{"title":"强非线性电路中的参数估计","authors":"E. van den Eijnde, J. Schoukens","doi":"10.1109/IMTC.1990.66041","DOIUrl":null,"url":null,"abstract":"The combination of the generalized Volterra approach to computing the nonlinear steady-state output and a maximum likelihood estimator results in a powerful parameter estimation method for strongly nonlinear circuits. As a result, it is possible to determine parameters which cannot be measured or are difficult to measure. The proposed approach is illustrated by the example of an inverting amplifier built around an operational amplifier causing slew-induced distortion.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Parameter estimation in strongly nonlinear circuits\",\"authors\":\"E. van den Eijnde, J. Schoukens\",\"doi\":\"10.1109/IMTC.1990.66041\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The combination of the generalized Volterra approach to computing the nonlinear steady-state output and a maximum likelihood estimator results in a powerful parameter estimation method for strongly nonlinear circuits. As a result, it is possible to determine parameters which cannot be measured or are difficult to measure. The proposed approach is illustrated by the example of an inverting amplifier built around an operational amplifier causing slew-induced distortion.<<ETX>>\",\"PeriodicalId\":404761,\"journal\":{\"name\":\"7th IEEE Conference on Instrumentation and Measurement Technology\",\"volume\":\"29 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1990-02-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"7th IEEE Conference on Instrumentation and Measurement Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.1990.66041\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"7th IEEE Conference on Instrumentation and Measurement Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.1990.66041","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Parameter estimation in strongly nonlinear circuits
The combination of the generalized Volterra approach to computing the nonlinear steady-state output and a maximum likelihood estimator results in a powerful parameter estimation method for strongly nonlinear circuits. As a result, it is possible to determine parameters which cannot be measured or are difficult to measure. The proposed approach is illustrated by the example of an inverting amplifier built around an operational amplifier causing slew-induced distortion.<>
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