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Non-contact electro-optic sampling system in subpicosecond regime 亚皮秒非接触电光采样系统
7th IEEE Conference on Instrumentation and Measurement Technology Pub Date : 1990-02-13 DOI: 10.1109/IMTC.1990.65988
T. Nagatsuma, T. Shibata, E. Sano, A. Iwata
{"title":"Non-contact electro-optic sampling system in subpicosecond regime","authors":"T. Nagatsuma, T. Shibata, E. Sano, A. Iwata","doi":"10.1109/IMTC.1990.65988","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65988","url":null,"abstract":"An advanced external electrooptic sampling system is developed for use in high-speed electronic devices and circuit characterization of the subpicosecond regime. The system is designed on the basis of an electromagnetic field analysis, which clarifies system performance parameters such as sensitivity, temporal resolution, and invasiveness. One of the novel features of the system is sophisticated probe positioning over the circuit surface. An absolute distance accuracy of less than 1 mu m and a resolution of less than 0.5 mu m are realized, and measurement accuracy and reproducibility are improved. Another important feature is the precise positioning of multioptical beams without changing their optical path lengths, which enables accurate delay measurement of internal circuit nodes. A temporal resolution of less than 0.4 ps, a spatial resolution of 1 mu m, and a voltage sensitivity of less than 1 mV/ square root Hz are achieved with this system. Generation and measurement of subpicosecond electrical pulses from a pulse-forming device are also demonstrated.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123049700","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Ada sizing, metrics and measures-learning from the past and forecasting the future Ada的规模，指标和措施-从过去学习和预测未来
7th IEEE Conference on Instrumentation and Measurement Technology Pub Date : 1990-02-13 DOI: 10.1109/IMTC.1990.66027
D.D. Galorath, K. McRitchie, J.C. Rampton
{"title":"Ada sizing, metrics and measures-learning from the past and forecasting the future","authors":"D.D. Galorath, K. McRitchie, J.C. Rampton","doi":"10.1109/IMTC.1990.66027","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66027","url":null,"abstract":"It is noted that Ada has met with mixed successes owing to both differences in the technology applied to the program and differences in line counting and productivity measurement. The authors discuss the various technologies attributed to Ada and demonstrate methods of Ada size and productivity measurement that are appropriate for Ada and consistent with past data.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124052263","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Measurement standards to support photonics technology 支持光子技术的测量标准
7th IEEE Conference on Instrumentation and Measurement Technology Pub Date : 1990-02-13 DOI: 10.1109/IMTC.1990.66031
D. Franzen
{"title":"Measurement standards to support photonics technology","authors":"D. Franzen","doi":"10.1109/IMTC.1990.66031","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66031","url":null,"abstract":"It is noted that standards to support the emerging photonics/lightwave technology industry can be classified into two groups: physical primary standards maintained by national standards laboratories and standard measurement procedures agreed upon by domestic and international voluntary standards bodies. The measurement of absolute optical power leads the prioritized list of primary standards needs. The progress at NIST (National Institute of Standards and Technology) toward the development and distribution of optical power and other primary standards is reviewed. The developments of standard measurement procedures to characterize fiber, cables, sources, detectors, and lightwave systems by US and international standards bodies are discussed. The interaction between NIST and these standards groups to evaluate the precision and accuracy of several test methods is reported. It is pointed out that in some cases the evaluations resulted in technical changes to commonly accepted practices.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115809412","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Novel approaches to optical reflectometry 光学反射计的新方法
7th IEEE Conference on Instrumentation and Measurement Technology Pub Date : 1990-02-13 DOI: 10.1109/IMTC.1990.66032
S. Newton
{"title":"Novel approaches to optical reflectometry","authors":"S. Newton","doi":"10.1109/IMTC.1990.66032","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66032","url":null,"abstract":"The author reviews the fundamentals of optical reflectometry, including the standard optical time-domain reflectometry (OTDR) measurement. Some novel reflectometry schemes are described, including a spread-spectrum approach to long-range OTDR, as well as new optical frequency-domain reflectometry (OFDR) techniques that have proven useful for high-resolution measurements. These novel reflectometry techniques are suitable for testing both fiber links and small components. The spread-spectrum technique allows improved dynamic range without sacrificing resolution. High-speed modulators and detectors now allow the extension of OFDR techniques to high frequencies. Resulting measurements show a large dynamic range and resolution better than 4 mm.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127127888","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
An instrument manufacturer's experience with the 1990 volt/ohm changes 仪器制造商对1990伏特/欧姆变化的经验
7th IEEE Conference on Instrumentation and Measurement Technology Pub Date : 1990-02-13 DOI: 10.1109/IMTC.1990.66042
L. Huntley
{"title":"An instrument manufacturer's experience with the 1990 volt/ohm changes","authors":"L. Huntley","doi":"10.1109/IMTC.1990.66042","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66042","url":null,"abstract":"It is pointed out that the January 1, 1990 changes in the representations of the volt and ohm, because they were large compared with the accuracy of modern instruments, had the potential for severely impacting the US electronics industry. However, because of the excellent support provided by the National Institute of Standards and Technology and the National Conference of Standards Laboratories and because a plan was formulated and followed, one instrument manufacturer (Fluke) was able to cope with the changes with a minimum of expense and disruption of operations.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"178 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126759370","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A new time domain approach for determining the dielectric constant using stripline geometry 用带状线几何计算介电常数的一种新的时域方法
7th IEEE Conference on Instrumentation and Measurement Technology Pub Date : 1990-02-13 DOI: 10.1109/IMTC.1990.66013
K. Fidanboylu, S. Riad
{"title":"A new time domain approach for determining the dielectric constant using stripline geometry","authors":"K. Fidanboylu, S. Riad","doi":"10.1109/IMTC.1990.66013","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66013","url":null,"abstract":"A novel time-domain approach to determining the dielectric constant of materials using stripline geometry is presented. The technique uses time-domain reflectometry measurements and computer simulation to determine an optimum lossy transmission line model characterizing the stripline under test. The line model is then used for determining the dielectric constant of the dielectric material. Experimental and simulated results are presented to verify the validity of the technique, which is demonstrated by using two striplines constructed from composite laminates.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124730834","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Deconvolution of causal pulse and transient data 因果脉冲和瞬态数据的反卷积
7th IEEE Conference on Instrumentation and Measurement Technology Pub Date : 1990-02-13 DOI: 10.1109/IMTC.1990.66011
A. Bennia, N. Nahman
{"title":"Deconvolution of causal pulse and transient data","authors":"A. Bennia, N. Nahman","doi":"10.1109/IMTC.1990.66011","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66011","url":null,"abstract":"The effects of the causality of a certain class of frequency domain filters that satisfy the Paley-Wiener criterion are discussed. Physical pulses and transients are causal functions of time; that is, their values are zero before t=0, the time at which they begin. Their measured waveform data are also causal. When deconvolution processing is applied to remove instrumentation errors and/or suppress the effects of noise, noncausal deconvolution methods may introduce unacceptable errors. The Nahman-Guillaume automatic deconvolution method is modified to ensure that causality is maintained in the deconvolution result. Examples which show the undesirable effects of noncausal methods and a means of eliminating such effects are given.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"74 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125742228","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 25
Theoretical aspects of calibration procedures in network analyzers for nonlinear one port devices 非线性单端口设备网络分析仪校准程序的理论方面
7th IEEE Conference on Instrumentation and Measurement Technology Pub Date : 1990-02-13 DOI: 10.1109/IMTC.1990.66039
M. vanden Bossche, A. Barel
{"title":"Theoretical aspects of calibration procedures in network analyzers for nonlinear one port devices","authors":"M. vanden Bossche, A. Barel","doi":"10.1109/IMTC.1990.66039","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66039","url":null,"abstract":"The authors discuss the theoretical aspects of the extension of the calibration techniques for network analyzers to the measurement of nonlinear devices. An examination of these theoretical aspects makes it possible to pinpoint the fundamental calibration problems that must be solved before the performance of nonlinear device measurements is comparable with the achieved performance of linear system measurements. It is shown that the calibration procedure for measuring nonlinear one-port devices with low- and high-frequency network analyzers can be reduced to a full linear calibration procedure and determination of a complex scaling factor. This scaling factor can be determined in two steps: amplitude and phase calibration. For the amplitude calibration, the use of a power meter, traceable to a standard, is sufficient. For the phase calibration, a phase reference is needed. This can be a known active device or a reference generator.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"502 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114137050","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A review of IEEE pulse standards 194 and 181 IEEE脉冲标准194和181的回顾
7th IEEE Conference on Instrumentation and Measurement Technology Pub Date : 1990-02-13 DOI: 10.1109/IMTC.1990.66021
P. Stuckert
{"title":"A review of IEEE pulse standards 194 and 181","authors":"P. Stuckert","doi":"10.1109/IMTC.1990.66021","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66021","url":null,"abstract":"The author presents a brief history of the development of the IEEE pulse standards and outlines their organization and content with emphasis on old terms with new names and new terms. It is noted that these standards (and their International Electrotechnical Commission counterparts) are applicable to a wide range of pulse measurement situations ranging from automatic instruments that digitize, store, and analyze waveforms to the practices of the more casual user who employs visual observation and mental evaluation.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129460906","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Parameter estimation in strongly nonlinear circuits 强非线性电路中的参数估计
7th IEEE Conference on Instrumentation and Measurement Technology Pub Date : 1990-02-13 DOI: 10.1109/IMTC.1990.66041
E. van den Eijnde, J. Schoukens
{"title":"Parameter estimation in strongly nonlinear circuits","authors":"E. van den Eijnde, J. Schoukens","doi":"10.1109/IMTC.1990.66041","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66041","url":null,"abstract":"The combination of the generalized Volterra approach to computing the nonlinear steady-state output and a maximum likelihood estimator results in a powerful parameter estimation method for strongly nonlinear circuits. As a result, it is possible to determine parameters which cannot be measured or are difficult to measure. The proposed approach is illustrated by the example of an inverting amplifier built around an operational amplifier causing slew-induced distortion.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115594690","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
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