{"title":"Timing requirement for reliable latch-based circuit design","authors":"Young Jun Lee, Yong-Bin Kim, F. Lombardi, N. Park","doi":"10.1109/IMTC.2004.1351354","DOIUrl":null,"url":null,"abstract":"This paper presents a framework of simulation and verification methodology for latch-based VLSI design. The proposed methodology includes optimal latch insertion point identification, how to consider clock skew for timing, and how to simulate circuits to verify the timing and functionality considering the clock skew in high speed VLSI systems for latch-based design. An existing flip-flop based FFT block is converted to latch-based design using the proposed methodology, and the performance of the block is increased by 10%.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.2004.1351354","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
This paper presents a framework of simulation and verification methodology for latch-based VLSI design. The proposed methodology includes optimal latch insertion point identification, how to consider clock skew for timing, and how to simulate circuits to verify the timing and functionality considering the clock skew in high speed VLSI systems for latch-based design. An existing flip-flop based FFT block is converted to latch-based design using the proposed methodology, and the performance of the block is increased by 10%.