Proceedings. DELTA 2004. Second IEEE International Workshop on Electronic Design, Test and Applications最新文献

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Biomedical intelligence security home network-ATM/IP CATV network 生物医学智能安全家庭网络- atm /IP CATV网络
R. Volner, L. Pousek
{"title":"Biomedical intelligence security home network-ATM/IP CATV network","authors":"R. Volner, L. Pousek","doi":"10.1109/DELTA.2004.10046","DOIUrl":"https://doi.org/10.1109/DELTA.2004.10046","url":null,"abstract":"The term security network intelligence is widely used in the field of communication security network. A number of new and potentially concepts and products based on the concept of security network intelligence have been introduced, including smart flows, intelligent routing, and intelligent web switching. Many intelligent systems focus on a specific security service, function, or device, and do not provide true end-to-end service network intelligence. True security network intelligence requires more than a set of disconnected elements, it requires an interconnecting and functionally coupled architecture that enables the various functional levels to interact and communicate with each other. The article describes information network and CATV applications, backbone network structure. Cable is a natural network for carrying high-capacity, bandwidth-intense information. In the age of analogue program signals, cable's capacity was a natural transmission media for broadcast colour TV and high-fidelity stereo sound programs. In the new digital program signal age, cable's high capacity is a natural network for carrying interactive computer-based, data-intensive multimedia programs.","PeriodicalId":444571,"journal":{"name":"Proceedings. DELTA 2004. Second IEEE International Workshop on Electronic Design, Test and Applications","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121218838","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Noise analysis of a reduced complexity pipeline analog-to-digital converter 一种低复杂度流水线模数转换器的噪声分析
H. Le, A. Zayegh, J. Singh
{"title":"Noise analysis of a reduced complexity pipeline analog-to-digital converter","authors":"H. Le, A. Zayegh, J. Singh","doi":"10.1109/DELTA.2004.10059","DOIUrl":"https://doi.org/10.1109/DELTA.2004.10059","url":null,"abstract":"This paper presents a mathematical analysis of the noise generated within a 12-bit reduced complexity pipeline analog-to-digital converter (ADC) to demonstrate the effect of noise on the device performance. A modified flash ADC was employed instead of the traditional full flash ADC to implement the sub-ADC in the proposed pipeline ADC to reduce the device complexity and attain lower system power consumption. The 12-bit pipeline ADC is operated at 400 MHz and generates total noise power of 3.38/spl times/10/sup -12//spl middot//spl Delta/f (V/sup 2/) at this frequency. The developed model provides a good estimation of the noise generated by the circuit and gives an accurate prediction on the circuit noise performance. Also, such model provides good guide for further improvement of the circuit performance.","PeriodicalId":444571,"journal":{"name":"Proceedings. DELTA 2004. Second IEEE International Workshop on Electronic Design, Test and Applications","volume":"101 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124711816","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
CMOS open fault detection by appearance time of switching supply current 利用开关电源电流出现时间检测CMOS断路故障
M. Hashizume, T. Akita, H. Yotsuyanagi, T. Tamesada
{"title":"CMOS open fault detection by appearance time of switching supply current","authors":"M. Hashizume, T. Akita, H. Yotsuyanagi, T. Tamesada","doi":"10.1109/DELTA.2004.10036","DOIUrl":"https://doi.org/10.1109/DELTA.2004.10036","url":null,"abstract":"In this paper, a new dynamic supply current test method is proposed for detecting open defects on signal lines in CMOS logic circuits. The method is based on the appearance time of dynamic supply current that flows when a test input vector is provided to a circuit under test. Also, we introduce our designed sensor circuit of the appearance time. Feasibility of tests based on the test method is examined by some experiments. The experimental results show that open defects on signal lines in CMOS logic circuits will be detected by the test method.","PeriodicalId":444571,"journal":{"name":"Proceedings. DELTA 2004. Second IEEE International Workshop on Electronic Design, Test and Applications","volume":"87 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124912257","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Frequency domain testing of general purpose processors at the instruction execution level 通用处理器指令执行层的频域测试
N. Venkateswaran, K. Bharath
{"title":"Frequency domain testing of general purpose processors at the instruction execution level","authors":"N. Venkateswaran, K. Bharath","doi":"10.1109/DELTA.2004.10065","DOIUrl":"https://doi.org/10.1109/DELTA.2004.10065","url":null,"abstract":"In this paper, we put forth a novel frequency domain BIST approach towards instruction execution level testing. This BIST scheme employs number theoretic transform to obtain the spectrum of the control sequences (generated by the processor control unit, the Finite State Machine) of the instructions during execution to detect stuck-at and transient faults and weak logic signals. The scheme involves four level logic to detect weak-0 and weak-1 logic signals. Weak signals lead to degradation of the noise margin, particularly in DSM technology based multi-GHz processors. This novel concept is verified by simulation using FSM benchmark circuits. The four level logic has been successfully simulated in Spice, and the results have been presented. Near 100% fault coverage has been achieved. The overall functioning of this test scheme to detect transient faults and signal integrity faults is also shown.","PeriodicalId":444571,"journal":{"name":"Proceedings. DELTA 2004. Second IEEE International Workshop on Electronic Design, Test and Applications","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123780106","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Practical fault coverage of supply current tests for bipolar ICs 双极集成电路电源电流测试的实际故障覆盖
I. Tsukimoto, M. Hashizume, H. Yotsuyanagi, T. Tamesada
{"title":"Practical fault coverage of supply current tests for bipolar ICs","authors":"I. Tsukimoto, M. Hashizume, H. Yotsuyanagi, T. Tamesada","doi":"10.1109/DELTA.2004.10035","DOIUrl":"https://doi.org/10.1109/DELTA.2004.10035","url":null,"abstract":"Bipolar logic circuits are indispensable for implementing high-speed logic circuits. Since quiescent supply current flows into the circuits without faults, they can not be tested by a conventional IDDQ test method. We proposed a quiescent supply current test method which is applicable for the bipolar circuit tests, and examined the testability of open faults under an ideal assumption that there are not any process variations. Actually, there are some variations in the quiescent supply current of each gate in implemented logic circuits. Thus, It is necessary to examine the practical testability of the test method before applying to production tests of bipolar logic ICs. In this paper, the practical testability obtained under an assumption that there are some unit-to-unit variations of supply current among gates is examined for ISCAS-85 benchmark circuits. The experimental results show that larger fault coverage can be obtained with a smaller number of test input vectors by our supply current test method than the functional test one based on stuck-at fault models.","PeriodicalId":444571,"journal":{"name":"Proceedings. DELTA 2004. Second IEEE International Workshop on Electronic Design, Test and Applications","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129626219","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Measurement and analysis of physical defects for dynamic supply current testing 动态电源电流测试中物理缺陷的测量和分析
S. Thomas, R. Makki, Sai Kishore Vavilala
{"title":"Measurement and analysis of physical defects for dynamic supply current testing","authors":"S. Thomas, R. Makki, Sai Kishore Vavilala","doi":"10.1109/DELTA.2004.10031","DOIUrl":"https://doi.org/10.1109/DELTA.2004.10031","url":null,"abstract":"We present an iDDT fault analysis study based on physical measurements of circuits with built-in defects. A variety of defects were inserted into basic circuit components. The measured results were utilized to better model the effect of defects on iDDT and improve simulated fault models.","PeriodicalId":444571,"journal":{"name":"Proceedings. DELTA 2004. Second IEEE International Workshop on Electronic Design, Test and Applications","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133975083","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
FPGA implementation of an OFDM-WLAN synchronizer OFDM-WLAN同步器的FPGA实现
K. Wang, J. Singh, M. Faulkner
{"title":"FPGA implementation of an OFDM-WLAN synchronizer","authors":"K. Wang, J. Singh, M. Faulkner","doi":"10.1109/DELTA.2004.10039","DOIUrl":"https://doi.org/10.1109/DELTA.2004.10039","url":null,"abstract":"In this paper, we present a timing and frequency synchronization scheme and its FPGA implementation for IEEE 802.11a WLAN systems. In the scheme, an efficient double auto-correlation method based on short training symbols is used for timing synchronization. The performance of the proposed method is comparable or even superior to that of the conventional timing synchronization method under multipath fading channels. By averaging the correlation over four short training symbols, the accuracy of frequency synchronization using short training symbols can be improved to a level that the fine frequency synchronization process using long training symbols in the conventional scheme would not be needed. Thus both timing and frequency synchronization can be achieved using short training symbols alone to reduce computational complexity and overhead. Furthermore, the hardware architecture of the proposed synchronization scheme is developed. The synchronizer is mainly made up of correlator, angle calculator and peak detector, which are implemented by an iterative process, a CORDIC circuit and a finite state machine, respectively. Such an architecture results in low implementation complexity and low computational latency.","PeriodicalId":444571,"journal":{"name":"Proceedings. DELTA 2004. Second IEEE International Workshop on Electronic Design, Test and Applications","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133043549","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 26
A power supply circuit recycling charge in adiabatic dynamic CMOS logic circuits 绝热动态CMOS逻辑电路中的电源电路回收电荷
Daisuke Ezaki, M. Hashizume, H. Yotsuyanagi, T. Tamesada
{"title":"A power supply circuit recycling charge in adiabatic dynamic CMOS logic circuits","authors":"Daisuke Ezaki, M. Hashizume, H. Yotsuyanagi, T. Tamesada","doi":"10.1109/DELTA.2004.10022","DOIUrl":"https://doi.org/10.1109/DELTA.2004.10022","url":null,"abstract":"In this paper, a power supply circuit is proposed for adiabatic dynamic CMOS logic circuit. Charge in load capacitors of gates can be recycled by using this power supply circuit. It leads to lower power consumption than without recycling. In this paper, source voltage of adiabatic dynamic CMOS inverter chain circuits is supplied with the circuit to evaluate the usefulness of the circuit. The results show that the circuits can work with smaller power consumption than without recycling.","PeriodicalId":444571,"journal":{"name":"Proceedings. DELTA 2004. Second IEEE International Workshop on Electronic Design, Test and Applications","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130045742","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Crosstalk fault tolerant processor architecture-a power aware design 串扰容错处理器架构——一种功率感知设计
N. Venkateswaran, V. Kumar, R. Raghavan, R. Srinivas, S. Subramanian, V. Balaji, V. Mahalingam, T. Rajaprabhu
{"title":"Crosstalk fault tolerant processor architecture-a power aware design","authors":"N. Venkateswaran, V. Kumar, R. Raghavan, R. Srinivas, S. Subramanian, V. Balaji, V. Mahalingam, T. Rajaprabhu","doi":"10.1109/DELTA.2004.10067","DOIUrl":"https://doi.org/10.1109/DELTA.2004.10067","url":null,"abstract":"The advent of DSM technology and multi-GHz operation of processors has increased the severity of cross-talk faults. Even with many preventive solutions like cross-talk driven routing, power supply shielding and intentional skewing; cross-talk faults cannot be completely avoided. In this paper we present an enhanced power aware fault tolerant pipelined architecture-xIDAC/E. In our earlier work-IDAC/E, compression and encoding were done on individual instructions whereas xIDAC/E operates on grouped instruction partitions. This offers higher compression efficiency due to repeatability and power reduction due to lesser memory accesses. Simulation results are provided with regard to instruction partitioning, their compression & encoding, and memory re-fetches. Analysis show this power reduction overcompensate the overheads due to partitioning, compression and encoding. The impact of encoding of address & data bus on fault tolerance and power is also provided.","PeriodicalId":444571,"journal":{"name":"Proceedings. DELTA 2004. Second IEEE International Workshop on Electronic Design, Test and Applications","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130172571","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Integrated MicroPhotonic wideband RF interference mitigation filter 集成微光子宽带射频干扰抑制滤波器
K. Alameh, A. Bouzerdoum, Selam T. Ahderom, Mehrdad Raisi, K. Eshraghian, X. Zhao, R. Zheng, Zhenglin Wang
{"title":"Integrated MicroPhotonic wideband RF interference mitigation filter","authors":"K. Alameh, A. Bouzerdoum, Selam T. Ahderom, Mehrdad Raisi, K. Eshraghian, X. Zhao, R. Zheng, Zhenglin Wang","doi":"10.1109/DELTA.2004.10029","DOIUrl":"https://doi.org/10.1109/DELTA.2004.10029","url":null,"abstract":"MicroPhotonic broadband RF signal processors utilize true-time-delay methods to perform processing functions that cannot be achieved by conventional electronic methods. In addition to their small physical size and immunity to EMI, Photonic signal processors offer the possibility of delaying broadband RF signals with almost no loss. In this paper, we present a novel MicroPhotonic structure that integrates a photoreceiver array, a Vertical Cavity Surface Emitting Laser (VCSEL) array, and a multi-cavity optical substrate to realize a low-cost adaptive wideband RF interference mitigation filter. Results show that for a 64-cavity MicroPhotonic structure, high-resolution, tunable interference mitigation filter with a shape factor as low as 2 and passband ripples less than 0.25 dB can be realised.","PeriodicalId":444571,"journal":{"name":"Proceedings. DELTA 2004. Second IEEE International Workshop on Electronic Design, Test and Applications","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116076034","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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