{"title":"用于嵌入式仪器的统计采集","authors":"A. A. de Souza, L. Carro","doi":"10.1109/IMTC.2004.1351052","DOIUrl":null,"url":null,"abstract":"This work presents a methodology to acquire data from embedded sensors with a low impact on the analog area, suited to modern digital technologies. A parallel strategy is proposed where the basic blocks can use redundancy to cope with highly variable digital technologies. Statistics sampling with several uncorrelated noise references through one-bit comparators is used. Self configuration allows a robust process. Theoretical data and measurement results are shown, validating the proposed approach.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Statistical acquisition for embedded instrumentation\",\"authors\":\"A. A. de Souza, L. Carro\",\"doi\":\"10.1109/IMTC.2004.1351052\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This work presents a methodology to acquire data from embedded sensors with a low impact on the analog area, suited to modern digital technologies. A parallel strategy is proposed where the basic blocks can use redundancy to cope with highly variable digital technologies. Statistics sampling with several uncorrelated noise references through one-bit comparators is used. Self configuration allows a robust process. Theoretical data and measurement results are shown, validating the proposed approach.\",\"PeriodicalId\":386903,\"journal\":{\"name\":\"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)\",\"volume\":\"19 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-05-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.2004.1351052\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.2004.1351052","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Statistical acquisition for embedded instrumentation
This work presents a methodology to acquire data from embedded sensors with a low impact on the analog area, suited to modern digital technologies. A parallel strategy is proposed where the basic blocks can use redundancy to cope with highly variable digital technologies. Statistics sampling with several uncorrelated noise references through one-bit comparators is used. Self configuration allows a robust process. Theoretical data and measurement results are shown, validating the proposed approach.