Calculations Based on the Electron Density Functional Theory 通过拉曼光谱和基于电子密度函数理论的周期计算确定晶体金属有机框架中的孔隙方向
IF 0.4
Optoelectronics Instrumentation and Data Processing Pub Date : 2024-03-26 DOI: 10.3103/s8756699023060134
N. V. Slyusarenko, I. D. Yushina, E. A. Slyusareva, E. V. Golovkina, S. N. Krylova, A. N. Vtyurin, A. S. Krylov
{"title":"Determination of the Pore Direction in a Crystalline Metal-Organic Framework by Raman Spectroscopy and Periodic Calculations Based on the Electron Density Functional Theory","authors":"N. V. Slyusarenko, I. D. Yushina, E. A. Slyusareva, E. V. Golovkina, S. N. Krylova, A. N. Vtyurin, A. S. Krylov","doi":"10.3103/s8756699023060134","DOIUrl":"https://doi.org/10.3103/s8756699023060134","url":null,"abstract":"<h3 data-test=\"abstract-sub-heading\">Abstract</h3><p>A method for the determination of pore orientation in metal-organic framework structures by polarized Raman spectra is proposed. The method involves sensitivity of the line intensity of Raman scattering to the geometry of propagation in a crystal. The operability of the method is shown by DUT-8 (Ni, Co) crystals. The obtained results are interpreted based on analysis of symmetry and direction of vibrations within periodic calculations of the electron density functional theory. The simultaneous approach allowed us to describe the vibrations and to find the principal crystal orientation collinear to the pore direction. The information on the pore orientation is necessary for problems of adsorption and design of complex multicomponent materials based on metal-organic framework.</p>","PeriodicalId":44919,"journal":{"name":"Optoelectronics Instrumentation and Data Processing","volume":"22 1","pages":""},"PeriodicalIF":0.4,"publicationDate":"2024-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140300403","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Unusual Properties of Raman Spectra of Carbon Graphite from Seregen Deposit (Taimyr). A New Allotropic Form of Carbon? 塞雷根矿藏（泰米尔）碳石墨拉曼光谱的异常特性。碳的新同素异形体？
IF 0.4
Optoelectronics Instrumentation and Data Processing Pub Date : 2024-03-26 DOI: 10.3103/s8756699023060092
N. N. Mel’nik, S. K. Simakov, D. S. Kostsov
{"title":"Unusual Properties of Raman Spectra of Carbon Graphite from Seregen Deposit (Taimyr). A New Allotropic Form of Carbon?","authors":"N. N. Mel’nik, S. K. Simakov, D. S. Kostsov","doi":"10.3103/s8756699023060092","DOIUrl":"https://doi.org/10.3103/s8756699023060092","url":null,"abstract":"<h3 data-test=\"abstract-sub-heading\">Abstract</h3><p>Fossil coal samples from various deposits were studied using the Raman scattering. An unusual Raman spectrum was discovered for coal graphite from the Seregen deposit (Taimyr). The spectrum consists of intense narrow bands, usually characteristic for single crystals, unlike the standard spectra for fossil coals—broad D and G bands and a weak second-order Raman spectrum. Research has shown that there is no direct analogy between the spectra of the Taimyr sample of coal graphite and the Raman spectra of other allotropic forms of carbon. Based on the experiments we posit that there is a possible new allotropic form of carbon.</p>","PeriodicalId":44919,"journal":{"name":"Optoelectronics Instrumentation and Data Processing","volume":"1 1","pages":""},"PeriodicalIF":0.4,"publicationDate":"2024-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140300404","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Separation of Spectral Lines from a Broadband Background and Noise Filtering by Modified Tikhonov Regularization 通过修正的提霍诺夫正则化从宽带背景中分离光谱线并过滤噪声
IF 0.4
Optoelectronics Instrumentation and Data Processing Pub Date : 2024-03-26 DOI: 10.3103/s8756699023060080
I. A. Larkin, A. V. Vagov, V. I. Korepanov
{"title":"Separation of Spectral Lines from a Broadband Background and Noise Filtering by Modified Tikhonov Regularization","authors":"I. A. Larkin, A. V. Vagov, V. I. Korepanov","doi":"10.3103/s8756699023060080","DOIUrl":"https://doi.org/10.3103/s8756699023060080","url":null,"abstract":"<h3 data-test=\"abstract-sub-heading\">Abstract</h3><p>We propose a technique for processing noisy spectral data that implements a mathematically based selection of sharp signal peaks on an unknown smooth background, for which there is no reliable theoretical model. The fundamental concept of the technique is to construct an optimizing functional that gives the most probable parameters of spectral lines. Unlike the Tikhonov regularization method, where a smooth unknown function is extracted from a noisy signal, we consider the problem of regularizing the superposition of a smooth background function with sharp peaks. The proposed approach provides an algorithm for processing experimental data that makes it possible to filter out random noise and determine both the peak parameters and the background function with good accuracy. Finding the optimal regularization parameters is based on a priori assumptions about the smoothness of the background function and the statistical properties of random noise.</p>","PeriodicalId":44919,"journal":{"name":"Optoelectronics Instrumentation and Data Processing","volume":"56 1","pages":""},"PeriodicalIF":0.4,"publicationDate":"2024-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140300390","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The Influence of Nonlinear Phase Noise on Amplitude-Phase Channel OFDM Signals in Coherent Fiber-Optic Transmission Systems 相干光纤传输系统中非线性相位噪声对幅相信道 OFDM 信号的影响
IF 0.4
Optoelectronics Instrumentation and Data Processing Pub Date : 2024-03-08 DOI: 10.3103/s8756699023050114
V. A. Vardanyan
{"title":"The Influence of Nonlinear Phase Noise on Amplitude-Phase Channel OFDM Signals in Coherent Fiber-Optic Transmission Systems","authors":"V. A. Vardanyan","doi":"10.3103/s8756699023050114","DOIUrl":"https://doi.org/10.3103/s8756699023050114","url":null,"abstract":"<h3 data-test=\"abstract-sub-heading\">Abstract</h3><p>A coherent fiber-optic transmission systems of OFDM signals is considered. The channels are formed using spectral-efficient modulation formats (QPSK and M-QAM). The influence of nonlinear phase noise arising in an optical fiber on channel signals is studied. It is shown that nonlinear phase noise appearing in the optical path is converted into amplitude noise and, mixing with the noise of optical amplifiers, leads to a decrease in the signal quality factor. Estimation formulas for determining the noise immunity of channel signals by calculating the Q-factor are given.</p>","PeriodicalId":44919,"journal":{"name":"Optoelectronics Instrumentation and Data Processing","volume":"278 1","pages":""},"PeriodicalIF":0.4,"publicationDate":"2024-03-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140072164","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Reconstruction of 3D Objects Based on Data from a Single View 基于单一视图数据重建 3D 物体
IF 0.4
Optoelectronics Instrumentation and Data Processing Pub Date : 2024-03-08 DOI: 10.3103/s8756699023050126
S. I. Vyatkin, B. S. Dolgovesov
{"title":"Reconstruction of 3D Objects Based on Data from a Single View","authors":"S. I. Vyatkin, B. S. Dolgovesov","doi":"10.3103/s8756699023050126","DOIUrl":"https://doi.org/10.3103/s8756699023050126","url":null,"abstract":"<h3 data-test=\"abstract-sub-heading\">Abstract</h3><p>A method for reconstruction of 3D objects based on data from a single image of curved surfaces is proposed. To reconstruct the surface, object silhouette data and a multilevel height map are used. Unlike known approaches to single-view reconstruction, the method has no depth limitation and requires an order of magnitude less calculations. High-resolution 3D models can be generated interactively.</p>","PeriodicalId":44919,"journal":{"name":"Optoelectronics Instrumentation and Data Processing","volume":"31 1","pages":""},"PeriodicalIF":0.4,"publicationDate":"2024-03-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140072442","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Optimization of Local Heat Transfer in Impact Jet Using Active Flow Control and Feedback 利用主动流量控制和反馈优化冲击射流中的局部传热
IF 0.4
Optoelectronics Instrumentation and Data Processing Pub Date : 2024-03-08 DOI: 10.3103/s8756699023050102
M. P. Tokarev, M. Yu. Nichik, O. A. Gobyzov, I. A. Fedotov, V. M. Dulin
{"title":"Optimization of Local Heat Transfer in Impact Jet Using Active Flow Control and Feedback","authors":"M. P. Tokarev, M. Yu. Nichik, O. A. Gobyzov, I. A. Fedotov, V. M. Dulin","doi":"10.3103/s8756699023050102","DOIUrl":"https://doi.org/10.3103/s8756699023050102","url":null,"abstract":"<h3 data-test=\"abstract-sub-heading\">Abstract</h3><p>The development of methods for controlling flow and heat transfer in submerged turbulent jets (impact jets) impinging on an obstacle is an important problem, since this configuration is used in various technical applications. Active flow control technology and optimization of the signal that controls the external flow disturbance in impact jets can be applied to use the inherent properties of the flow to further improve heat transfer at the wall. This work used IR thermography and PIV (particle image velocimetry) measurements for optical diagnostics of wall temperature fields and velocity fields under conditions of flow rate disturbance control, including feedback from a local velocity sensor. It was found that low-amplitude sinusoidal disturbances increase the integral temperature on the wall due to the intensification of flow separation on the wall compared to an undisturbed jet. It has also been established that high-amplitude disturbances in the pulsating jet mode make it possible to reduce the integral temperature by increasing the average flow velocity near the wall and compensate for unwanted flow separation. The genetic programming algorithm made it possible to find a self-oscillating mode in jet disturbance with feedback, which improves local heat transfer on the wall no worse than in the case of forced periodic disturbance.</p>","PeriodicalId":44919,"journal":{"name":"Optoelectronics Instrumentation and Data Processing","volume":"27 1","pages":""},"PeriodicalIF":0.4,"publicationDate":"2024-03-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140072161","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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