2008 45th ACM/IEEE Design Automation Conference最新文献_第6页

IntellBatt: Towards smarter battery design 智能电池:迈向更智能的电池设计

2008 45th ACM/IEEE Design Automation Conference Pub Date : 2008-06-08 DOI: 10.1145/1391469.1391690

Sumana Mandal, Praveen Bhojwani, S. Mohanty, R. Mahapatra

{"title":"IntellBatt: Towards smarter battery design","authors":"Sumana Mandal, Praveen Bhojwani, S. Mohanty, R. Mahapatra","doi":"10.1145/1391469.1391690","DOIUrl":"https://doi.org/10.1145/1391469.1391690","url":null,"abstract":"Battery lifetime and safety are primary concerns in the design of battery operated systems. Lifetime management is typically supervised by the system via battery-aware task scheduling, while safety is managed on the battery side via features deployed into smart batteries. This research proposes IntellBatt; an intelligent battery cell array based novel design of a multi-cell battery that offloads battery lifetime management onto the battery. By deploying a battery cell array management unit, IntellBatt exploits various battery related characteristics such as charge recovery effect, to enhance battery lifetime and ensure safe operation. This is achieved by using real-time cell status information to selects cells to deliver the required load current, without the involvement of a complex task scheduler on the host system. The proposed design was evaluated via simulation using accurate cell models and real experimental traces from a portable DVD player. The use of a multi-cell design enhanced battery lifetime by 22% in terms of battery discharge time. Besides a standalone deployment, IntellBatt can also be combined with existing battery-aware task scheduling approaches to further enhance battery lifetime.","PeriodicalId":412696,"journal":{"name":"2008 45th ACM/IEEE Design Automation Conference","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127765884","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 39

Towards acceleration of fault simulation using Graphics Processing Units 用图形处理单元加速故障仿真

2008 45th ACM/IEEE Design Automation Conference Pub Date : 2008-06-08 DOI: 10.1145/1391469.1391679

Kanupriya Gulati, S. Khatri

{"title":"Towards acceleration of fault simulation using Graphics Processing Units","authors":"Kanupriya Gulati, S. Khatri","doi":"10.1145/1391469.1391679","DOIUrl":"https://doi.org/10.1145/1391469.1391679","url":null,"abstract":"In this paper, we explore the implementation of fault simulation on a graphics processing unit (GPU). In particular, we implement a fault simulator that exploits thread level parallelism. Fault simulation is inherently parallelizable, and the large number of threads that can be computed in parallel on a GPU results in a natural fit for the problem of fault simulation. Our implementation fault- simulates all the gates in a particular level of a circuit, including good and faulty circuit simulations, for all patterns, in parallel. Since GPUs have an extremely large memory bandwidth, we implement each of our fault simulation threads (which execute in parallel with no data dependencies) using memory lookup. Fault injection is also done along with gate evaluation, with each thread using a different fault injection mask. All threads compute identical instructions, but on different data, as required by the Single Instruction Multiple Data (SIMD) programming semantics of the GPU. Our results, implemented on a NVIDIA GeForce GTX 8800 GPU card, indicate that our approach is on average 35 x faster when compared to a commercial fault simulation engine. With the recently announced Tesla GPU servers housing up to eight GPUs, our approach would be potentially 238 times faster. The correctness of the GPU based fault simulator has been verified by comparing its result with a CPU based fault simulator.","PeriodicalId":412696,"journal":{"name":"2008 45th ACM/IEEE Design Automation Conference","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127305814","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 106

Strategies for mainstream usage of formal verification 形式验证的主流使用策略

2008 45th ACM/IEEE Design Automation Conference Pub Date : 2008-06-08 DOI: 10.1145/1391469.1391674

Raj S. Mitra

引用次数: 10

Parameterized timing analysis with general delay models and arbitrary variation sources 一般时滞模型和任意变分源的参数化时序分析

2008 45th ACM/IEEE Design Automation Conference Pub Date : 2008-06-08 DOI: 10.1145/1391469.1391576

K. R. Heloue, F. Najm

{"title":"Parameterized timing analysis with general delay models and arbitrary variation sources","authors":"K. R. Heloue, F. Najm","doi":"10.1145/1391469.1391576","DOIUrl":"https://doi.org/10.1145/1391469.1391576","url":null,"abstract":"Many recent techniques for timing analysis under variability, in which delay is an explicit function of underlying parameters, may be described as parameterized timing analysis. The \"max\" operator, used repeatedly during block-based timing analysis, causes several complications during parameterized timing analysis. We introduce bounds on, and an approximation to, the max operator which allow us to develop an accurate, general, and efficient approach to parameterized timing, which can handle either uncertain or random variations. Applied to random variations, the approach is competitive with existing statistical static timing analysis (SSTA) techniques, in that it allows for nonlinear delay models and arbitrary distributions. Applied to uncertain variations, the method is competitive with existing multi-corner STA techniques, in that it more reliably reproduces overall circuit sensitivity to variations. Crucially, this technique can also be applied to the mixed case where both random and uncertain variations are considered. Our results show that, on average, circuit delay is predicted with less than 2% error for multi-corner analysis, and less than 1% error for SSTA.","PeriodicalId":412696,"journal":{"name":"2008 45th ACM/IEEE Design Automation Conference","volume":"226 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130721862","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 10

Bi-decomposing large Boolean functions via interpolation and satisfiability solving 基于插值和可满足性求解的大布尔函数双分解

2008 45th ACM/IEEE Design Automation Conference Pub Date : 2008-06-08 DOI: 10.1145/1391469.1391634

Ruei-Rung Lee, J. H. Jiang, W. Hung

{"title":"Bi-decomposing large Boolean functions via interpolation and satisfiability solving","authors":"Ruei-Rung Lee, J. H. Jiang, W. Hung","doi":"10.1145/1391469.1391634","DOIUrl":"https://doi.org/10.1145/1391469.1391634","url":null,"abstract":"Boolean function bi-decomposition is a fundamental operation in logic synthesis. A function f(X) is bi-decomposable under a variable partition XA, XB, XC on X if it can be written as h(fA(XA, XC), fB(XB, XC)) for some functions h, Ja, and /#. The quality of a bi-decomposition is mainly determined by its variable partition. A preferred decomposition is disjoint, i.e. XC = Oslash, and balanced, i.e. |XA| ap |XB|. Finding such a good decomposition reduces communication and circuit complexity, and yields simple physical design solutions. Prior BDD-based methods may not be scalable to decompose large functions due to the memory explosion problem. Also as decomposability is checked under a fixed variable partition, searching a good or feasible partition may run through costly enumeration that requires separate and independent decomposability checkings. This paper proposes a solution to these difficulties using interpolation and incremental SAT solving. Preliminary experimental results show that the capacity of bi-decomposition can be scaled up substantially to handle large designs.","PeriodicalId":412696,"journal":{"name":"2008 45th ACM/IEEE Design Automation Conference","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116580690","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 39

Specify-Explore-Refine (SER): From specification to implementation 指定-探索-改进(SER):从规范到实现

2008 45th ACM/IEEE Design Automation Conference Pub Date : 2008-06-08 DOI: 10.1145/1391469.1391617

A. Gerstlauer, J. Peng, Dongwan Shin, D. Gajski, Atsushi Nakamura, Dai Araki, Yuuji Nishihara

{"title":"Specify-Explore-Refine (SER): From specification to implementation","authors":"A. Gerstlauer, J. Peng, Dongwan Shin, D. Gajski, Atsushi Nakamura, Dai Araki, Yuuji Nishihara","doi":"10.1145/1391469.1391617","DOIUrl":"https://doi.org/10.1145/1391469.1391617","url":null,"abstract":"Driven by increasing complexity and reliability demands, the Japanese Aerospace Exploration Agency (JAXA) in 2004 commissioned development of ELEGANT, a complete SpecC-based environment for electronic system-level (ESL) design of space and satellite electronics. As integral part of ELEGANT, the Center for Embedded Computer System (CECS) has developed and supplied the SER tool set. Following a Specify-Explore-Refine methodology, SER supports system-level design space exploration, interactive platform development and automatic model refinement and model generation. The SER engine has been successfully integrated into ELEGANT. With SER at its core, ELEGANT provides a seamless tool chain for modeling verification and synthesis from top-level specification down to embedded HW/SW implementation. ELEGANT and SER have been successfully delivered to JAXA and its suppliers. Tools are currently being deployed in companies like NEC Toshiba Space Systems. Evaluation results prove the feasibility of the approach for design space exploration, rapid virtual prototyping and system synthesis resulting in tremendous productivity and reliability gains. In addition, ELEGANT has been commercialized for general market availability. The SER component has been licensed to InterDesign Technologies, Inc. (IDT) and it is available from, sold and supported by IDT.","PeriodicalId":412696,"journal":{"name":"2008 45th ACM/IEEE Design Automation Conference","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132551938","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 21

Automated design of tunable impedance matching networks for reconfigurable wireless applications 可调阻抗匹配网络的自动化设计，用于可重构的无线应用

2008 45th ACM/IEEE Design Automation Conference Pub Date : 2008-06-08 DOI: 10.1145/1391469.1391596

A. Nieuwoudt, J. Kawa, Y. Massoud

引用次数: 5

Transistor level gate modeling for accurate and fast timing, noise, and power analysis 晶体管级栅极建模的准确和快速的定时，噪声和功率分析

2008 45th ACM/IEEE Design Automation Conference Pub Date : 2008-06-08 DOI: 10.1145/1391469.1391588

S. Raja, F. Varadi, M. Becer, J. Geada

{"title":"Transistor level gate modeling for accurate and fast timing, noise, and power analysis","authors":"S. Raja, F. Varadi, M. Becer, J. Geada","doi":"10.1145/1391469.1391588","DOIUrl":"https://doi.org/10.1145/1391469.1391588","url":null,"abstract":"Current source based cell models are becoming a necessity for accurate timing and noise analysis at 65 nm and below. Voltage waveform shapes are increasingly more difficult to represent as simple ramps due to highly resistive interconnects and Miller cap effects at receiver gates. Propagation of complex voltage waveforms, and accurate modeling of nonlinear driver and receiver effects in crosstalk noise analysis require accurate cell models. A good cell model should be independent of input waveform and output load, should be easy to characterize and should not increase the complexity of a cell library with high-dimensional look-up tables. At the same time, it should provide high accuracy compared to SPICE for all analysis scenarios including multiple-input switching, and for all cell types and cell arcs, including those with high stacks. It should also be easily extendable for use in statistical STA and noise analysis, and one should be able to simulate it fast enough for practical use in multi-million gate designs. In this paper, we present a gate model built from fast transistor models (FXM) that has all the desired properties. Along with this model, we also present a multithreaded timing traversal approach that allows one to take advantage of the high accuracy provided by the FXM, at traditional STA speeds. Results are presented using a fully extracted 65 nm TSMC technology.","PeriodicalId":412696,"journal":{"name":"2008 45th ACM/IEEE Design Automation Conference","volume":"64 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127673231","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 40

Efficient algorithm for the computation of on-chip capacitance sensitivities with respect to a large set of parameters 考虑大量参数的片上电容灵敏度的有效计算算法

2008 45th ACM/IEEE Design Automation Conference Pub Date : 2008-06-08 DOI: 10.1145/1391469.1391699

T. El-Moselhy, I. Elfadel, D. Widiger

{"title":"Efficient algorithm for the computation of on-chip capacitance sensitivities with respect to a large set of parameters","authors":"T. El-Moselhy, I. Elfadel, D. Widiger","doi":"10.1145/1391469.1391699","DOIUrl":"https://doi.org/10.1145/1391469.1391699","url":null,"abstract":"Recent CAD methodologies of design-for-manufacturability (DFM) have naturally led to a significant increase in the number of process and layout parameters that have to be taken into account in design-rule checking. Methodological consistency requires that a similar number of parameters be taken into account during layout parasitic extraction. Because of the inherent variability of these parameters, the issue of efficiently extracting deterministic parasitic sensitivities with respect to such a large number of parameters must be addressed. In this paper, we tackle this very issue in the context of capacitance sensitivity extraction. In particular, we show how the adjoint sensitivity method can be efficiently integrated within a finite-difference (FD) scheme to compute the sensitivity of the capacitance with respect to a large set of BEOL parameters. If np is the number of parameters, the speedup of the adjoint method is shown to be a factor of np/2 with respect to direct FD sensitivity techniques. The proposed method has been implemented and verified on a 65 nm BEOL cross section having 10 metal layers and a total number of 59 parameters. Because of its speed, the method can be advantageously used to prune out of the CAD flow those BEOL parameters that yield a capacitance sensitivity less than a given threshold.","PeriodicalId":412696,"journal":{"name":"2008 45th ACM/IEEE Design Automation Conference","volume":"1993 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128619858","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 9

On reliable modular testing with vulnerable test access mechanisms 基于脆弱测试访问机制的可靠模块化测试研究

2008 45th ACM/IEEE Design Automation Conference Pub Date : 2008-06-08 DOI: 10.1145/1391469.1391681

Lin Huang, F. Yuan, Q. Xu

{"title":"On reliable modular testing with vulnerable test access mechanisms","authors":"Lin Huang, F. Yuan, Q. Xu","doi":"10.1145/1391469.1391681","DOIUrl":"https://doi.org/10.1145/1391469.1391681","url":null,"abstract":"In modular testing of system-on-a-chip (SoC), test access mechanisms (TAMs) are used to transport test data between the input/output pins of the SoC and the cores under test. Prior work assumes TAMs to be error-free during test data transfer. The validity of this assumption, however, is questionable with the ever-decreasing feature size of today's VLSI technology and the ever-increasing circuit operational frequency. In particular, when functional interconnects such as network-on-chip (NoC) are reused as TAMs, even if they have passed manufacturing test beforehand, failures caused by electrical noise such as crosstalk and transient errors may happen during test data transfer and make good chips appear to be defective, thus leading to undesired test yield loss. To address the above problem, in this paper, we propose novel solutions that are able to achieve reliable modular testing even if test data may sometimes get corrupted during transmission with vulnerable TAMs, by designing a new \"jitter-aware\" test wrapper and a new \"jitter-transparent\" ATE interface. Experimental results on an industrial circuit demonstrate the effectiveness of the proposed technique.","PeriodicalId":412696,"journal":{"name":"2008 45th ACM/IEEE Design Automation Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128690533","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2