发布求助
文献互助 智能选刊 最新文献

7th IEEE Conference on Instrumentation and Measurement Technology最新文献

筛选
英文 中文
Computer-aided design of induction watthour meter 感应式电能表的计算机辅助设计
7th IEEE Conference on Instrumentation and Measurement Technology Pub Date : 1990-02-13 DOI: 10.1109/IMTC.1990.65957
Keren Ban
{"title":"Computer-aided design of induction watthour meter","authors":"Keren Ban","doi":"10.1109/IMTC.1990.65957","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65957","url":null,"abstract":"The author describes a newly established precise mathematical model and CAD (computer-aided design) algorithms for a high-overload induction watthour meter (the software package is called WATTCAD). The problem of computing the dynamic induced magnetic and electric systems of the watthour meter is solved in WATTCAD with three new nonlinear equivalent circuits. The Monte Carlo method for tolerance analysis and an optimization technique have been programmed and improved for meter design. The user interface to WATTCAD was simplified and the amount of data to be entered minimized. The improved linear interpolation and secant algorithms are programmed for solving nonlinear equations of complex matrices which are used to describe the inductive electromagnetic phenomenon. As an example, the use of WATTCAD to design a new model watthour meter DD285 is discussed.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122195697","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Broadband analog performance of laser diodes 激光二极管的宽带模拟性能
7th IEEE Conference on Instrumentation and Measurement Technology Pub Date : 1990-02-13 DOI: 10.1109/IMTC.1990.66034
Y. Trisno, H. Achor
{"title":"Broadband analog performance of laser diodes","authors":"Y. Trisno, H. Achor","doi":"10.1109/IMTC.1990.66034","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66034","url":null,"abstract":"The performance characteristics of semiconductor laser diodes for wideband analog transmission have been investigated. The distortion characteristics of such devices were determined by measurement of the laser's light-current transfer characteristic and also by means of multicarrier harmonic distortion measurements. The noise characteristics were determined by measurement of the laser's relative intensity noise. The performance of these devices at the system level was demonstrated by measuring the noise and distortion characteristics after transmission through optical fiber. The measurements indicate that distributed-feedback semiconductor lasers are viable candidates for deployment as sources for broadband analog transmission in fiber-optic transmission systems.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116077296","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Optimal FIR and IIR Hilbert transformer design via LS and minimax fitting 通过LS和极大极小拟合优化FIR和IIR希尔伯特变压器设计
7th IEEE Conference on Instrumentation and Measurement Technology Pub Date : 1990-02-13 DOI: 10.1109/IMTC.1990.66007
I. Kollár, R. Pintelon, J. Schoukens
{"title":"Optimal FIR and IIR Hilbert transformer design via LS and minimax fitting","authors":"I. Kollár, R. Pintelon, J. Schoukens","doi":"10.1109/IMTC.1990.66007","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66007","url":null,"abstract":"A novel method for the design of digital finite impulse response (FIR) and infinite impulse response (IIR) Hilbert transformers using the least squares (LS) and the minimax criteria is presented. The LS approximation is performed in the complex domain. Also presented is an iterative extension of the algorithm, which results in a minimax (Chebyshev) approximation, also in the complex domain. For FIR filters the results are the same as those of the optimal methods known from the literature. For the same task, stable IIR filters have also been successfully designed. The procedures proposed are usable for the design of digital filters other than Hilbert transformers, since the desired frequency response can be given point by point.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132580285","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 42
Digital spectra of non-uniformly sampled signals: theories and applications. IV. Measuring clock/aperture jitter of an A/D system 非均匀采样信号的数字频谱:理论与应用。测量A/D系统的时钟/孔径抖动
7th IEEE Conference on Instrumentation and Measurement Technology Pub Date : 1990-02-13 DOI: 10.1109/IMTC.1990.65986
Y. Jenq
{"title":"Digital spectra of non-uniformly sampled signals: theories and applications. IV. Measuring clock/aperture jitter of an A/D system","authors":"Y. Jenq","doi":"10.1109/IMTC.1990.65986","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65986","url":null,"abstract":"A method, based on asynchronous spectral averaging, to measure the standard deviation of a clock/aperture jitter of an A/D (analog-to-digital) system is proposed. A sine wave with frequency f/sub 0/ is used as an input test signal to a B-bit A/D system. Spectral averaging is then performed on many asynchronously acquired data records with length N. The jitter standard deviation can then be calculated from the measured signal-to-noise floor ratio. An expression which relates the signal-to-noise floor ratio to the standard deviation of the jitter is derived in a closed form. Simulation results are also presented and are shown to be in very good agreement with the theoretical results.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"289 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133598602","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 34
Software calibration: a view on a linear deviation concept 软件校准:对线性偏差概念的看法
7th IEEE Conference on Instrumentation and Measurement Technology Pub Date : 1990-02-13 DOI: 10.1109/IMTC.1990.65971
F. Gueuning, P. Bernard, C. Eugène
{"title":"Software calibration: a view on a linear deviation concept","authors":"F. Gueuning, P. Bernard, C. Eugène","doi":"10.1109/IMTC.1990.65971","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65971","url":null,"abstract":"The development of a specialized circuit for measurement and recording (essentially a microcontroller with a masked ROM containing a specialized program) is described. The software calibration method is based on the assumption of a linear deviation from the nominal law. The purpose of this approach is to offer for loggers an architecture as universal as possible and also to simplify the task of the designer in charge of a new development. The example of a temperature and humidity recorder illustrates the features and limitations of the method, as well as some precautions to be taken. The work considered was carried out in the framework of a large project devoted to the design optimization of portable, autonomous micro-data-loggers recording various physical parameters.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134138172","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Additional information from flowmeters via signal analysis 通过信号分析从流量计获得的附加信息
7th IEEE Conference on Instrumentation and Measurement Technology Pub Date : 1990-02-13 DOI: 10.1109/IMTC.1990.65994
J. Amadi-Echendu, E. Higham
{"title":"Additional information from flowmeters via signal analysis","authors":"J. Amadi-Echendu, E. Higham","doi":"10.1109/IMTC.1990.65994","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65994","url":null,"abstract":"The need to enhance the performance of process instrumentation systems by applying modern signal processing techniques has been identified as one of the priority areas for research and development in process instrumentation and process control. It is pointed out that this performance enhancement can be in the form of extracting additional information from flow sensors beyond the customary requirements of the basic process measurement, that is, flow rate. In conjunction with, and within the expert systems approach, an enhanced flowmeter can be utilized for condition monitoring purposes, and for diagnostic engineering management and optimization of process plant operations. The authors demonstrate the new importance of flow measurement signals from the point of view of extracting additional information, which is used to characterize the operational status of a turbine flow meter installed in a plant. The signal processing method is based on the system identification and parametric modelling approach. Qualitative signatures which have been identified for the turbine flow measurement system have also been related to the condition of the process plant.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"140 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131493181","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Application and operation of a superconducting sampler based instrumentation system 基于超导采样器的仪器系统的应用与运行
7th IEEE Conference on Instrumentation and Measurement Technology Pub Date : 1990-02-13 DOI: 10.1109/IMTC.1990.66012
E. Hanson, Z. Shen
{"title":"Application and operation of a superconducting sampler based instrumentation system","authors":"E. Hanson, Z. Shen","doi":"10.1109/IMTC.1990.66012","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66012","url":null,"abstract":"A superconducting sampler system with a self-triggering mechanism achieved a 70-GHz bandwidth, 5-ps rise time resolution, 20- mu V r.m.s. (root mean square) noise floor, less than 1-ps jitter, and an 8-mV, 70-GHz triggering capability. The sampler was used for studying ion-induced SEU (single-event-upset) transient phenomena in silicon diodes and GaAs MESFETs. Compared with conventional methods, the superconducting sampling system is easy to use and provides superior capabilities. An SEU transient has been measured with a record 25-ps rise time. The superconducting sampler configured as a TDR (time-domain reflectometer) has achieved a 2.5-ps rise time at the I/O interface after deconvolution. This corresponds to a 0.375-mm spatial resolution. It is concluded that the TDR can provide useful information for improving the performance of microwave and millimeter-wave devices.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126856350","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A robust six-to-four port reduction technique for the calibration of six-port microwave network analysers 一种用于校准六端口微波网络分析仪的鲁棒六到四端口缩减技术
7th IEEE Conference on Instrumentation and Measurement Technology Pub Date : 1990-02-13 DOI: 10.1109/IMTC.1990.65977
A. Wright, S. Judah
{"title":"A robust six-to-four port reduction technique for the calibration of six-port microwave network analysers","authors":"A. Wright, S. Judah","doi":"10.1109/IMTC.1990.65977","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65977","url":null,"abstract":"The authors introduce a simple method by which the robust calibration technique developed by S.K. Judah (1985) may be unified with the thru-reflect-line technique, yielding initial estimates of the six-port instrumental parameters that are insensitive to noise and random errors. This calibration technique has been employed in a single six-port reflectometer operating at 2 GHz. Experimental experience has shown the technique to be robust; problems encountered using the method recommended by G.F. Engen (1979) have not arisen. Investigation by computer simulation has also shown the technique to be reliable. This methodology requires a substantial increase in software effort owing to the effective operational requirement of two full calibration techniques.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"147 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125820982","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Effective waveform recorder evaluation procedures 有效波形记录仪评估程序
7th IEEE Conference on Instrumentation and Measurement Technology Pub Date : 1990-02-13 DOI: 10.1109/IMTC.1990.66000
P. J. Green
{"title":"Effective waveform recorder evaluation procedures","authors":"P. J. Green","doi":"10.1109/IMTC.1990.66000","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66000","url":null,"abstract":"The author describes a waveform-recorder evaluation system which is controlled by a Microvax II with instrumentation control through the IEEE-488 bus. Evaluation procedures are described with attention to the 'pathological cases' that can lead to significant misestimates of a digitizer's performance. The aim of these evaluation procedures is consistency with the new Trial Waveform Digitizer Standard generated by the Waveform Measurements and Analysis Committee appointed by the Instrumentation and Measurement Society of the IEEE. Methods are discussed for measuring the effective-bits performance of a waveform digitizer and determining differential nonlinearity.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129022308","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A programmable multistage half-band FIR decimator for input data rates up to 2.56 MSPS 可编程多级半带FIR抽取器，输入数据速率高达2.56 MSPS
7th IEEE Conference on Instrumentation and Measurement Technology Pub Date : 1990-02-13 DOI: 10.1109/IMTC.1990.66006
T. Yoshida, H. Kobayashi
{"title":"A programmable multistage half-band FIR decimator for input data rates up to 2.56 MSPS","authors":"T. Yoshida, H. Kobayashi","doi":"10.1109/IMTC.1990.66006","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66006","url":null,"abstract":"A multistage half-band FIR (finite impulse response) decimator has been implemented on a 40000-gate, 1.5- mu m CMOS gate array, which dissipates 1.5 W at a clock rate of 25.6 MHz (a sampling rate of 2.56 MHz). The filter handles 20-b, 2.56-M sample/s input data. It has been tested for frequency shifting and zooming in a prototype FFT (fast Fourier transform) spectrum analyzer and has increased the frequency resolution by up to 2/sup 17/ times without aliasing, resulting in frequency resolution on the order of 20 mHz; it has a 96-dB dynamic range.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"76 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128609947","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
首页 上一页 下一页 尾页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：604180095
Book学术官方微信