2012 17th IEEE European Test Symposium (ETS)最新文献_第6页

Cost and power efficient timing error tolerance in flip-flop based microprocessor cores 基于触发器的微处理器内核的低成本和低功耗时序容错

2012 17th IEEE European Test Symposium (ETS) Pub Date : 2012-05-28 DOI: 10.1109/ETS.2012.6233002

Stefanos Valadimas, Y. Tsiatouhas, A. Arapoyanni

引用次数: 14

Functional test generation for hard to detect stuck-at faults using RTL model checking 使用RTL模型检查生成难以检测的卡在故障的功能测试

2012 17th IEEE European Test Symposium (ETS) Pub Date : 2012-05-28 DOI: 10.1109/ETS.2012.6233016

M. Prabhu, J. Abraham

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引用次数: 11

OBT for settling error test of sampled-data systems using signal-dependent clocking 使用信号相关时钟对采样数据系统进行沉降误差测试的 OBT

2012 17th IEEE European Test Symposium (ETS) Pub Date : 2012-05-28 DOI: 10.1109/ETS.2012.6233013

Manuel J. Barragan Asian, G. Léger, J. Huertas

引用次数: 0

Test tool qualification through fault injection 通过故障注入对测试工具进行鉴定

2012 17th IEEE European Test Symposium (ETS) Pub Date : 2012-05-28 DOI: 10.1109/ETS.2012.6233042

Q. Wang, A. Wallin, V. Izosimov, Urban Ingelsson, Zebo Peng

引用次数: 4

Fault-Tolerant Algebraic Architecture for radiation induced soft-errors 辐射诱导软错误的容错代数体系结构

2012 17th IEEE European Test Symposium (ETS) Pub Date : 2012-05-28 DOI: 10.1109/ETS.2012.6233040

F. Itturriet, R. Ferreira, L. Carro

引用次数: 1

A robust metric for screening outliers from analogue product manufacturing tests responses 从模拟产品制造测试响应筛选异常值的稳健度量

2012 17th IEEE European Test Symposium (ETS) Pub Date : 2011-05-23 DOI: 10.1109/ETS.2011.31

Shaji Krishnan, H. Kerkhoff

引用次数: 3