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Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)最新文献

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A comparative analysis between different inversion algorithms for process tomographic measurements 过程层析测量中不同反演算法的比较分析
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351337
G. D'Antona, L. Rocca
{"title":"A comparative analysis between different inversion algorithms for process tomographic measurements","authors":"G. D'Antona, L. Rocca","doi":"10.1109/IMTC.2004.1351337","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351337","url":null,"abstract":"In measurements science and its technological application most of the measurement methods are indirect. In order to measure the unknown physical quantity y we have, to develop a forward model which relates this quantities to another one x directly measurable: x/spl rarr/y. Often the measurement model available is of the opposite nature, i.e. y/spl rarr/x. It is thus necessary to invert the available model: this operation in some cases can lead to an unacceptable level of uncertainty in the results. The inversion procedure requires regularization techniques in order to limit the uncertainty affecting the indirect measurements. This operation can be accomplished adopting different algorithms proposed by various authors. This paper shows a comparison of some algorithms for processing measured data using ill-conditioned inverse models employed for determining the distribution of indirectly measured quantities. They all perform Tikhonov regularization. The comparison is performed analyzing their metrological performances on the basis of two application tests, one linear and one non linear.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122798341","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Nano resolution imaging technique with a near-field scanning microwave microscope 近场扫描微波显微镜的纳米分辨率成像技术
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351025
Hyunjun Yoo, Songhui Kim, Jongil Yang, K. K. Kiejin Lee, B. Friedman
{"title":"Nano resolution imaging technique with a near-field scanning microwave microscope","authors":"Hyunjun Yoo, Songhui Kim, Jongil Yang, K. K. Kiejin Lee, B. Friedman","doi":"10.1109/IMTC.2004.1351025","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351025","url":null,"abstract":"We demonstrated a near-field scanning microwave microscope (NSMM) with a nano spatial resolution using a hybrid tip. In order to understand the function of the probe, we fabricated the hybrid tip with a flat shaped shoulder and a reduced length of the tapered part using a conventional chemical etching technique. Two different NSMM images were observed for patterned Cr films on glass substrates and analyzed as a function of the apex and the cone angle of the tapered part. The hybrid tips were coupled to a high quality dielectric resonator at an operating frequency f = 4.46 GHz. By using the hybrid tip, we demonstrated an improved high contrast NSMM image of lambda phage DNA on a glass substrate.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"134 6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131138168","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An outlook on the dynamic error "blind" correction for the time-varying measurement channel 时变测量信道动态误差“盲”校正展望
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351017
J. Nabielec
{"title":"An outlook on the dynamic error \"blind\" correction for the time-varying measurement channel","authors":"J. Nabielec","doi":"10.1109/IMTC.2004.1351017","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351017","url":null,"abstract":"The paper presents the measuring system, which allows for correction of dynamic error caused by the analogue signal transducers, whose dynamic characteristics are changing with a rate approximate to the rate of change of the measured signal. Three methods for self-identification of the coefficients of the transducers' dynamics model, using exclusively the measured signal at the transducers' operating locations, are proposed. Analytical justification for the correctness of the proposed methods is presented for both: the special case of measuring periodic signals and for the general case when the measured signals are nonperiodic. The self-identification and correction procedures are performed as the algorithms processing the data collected from transducers.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131205800","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Discriminating physical poles from mathematical poles in high order systems: use and automation of the stabilization diagram 判别高阶系统中的物理极点和数学极点:稳定图的使用和自动化
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351525
H. Auweraer, Bart Peeters
{"title":"Discriminating physical poles from mathematical poles in high order systems: use and automation of the stabilization diagram","authors":"H. Auweraer, Bart Peeters","doi":"10.1109/IMTC.2004.1351525","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351525","url":null,"abstract":"System identification from measured MIMO data plays a crucial role in structural dynamics and vibro-acoustic system optimization. The most popular modeling approach is based on the i modal analysis concept, leading to an interpretation in terms of visualized eigenmodes. Typically, the number of nodes is very high (often over 100), including modes with high damping and high modal overlap. The paper discusses a key problem of the system identification process: the selection of the correct model order and related to this, the selection of valid system poles. A multi-order approach, followed by a heuristic selection process is outlined. A visual representation of the pole behavior is presented and the possible routes to automation are discussed. The process is illustrated with typical complex datasets, including full-scale industrial tests.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121870616","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 78
Electro-optical instrument for photodetector characterization 光电探测器表征用电光仪器
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351569
A. Makynen, J. Kostaniovaara
{"title":"Electro-optical instrument for photodetector characterization","authors":"A. Makynen, J. Kostaniovaara","doi":"10.1109/IMTC.2004.1351569","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351569","url":null,"abstract":"A fully functional instrumentation for electro-optical characterization of silicon photodetectors is presented. The system is intended for laboratory use where typically a few devices are characterized at a time. The instrument is designed for determining the spectral, spatial and temporal photoresponse of a single photodetector or a photodetector array. Also Geiger mode detectors can be tested. In case of photodetector arrays fast determination of modulation transfer function and photoresponse nonuniformity is possible. The instrument setup and experimental results are presented.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127773344","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Carrier frequency and phase offset measurement for single carrier digital modulations 单载波数字调制的载波频率和相位偏移测量
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351076
D. Luca Carnì, D. Grimaldi
{"title":"Carrier frequency and phase offset measurement for single carrier digital modulations","authors":"D. Luca Carnì, D. Grimaldi","doi":"10.1109/IMTC.2004.1351076","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351076","url":null,"abstract":"A method for measuring both the carrier frequency and the carrier phase offset in the case of single carrier digital modulation is presented. The method concerns with (i) the amplitude modulated signals. M-ary quadrature amplitude modulation and M-ary amplitude shift keying, and (ii) the angle modulated signals, M-ary phase shift keying and M-ary frequency shift keying. The carrier frequency is evaluated by means of the zero-crossing sequence, the carrier phase offset is evaluated by analyzing the I-Q representation of the input base-band signal in comparison with the ideal standard constellation. Experimental tests carried out on both simulated and actual digital modulated signals highlight both the method performance and accuracy.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133469459","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
The straw-tube tracker of the ZEUS-detector at HERA HERA zeus探测器的吸管管跟踪器
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351263
S. Goers
{"title":"The straw-tube tracker of the ZEUS-detector at HERA","authors":"S. Goers","doi":"10.1109/IMTC.2004.1351263","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351263","url":null,"abstract":"The design of the straw tube tracker (STT) is described. The detector consists of 48 sectors and an overall of 11,000 straws, which allows precise track measurements in the forward direction of the ZEUS-detector at HERA. Test beam measurements are shown and the results are compared to Monte Carlo simulations. The STT is also used in the ZEUS trigger logic. An offline reconstruction algorithm is implemented and works. It is shown that we are able to reconstruct tracks in the forward direction of ZEUS, up to a pseudorapidity of 3.2 with high efficiency.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131796410","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Study on real-time measurement of nugget diameter for resistance spot welding using a neuro-fuzzy algorithm 基于神经模糊算法的电阻点焊熔核直径实时测量研究
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351535
Zhong-qin Lin, Yansong Zhang, Guanlong Chen, Yongbing Li
{"title":"Study on real-time measurement of nugget diameter for resistance spot welding using a neuro-fuzzy algorithm","authors":"Zhong-qin Lin, Yansong Zhang, Guanlong Chen, Yongbing Li","doi":"10.1109/IMTC.2004.1351535","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351535","url":null,"abstract":"Resistance spot welding (RSW) is still the most successful sheet metal joining method in the automobile industry. However, an effective quality evaluation method has not yet been developed. Real-time quality inspection of RSW is necessary in order to deal with all kinds of problems during welding. This paper developed an experimental system using for measuring electrode displacement. Accordingly based on electrode displacement curve proposes a neuro-fuzzy algorithm to inference nugget diameter online. Inference results showed that among the total number of specimens, 88% were successfully inferred within a range of 1.5% error.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134199385","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 16
Statistical acquisition for embedded instrumentation 用于嵌入式仪器的统计采集
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351052
A. A. de Souza, L. Carro
{"title":"Statistical acquisition for embedded instrumentation","authors":"A. A. de Souza, L. Carro","doi":"10.1109/IMTC.2004.1351052","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351052","url":null,"abstract":"This work presents a methodology to acquire data from embedded sensors with a low impact on the analog area, suited to modern digital technologies. A parallel strategy is proposed where the basic blocks can use redundancy to cope with highly variable digital technologies. Statistics sampling with several uncorrelated noise references through one-bit comparators is used. Self configuration allows a robust process. Theoretical data and measurement results are shown, validating the proposed approach.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134232439","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Measurements of sensitivity of birefringent holey fiber to temperature, elongation, and hydrostatic pressure 双折射多孔纤维对温度、伸长率和静水压力的敏感性测量
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351286
W. Bock, W. Urbańczyk
{"title":"Measurements of sensitivity of birefringent holey fiber to temperature, elongation, and hydrostatic pressure","authors":"W. Bock, W. Urbańczyk","doi":"10.1109/IMTC.2004.1351286","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351286","url":null,"abstract":"We experimentally characterized a holey fiber, whose birefringence is induced by interrupting the hexagonal symmetry of the cladding. Using a scanning wavelength method, we measured the fiber's group modal birefringence in a wide spectral range and compared the experimental results with the theoretical predictions. We also determined the polarimetric sensitivities of the investigated fiber to temperature, elongation, and hydrostatic pressure, which are respectively K/sub T/=-0.066 rad/K/spl times/m, K/sub /spl epsiv//=-1.4 rad/mstrain/spl times/m, and K/sub p/=-10.3 rad/MPa/spl times/m.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130380183","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
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