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Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)最新文献

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Evaluation of measurement uncertainty by Bayesian-entropic approach 用贝叶斯熵法评定测量不确定度
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351289
G. Iuculano, M. Cox, G. Pellegrinil, A. Zanobini
{"title":"Evaluation of measurement uncertainty by Bayesian-entropic approach","authors":"G. Iuculano, M. Cox, G. Pellegrinil, A. Zanobini","doi":"10.1109/IMTC.2004.1351289","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351289","url":null,"abstract":"This paper discusses the possibility of using Bayesian inference methods and entropy optimization principles for the evaluation of uncertainty in a measurement process. In particular, the proposed approach is applied to the recalibration of a measurement device which incorporates a calibrated reference quantity. An a priori estimate and an uncertainty for the reference quantity are supposed to be available from a previous calibration. The adopted method is shown to produce a posteriori estimates for the reference quantity, regarded as the recalibrated value and for the measurand which are correlated.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128668093","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
A test bench for the AMS-RICH photodetector modules AMS-RICH光电探测器模块的试验台
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351439
M. Vargas-Treviño, J. Ballon, A. Barrau, G. Boudoul, M. Buénerd, L. Derome, L. Eraud, L. Gallin-Martel, J. Scordilis, O. Veziant
{"title":"A test bench for the AMS-RICH photodetector modules","authors":"M. Vargas-Treviño, J. Ballon, A. Barrau, G. Boudoul, M. Buénerd, L. Derome, L. Eraud, L. Gallin-Martel, J. Scordilis, O. Veziant","doi":"10.1109/IMTC.2004.1351439","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351439","url":null,"abstract":"The Alpha Magnetic Spectrometer experiment to be installed on the International Space Station will be equipped with a Proximity Focusing Ring Imaging Cerenkov detector for ion identification. A prototype (2nd generation) has been constructed, which performances have been evaluated both with Cosmic Ray particles and beam ions. A test bench (PMT and Front End Electronics selection) was developed for the testing of the photodetector modules of the flight model. It is described in this contribution.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129317350","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
IEEE802.11 sensor networking [wireless network] IEEE802.11传感器网络[无线网络]
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351307
P. Ferrari, A. Flammini, D. Marioli, A. Taroni
{"title":"IEEE802.11 sensor networking [wireless network]","authors":"P. Ferrari, A. Flammini, D. Marioli, A. Taroni","doi":"10.1109/IMTC.2004.1351307","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351307","url":null,"abstract":"This paper deals with a smart transducer wireless network for industrial applications. Thanks to its high popularity, a solution based on IEEE 802.11 (Wi-Fi) is adopted. A master slave network organization is proposed to allow several sensors to be connected with generic Wi-Fi devices, like PCs: a proprietary protocol over IP/UDP has been also developed. Finally, some low cost prototypes have been build to test the network behaviour and to show its feasibility. Experimental results prove its applicability in a soft real-time industrial context.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127017430","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Earth surface potentials measuring device for large grounding systems testing 大型接地系统测试用地表面电位测量装置
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351511
R. Giannini, H. Džapo
{"title":"Earth surface potentials measuring device for large grounding systems testing","authors":"R. Giannini, H. Džapo","doi":"10.1109/IMTC.2004.1351511","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351511","url":null,"abstract":"Substation grounding system characteristics need to be examined periodically in order to check that protective functions have not been degraded over a longer period of time. The most important safety parameters are the values of touch and step voltages. However, the surface potential distribution contains additional information concerning grounding grid status and possible characteristics degradation trends. Inspection procedure needs to be well prepared prior to actual measurement during which the great deal of measuring information has to be acquired. General-purpose multimeters are inconvenient for the efficient conduction of measuring procedure and data management tasks. A novel application-specific measuring system for earth surface potentials measurement needed to be developed and realized. It consists of the smart measuring device accompanied with the integrated program environment on a personal computer for inspection planning and analysis.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127278955","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
A time domain approach for IEEE Std 1459-2000 powers measurement in distorted and unbalanced power systems 畸变和不平衡电力系统功率测量的时域方法
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351325
A. Cataliotti, V. Cosentino, S. Nuccio
{"title":"A time domain approach for IEEE Std 1459-2000 powers measurement in distorted and unbalanced power systems","authors":"A. Cataliotti, V. Cosentino, S. Nuccio","doi":"10.1109/IMTC.2004.1351325","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351325","url":null,"abstract":"In this paper, the authors present a new instrument for the measurement of the electric power quantities defined in IEEE Std 1459. The instrument is based on a time domain technique for the detection of fundamental and harmonic components of voltages and currents. This technique does not require any spectral analysis for the evaluation of the amplitudes and phase angles of voltages and currents. Theoretical aspects are discussed and experimental results are presented, giving accuracy specifications.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130130352","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 27
Microwave permittivity measurement of polymers by deposition on a coplanar wave guide 在共面波导上沉积聚合物的微波介电常数测量
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351057
Y. Rolain, A. Barel, F. Gubbels, W. van Moer
{"title":"Microwave permittivity measurement of polymers by deposition on a coplanar wave guide","authors":"Y. Rolain, A. Barel, F. Gubbels, W. van Moer","doi":"10.1109/IMTC.2004.1351057","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351057","url":null,"abstract":"A balance is made between accuracy and cost in the wideband (45 MHz-18 GHz) determination of the permittivity of a polymerised elastic coating. It is shown that the combination of S-parameters measurements of 2 coplanar wave guides (CPW) before and after coating with a thick layer of the material under test (MUT) and the use of an analytical expression for the calculation of the permittivity of the lines, can lead to a 'best bargain' solution. Expensive narrow-banded methods fall out of the scope for this application.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128915065","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Timing requirement for reliable latch-based circuit design 可靠锁存电路设计的时序要求
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351354
Young Jun Lee, Yong-Bin Kim, F. Lombardi, N. Park
{"title":"Timing requirement for reliable latch-based circuit design","authors":"Young Jun Lee, Yong-Bin Kim, F. Lombardi, N. Park","doi":"10.1109/IMTC.2004.1351354","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351354","url":null,"abstract":"This paper presents a framework of simulation and verification methodology for latch-based VLSI design. The proposed methodology includes optimal latch insertion point identification, how to consider clock skew for timing, and how to simulate circuits to verify the timing and functionality considering the clock skew in high speed VLSI systems for latch-based design. An existing flip-flop based FFT block is converted to latch-based design using the proposed methodology, and the performance of the block is increased by 10%.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128946847","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Real-time implementation of IFDIA scheme in automotive system IFDIA方案在汽车系统中的实时实现
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351401
D. Capriglione, C. Liguori, A. Pietrosanto
{"title":"Real-time implementation of IFDIA scheme in automotive system","authors":"D. Capriglione, C. Liguori, A. Pietrosanto","doi":"10.1109/IMTC.2004.1351401","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351401","url":null,"abstract":"The paper describes the implementation of an Instrument Fault Detection, Isolation and Accommodation (IFDIA) scheme developed for real-time automotive applications. The IFDIA architecture, based on artificial neural networks (ANNs) and inference rules, was employed to locate and accommodate faults that could occur on the main sensors involved in the management of the engine operating. Many on-line tests carried out in several engine working and vehicle drive conditions, prove the goodness of the diagnostic procedure and its on-board applicability.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129158350","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 14
Radial identification of tearing modes in a Tokamak 托卡马克撕裂模式的径向识别
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351333
J. Berrino, S. Cirant, G. DiAntona, E. Lazzaro
{"title":"Radial identification of tearing modes in a Tokamak","authors":"J. Berrino, S. Cirant, G. DiAntona, E. Lazzaro","doi":"10.1109/IMTC.2004.1351333","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351333","url":null,"abstract":"The focus of the present research is the control of rotating magnetic islands of low helical mode numbers (m,n) in thermonuclear plasmas. These perturbations are associated with local distortions of the current profile that can be a serious cause of degradation of the plasma confinement. The islands are reduced in width or completely suppressed by restoring the unperturbed current profile. The current can be driven by the deposition of radio frequency power within the island. Traditionally magneto-hydrodynamic (MHD) instabilities are monitored by external magnetic signals that however give no information about the radial location of the perturbation within the plasma. Because temperature fluctuation is also associated with MHD instabilities, ECE (electron cyclotron emission) signals that give information about local electron temperature, are used to identify the islands position. Here, we describe the design of a real time diagnostics/control device using an original algorithm for an effective control action that involves identification of relevant state variables (radial location, island amplitude, frequency and phase) in \"real time\" and varies accordingly the control variables (wave beam power modulation and steering angles).","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131092632","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A fully simulated laboratory for instrumentation and electronic measurements 一个完全模拟的仪器和电子测量实验室
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351298
Umberto Pisani, F. Cambiotti, F. Corinto, G. Romano
{"title":"A fully simulated laboratory for instrumentation and electronic measurements","authors":"Umberto Pisani, F. Cambiotti, F. Corinto, G. Romano","doi":"10.1109/IMTC.2004.1351298","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351298","url":null,"abstract":"An educational laboratory, SWILAB (software instrument manager library), useful for developing and carrying out fully simulated experiences on instrumentation and electronic measurements by using instrumentation simulators is proposed. SWILAB includes several instruments like waveform generators, analog and digital oscilloscopes, analog and digital voltmeters and a device under test (circuit simulator), all designed in C++ language. The interfaces between the instruments and the user are like the actual ones and the control panels were designed with a real look (containing all the instrument displays, connectors and control knobs). Particular care was devoted to make actual the action-effect relationship between the knob setting and the command execution. The connections between the electronic instruments and between the instruments and the device under test is realized by a SW communication channel and is completely transparent to the user. The connection is performed simply by drag and drop techniques between the connectors to be linked. The virtual laboratory is now used by students of regular courses in several Italian universities and in distance learning courses, with a high satisfaction level and didactic effectiveness.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130690393","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 14
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