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2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings最新文献

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On the use of spectral power ratios for partial discharge and noise separation in radiofrequency measurements 频谱功率比用于射频测量中的局部放电和噪声分离
2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings Pub Date : 2015-05-11 DOI: 10.1109/I2MTC.2015.7151556
J. Ardila-Rey, Ricardo Albarracín Sánchez, J. Martínez-Tarifa, G. Robles
{"title":"On the use of spectral power ratios for partial discharge and noise separation in radiofrequency measurements","authors":"J. Ardila-Rey, Ricardo Albarracín Sánchez, J. Martínez-Tarifa, G. Robles","doi":"10.1109/I2MTC.2015.7151556","DOIUrl":"https://doi.org/10.1109/I2MTC.2015.7151556","url":null,"abstract":"Partial discharge (PD) measurements are commonly used in the maintenance of high-voltage equipment. New research is being done devoted to the measurement of the phenomenon in radiofrequency (RF) because it has several advantages compared to other classical methods. However, noise rejection is still one of the main challenges to face. In this paper, a method based on the power spectral share in bands of frequency, already used in classical measurements, is applied to separate RF signals emitted by PD and noise.","PeriodicalId":424006,"journal":{"name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","volume":"76 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128884840","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Large Eddy Simulation and Hilbert Huang Transform for fluctuation pressure of high speed train 高速列车脉动压力的大涡模拟与Hilbert Huang变换
2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings Pub Date : 2015-05-11 DOI: 10.1109/I2MTC.2015.7151280
Yanan Wang, Chunjun Chen, Hongyang He
{"title":"Large Eddy Simulation and Hilbert Huang Transform for fluctuation pressure of high speed train","authors":"Yanan Wang, Chunjun Chen, Hongyang He","doi":"10.1109/I2MTC.2015.7151280","DOIUrl":"https://doi.org/10.1109/I2MTC.2015.7151280","url":null,"abstract":"Fluctuation pressure acting on the surface of high speed trains is the main source of aerodynamic noise. Therefore, it becomes very important to research components of the fluctuation pressure for controlling the aerodynamic noise. In this paper, Large Eddy Simulation (LES) method is applied to calculate the fluctuation pressure acting on a certain type of CRH high speed train and the distribution rule of the fluctuation pressure is studied by Hilbert Huang Transform (HHT) method. Both the fluctuating part and the average part from the surface pressure are extracted by Empirical Mode Decomposition (EMD). A comparison of the distribution rules for fluctuation pressure at two different speed levels is made.","PeriodicalId":424006,"journal":{"name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130171693","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
A low power multi-frequency current mode lock-in amplifier for impedance sensing 用于阻抗传感的低功率多频电流模式锁相放大器
2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings Pub Date : 2015-05-11 DOI: 10.1109/I2MTC.2015.7151317
Jinlong Gu, N. Mcfarlane
{"title":"A low power multi-frequency current mode lock-in amplifier for impedance sensing","authors":"Jinlong Gu, N. Mcfarlane","doi":"10.1109/I2MTC.2015.7151317","DOIUrl":"https://doi.org/10.1109/I2MTC.2015.7151317","url":null,"abstract":"We show the design of a low-power, multi-frequency on-chip current-mode lock-in amplifier for biomedical impedance sensing. This lock-in amplifier obtains the phase and magnitude of the input signals in analog domain and therefore does not require a digital signal processing module. It is composed of translinear bandpass filters, 4-quadrant subthreshold multipliers, translinear low pass filters, translinear pythagorators and dividers. Monte Carlo results show that 80% of the devices will perform according to specifications with a power consumption of 207.7 μW. Experimental results of the bandpass modules show the impedance spectrum can be determined at the 100 Hz, 1 kHz, 10 kHz and 100 kHz frequency points.","PeriodicalId":424006,"journal":{"name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132203121","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Dedicated hardware implementation of a high precision power quality meter 专用硬件实现的高精度电能质量仪表
2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings Pub Date : 2015-05-11 DOI: 10.1109/I2MTC.2015.7151300
V. V. D. Araujo, R. A. Hernandez, E. Simas, Amauri Oliveira, Wagner L. A. de Olivera
{"title":"Dedicated hardware implementation of a high precision power quality meter","authors":"V. V. D. Araujo, R. A. Hernandez, E. Simas, Amauri Oliveira, Wagner L. A. de Olivera","doi":"10.1109/I2MTC.2015.7151300","DOIUrl":"https://doi.org/10.1109/I2MTC.2015.7151300","url":null,"abstract":"Low power quality may cause serious problems in industrial, corporative and residential electrical networks. Among the most common problems one can mention the reduction of equipment lifetime, false activation of protection devices and electrical and thermal losses increase. Considering this, it is very important to monitor the power quality of a given facility. This paper describes the architecture of custom application-specific integrated circuit (ASIC) for power quality measurement. The digital signal processing measurements are based on IEC standards (61000-4-30, 61000-4-7, and 61000-4-15 class-A). The proposed Integrated Circuit (IC) supports poly-phase measuring for 7 channels with high precision estimation of parameters such as RMS value, crest factor, harmonics, interharmonics, total harmonics distortion, angle, unbalance, active power, apparent power, and instantaneous frequency. There is also a Real Time Clock (RTC) that enables system synchronization, predicted in the standards to perform phasor measurement. The main focus of this paper is describing the digital signal processing blocks of the proposed IC. The designed ASIC was produced using TowerJazz 180nm CMOS technology. Multiple clocks are used to reduce area (by optimizing single port memories), enable faster external communication, and reduce power consumption.","PeriodicalId":424006,"journal":{"name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130373766","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Stochastic color image segmentation using spatial constraints 基于空间约束的随机彩色图像分割
2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings Pub Date : 2015-05-11 DOI: 10.1109/I2MTC.2015.7151236
D. Vasquez, J. Scharcanski, A. Wong
{"title":"Stochastic color image segmentation using spatial constraints","authors":"D. Vasquez, J. Scharcanski, A. Wong","doi":"10.1109/I2MTC.2015.7151236","DOIUrl":"https://doi.org/10.1109/I2MTC.2015.7151236","url":null,"abstract":"This paper describes an automated method for segmenting color images based on a modified stochastic region merging strategy with multi-scale spatial constraints. First, a bilateral decomposition is performed, and an over-segmentation process is then performed based multichannel information and multi-scale gradients. Next, each sub-region is represented using a normalized color histogram in the CIE L*a*b* color space, and a region adjacency graph is constructed based on the over-segmentation results. Finally, a stochastic region merging strategy with spatial constraints is performed on the region adjacency graph to construct one segmentation map for each scale of representation. Our preliminary visual and quantitative experimental results on the Berkeley image database (BSDS500) are encouraging, and suggest that our proposed approach can provide accurate segmentation results.","PeriodicalId":424006,"journal":{"name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128850089","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A simple measuring system and calibration method to investigate light transmission ability of light-transmitting fiber posts 一种简单的测量系统和校准方法，用于研究光纤传输桩的透光能力
2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings Pub Date : 2015-05-11 DOI: 10.1109/I2MTC.2015.7151432
S. Cattini, L. Rovati
{"title":"A simple measuring system and calibration method to investigate light transmission ability of light-transmitting fiber posts","authors":"S. Cattini, L. Rovati","doi":"10.1109/I2MTC.2015.7151432","DOIUrl":"https://doi.org/10.1109/I2MTC.2015.7151432","url":null,"abstract":"Light-transmitting fiber posts are recognized to potentially improve the cements polymerization, thus potentially improving the bonding of the endodontics restoration. However, different posts generally have completely different light transmission, hence it is important to be able to compare their optical performances. In this paper a simple measuring system able to compare the exitance generate by different light-transmitting fiber posts is proposed. The described measuring system is based on a microscope and a digital camera coupled to its optics. A simplified calibration and a detailed measurement procedure are described and investigated. Then, data obtained from the analysis of some commercial light-transmitting fiber posts are reported and briefly discussed. Even though, mechanical properties, biocompatibility and aesthetics have to be taken into account once choosing the post, the data provided by the proposed measuring system may support in choosing the post and, defining the proper light-source power and exposure duration.","PeriodicalId":424006,"journal":{"name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","volume":"280 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126684736","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Laser diode for flow-measurement 用于流量测量的激光二极管
2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings Pub Date : 2015-05-11 DOI: 10.1109/I2MTC.2015.7151478
M. Norgia, A. Pesatori, S. Donati
{"title":"Laser diode for flow-measurement","authors":"M. Norgia, A. Pesatori, S. Donati","doi":"10.1109/I2MTC.2015.7151478","DOIUrl":"https://doi.org/10.1109/I2MTC.2015.7151478","url":null,"abstract":"A simple laser diode, without lenses, is demonstrated as a flow sensor. The diode is placed directly on the edge of the duct, exploiting the natural laser divergence. The flow-measurement is based on the Doppler shift induced by the scattering particles inside the fluid, read by the self-mixing effect inside the laser diode. The proposed approach was modeled by a numerical simulation, in order to find the best signal processing algorithm. Finally, a set of measurements have confirmed the sensor performances as flow-meter.","PeriodicalId":424006,"journal":{"name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126505338","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
A low-cost instrument for the accurate measurement of Whispering-Gallery resonances up to 19 GHz 一种低成本的仪器，用于精确测量高达19 GHz的耳语廊共振
2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings Pub Date : 2015-05-11 DOI: 10.1109/I2MTC.2015.7151386
S. Corbellini, C. Ramella, M. Pirola, V. Fernicola
{"title":"A low-cost instrument for the accurate measurement of Whispering-Gallery resonances up to 19 GHz","authors":"S. Corbellini, C. Ramella, M. Pirola, V. Fernicola","doi":"10.1109/I2MTC.2015.7151386","DOIUrl":"https://doi.org/10.1109/I2MTC.2015.7151386","url":null,"abstract":"The main current limit to the application of Sapphire Whispering Gallery Thermometry (SWGT) as transfer temperature standard in industry is represented by the cost and bulkiness of the Vector Network Analyzer (VNA) required to investigate the resonances of interest. In this work we present a low-cost measurement system for the accurate detection of complex resonance frequencies up to 19 GHz, aimed at replacing the use of a VNA in those field applications where portability and cost-saving are crucial requirements. The system includes a low cost GPS-based solution to obtain the needed accurate and stable frequency reference. The proposed equipment has been tested on a SWGT and successfully validated comparing the results obtained with a state-of-the-art laboratory set-up comprising a wideband VNA and a rubidium frequency standard. Results obtained demonstrated the potential of the system to replace VNAs in SWGT applications.","PeriodicalId":424006,"journal":{"name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126580211","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Evaluation of thermal patterns and distribution applied to the study of diabetic foot 热模式和分布的评价应用于糖尿病足的研究
2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings Pub Date : 2015-05-11 DOI: 10.1109/I2MTC.2015.7151315
D. Hernandez-Contreras, H. Peregrina-Barreto, J. Rangel-Magdaleno, J. Ramírez-Cortés, F. Renero-Carrillo, J. Aviña-Cervantes
{"title":"Evaluation of thermal patterns and distribution applied to the study of diabetic foot","authors":"D. Hernandez-Contreras, H. Peregrina-Barreto, J. Rangel-Magdaleno, J. Ramírez-Cortés, F. Renero-Carrillo, J. Aviña-Cervantes","doi":"10.1109/I2MTC.2015.7151315","DOIUrl":"https://doi.org/10.1109/I2MTC.2015.7151315","url":null,"abstract":"Early detection of symptoms related to ulceration risk in patients with diabetes mellitus can prevent future complications. In recent years thermography has been a response to this problem. Thermography is presented as a rapid, non-invasive and non-contact technique for detecting potential temperature patterns that may have complications in the future. This paper presents a preliminary classification method to detect temperature patterns which could be related with high-risk patients. This methodology is based on thermal image processing, beginning with the isolation of areas with higher temperature, followed by an analysis of these areas that allow its classification.","PeriodicalId":424006,"journal":{"name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116053102","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Development of Superconducting Tunnel Junction detectors as a far-infrared photon-by-photon spectrometer for neutrino decay search 用于中微子衰变搜索的远红外光子-光子光谱仪超导隧道结探测器的研制
2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings Pub Date : 2015-05-11 DOI: 10.1109/I2MTC.2015.7151327
Y. Takeuchi, S. Kim, K. Takemasa, K. Kiuchi, K. Nagata, K. Kasahara, T. Okudaira, Tatsuya Ichimura, Masahiro Kanamaru, Kouya Moriuchi, Ren Senzaki, S. Yagi, H. Ikeda, S. Matsuura, T. Wada, Takuo Yoshida, S. Komura, Keisuke Orikasa, Ryuta Hirose, Y. Kato, M. Hazumi, Y. Arai, S. Shiki, M. Ukibe, G. Fujii, T. Adachi, M. Ohkubo, E. Ramberg, Jonghee Yoo, M. Kozlovsky, P. Rubinov, D. Sergatskov, H. Ishino, A. Kibayashi, S. Mima, Soo-Bong Kim
{"title":"Development of Superconducting Tunnel Junction detectors as a far-infrared photon-by-photon spectrometer for neutrino decay search","authors":"Y. Takeuchi, S. Kim, K. Takemasa, K. Kiuchi, K. Nagata, K. Kasahara, T. Okudaira, Tatsuya Ichimura, Masahiro Kanamaru, Kouya Moriuchi, Ren Senzaki, S. Yagi, H. Ikeda, S. Matsuura, T. Wada, Takuo Yoshida, S. Komura, Keisuke Orikasa, Ryuta Hirose, Y. Kato, M. Hazumi, Y. Arai, S. Shiki, M. Ukibe, G. Fujii, T. Adachi, M. Ohkubo, E. Ramberg, Jonghee Yoo, M. Kozlovsky, P. Rubinov, D. Sergatskov, H. Ishino, A. Kibayashi, S. Mima, Soo-Bong Kim","doi":"10.1109/I2MTC.2015.7151327","DOIUrl":"https://doi.org/10.1109/I2MTC.2015.7151327","url":null,"abstract":"We present the development of Superconducting Tunnel Junction (STJ) detectors as a far-infrared single photon spectrometer, which is motivated for an application to a search for the radiative decay of the cosmic neutrino background (CνB). The photon energy spectrum from the radiative decays of CνB is expected to have a sharp edge at high energy end in a far-infrared region ranging from 14 meV to 25 meV (from 50 μm to 90 μm in wavelength) in the cosmic infrared background and the overwhelming infrared foreground from the zodiacal emission. Thus, the detector is required photon-by-photon detection with sufficiently high energy resolution, in order to gain the best signal-to-noise ratio as well as to identify the edge structure. The following two types of photon detectors are under consideration: an array of niobium/aluminum STJ (Nb/Al-STJ) pixels with a diffraction grating, and STJ using hafnium (Hf-STJ). Each Nb/Al-STJ pixel is required to be capable of detecting single photons in the far-infrared region, and the pixel array measures the photon wavelength spectrum which the diffraction grating creates. Hf-STJ is expected to achieve 2% energy resolution for single photon of 25 meV due to very small gap energy of hafnium.","PeriodicalId":424006,"journal":{"name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","volume":"329 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122743211","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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