Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611)最新文献_第9页

Dynamic logic styles with improved noise-immunity 具有改进的抗噪性的动态逻辑样式

Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611) Pub Date : 2002-08-07 DOI: 10.1109/ICCDCS.2002.1004019

F. Mendoza-Hernandez, M. Linarea, V. Champac

引用次数: 0

Characterisation of microcontroller susceptibility to radio frequency interference 微控制器对射频干扰敏感性的表征

Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611) Pub Date : 2002-08-07 DOI: 10.1109/ICCDCS.2002.1004088

S. Baffreau, S. Bendhia, M. Ramdani, E. Sicard

引用次数: 23

Circuital modeling from electronic devices to oil production 从电子设备到石油生产的电路建模

Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611) Pub Date : 2002-08-07 DOI: 10.1109/ICCDCS.2002.1004085

R. Callarotti

引用次数: 0

Very low photo-CVD deposition rate process for high quality thin SiO/sub 2/ films 高质量SiO/ sub2 /薄膜的极低光- cvd沉积速率工艺

Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611) Pub Date : 2002-08-07 DOI: 10.1109/ICCDCS.2002.1004067

V.M. Sanchez-Z, J. Munguía, M. Estrada

引用次数: 0

Remote laboratory experiments in electrical engineering education 电子工程教学中的远程实验室实验

Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611) Pub Date : 2002-08-07 DOI: 10.1109/ICCDCS.2002.1004082

I. Gustavsson

{"title":"Remote laboratory experiments in electrical engineering education","authors":"I. Gustavsson","doi":"10.1109/ICCDCS.2002.1004082","DOIUrl":"https://doi.org/10.1109/ICCDCS.2002.1004082","url":null,"abstract":"A remote or online laboratory is a laboratory where one can access experiments and instruments or other equipment from outside over the Internet. Laboratories for undergraduate education or vocational training in basic electrical engineering are easy to control remotely. One cannot see or hear the electrical current, so there is no need for sound or video transmission. Computer-based instruments do not have any control buttons or displays on the front panel. They have virtual front panels on the host computer only and those panels can be moved to a remote computer screen. However, the manual forming of circuits and connecting of test probes cannot be transferred. These actions must be performed in another way in a remote laboratory. Remotely controllable switch matrices must be used. In the remote laboratory at BTH (Blekinge Institute of Technology) a client/server architecture is used. The student makes all the settings wanted on the client computer and then sends them to a lab server. The server makes measurements requested and returns the data obtained. The whole procedure takes only a second or two. A number of clients can access the experiments simultaneously. The laboratory is used in ordinary courses for on-campus students. They access the laboratory from a computer hall or from elsewhere outside the university. Due to the low number of bytes transferred, a 56 kbit modem is sufficient.","PeriodicalId":416680,"journal":{"name":"Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127755534","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 62

Computing symbolic transfer functions of analog circuits by applying pure nodal analysis 应用纯节点分析计算模拟电路的符号传递函数

Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611) Pub Date : 2002-08-07 DOI: 10.1109/ICCDCS.2002.1004007

T. Esteban, Cid-Monjaraz Jaime

引用次数: 4

Analysis of pattern dependencies on copper damascene chemical mechanical polishing 铜大马士革化学机械抛光的图案依赖性分析

Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611) Pub Date : 2002-08-07 DOI: 10.1109/ICCDCS.2002.1004047

Serita Narinesingh, J. Leffew, W. Moreno

{"title":"Analysis of pattern dependencies on copper damascene chemical mechanical polishing","authors":"Serita Narinesingh, J. Leffew, W. Moreno","doi":"10.1109/ICCDCS.2002.1004047","DOIUrl":"https://doi.org/10.1109/ICCDCS.2002.1004047","url":null,"abstract":"The drawbacks in using CMP on copper are well know but currently misunderstood. The purpose of this research project was to achieve a concise understanding of copper CMP issues particularly associated with pattern, surface topography and its dependencies. With the use of Lucent Technologies Bell Labs CMP tools and wafers deposited with copper and TEOS, profilometry measurements were made. These wafers had arrays of lines with varying pitch where density was kept constant. The study used a special test mask with a unique set of structures to determine the effects of pitch features. The interaction of these layout effects was carefully analyzed using polish data taken with small time-steps to capture the transition of the polish characteristics before and after the barrier was exposed. Using the data gathered from the tests on these wafers, an analysis of the copper CMP dependence on wafer pattern variations, such as pitch, was performed. The key issues, dishing and erosion, were then determined and addressed. A recommendation for better feature sizes based on certain trends for minimal erosion and dishing was developed. It was found that erosion had very little dependence on pitch variation. Dishing increased with pitch and copper line width.","PeriodicalId":416680,"journal":{"name":"Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130993540","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

MEMS devices for the future wireless applications 用于未来无线应用的MEMS器件

Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611) Pub Date : 2002-08-07 DOI: 10.1109/ICCDCS.2002.1004045

K. Grenier, D. Dubuc, L. Rabbia, A. Tackac, P. Pons, T. Parra, P. Caudriller, H. Aubert

引用次数: 4

Optimum design of device/circuit cooperative schemes for ultra-low power applications 超低功耗应用中器件/电路协同方案的优化设计

Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611) Pub Date : 2002-08-07 DOI: 10.1109/ICCDCS.2002.1004066

T. Hiramoto

引用次数: 0

On chip measurement of I/sub C/(V/sub BE/) characteristics for high accuracy bandgap applications 片上测量I/sub C/(V/sub BE/)特性，用于高精度带隙应用

Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611) Pub Date : 2002-08-07 DOI: 10.1109/ICCDCS.2002.1004037

W. Rahajandraibe, C. Dufaza, D. Auvergne, B. Cialdella, B. Majoux, V. Chowdhury

引用次数: 0