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Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)最新文献

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Low-cost conductivity cells for water measurement purposes 用于水测量的低成本电导率电池
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351459
J. Torrents
{"title":"Low-cost conductivity cells for water measurement purposes","authors":"J. Torrents","doi":"10.1109/IMTC.2004.1351459","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351459","url":null,"abstract":"Multipoint and multiparametric indicators, measured in biosphere, are important tools in sustainable research and assessment topics. Electrical conductivity of water is one of these indicators because trace ions dissolved in it. Commercial sensors involved in such measurements are often of high performances (i.e. specifications with ranges, accuracies and, sensitivities beyond conductivity values measured in, lakes or rivers). As a consequence, they have high costs. This paper describes the design and the construction of three different conductivity cells for measuring water conductivity mainly in lakes and rivers. Besides, the designs are focused in low-cost implementation. The paper also compares the cells and, measures water conductivity of the lake inside the university campus.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134362711","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Error vector-based measurement procedures for RF digital transmitters troubleshooting 误差矢量为基础的测量程序的射频数字发射机故障排除
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351042
L. Angrisani, M. D'Apuzzo, M. D’Arco, M. Vadursi
{"title":"Error vector-based measurement procedures for RF digital transmitters troubleshooting","authors":"L. Angrisani, M. D'Apuzzo, M. D’Arco, M. Vadursi","doi":"10.1109/IMTC.2004.1351042","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351042","url":null,"abstract":"The rapid growth of modern telecommunications systems has created the need of getting new test equipment as well as measurement techniques up and running in a very short time. With particular regard to transmitters troubleshooting, new measurement methods and procedures are clearly claimed for, because those based on the analysis of constellation diagrams, currently supported by major manufacturers, show some intrinsic limitations. Some original and straightforward measurement procedure, based on the use of error vector (EV), which overcome the aforementioned limitations, are proposed in the paper. They are addressed to the I/Q section of transmitters, and are particularly affective both in terms of accuracy and measurement time when only one or two I/Q impairments are significant. Besides providing an analytical description, the paper gives details of the extended experimental campaign carried out on actual telecommunication signals in order to assess the performance of the proposed procedures.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"10 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131563715","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 15
COSBA an experimental system for direction finding and signal parameter estimation COSBA是一个测向和信号参数估计的实验系统
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351200
J. Worms
{"title":"COSBA an experimental system for direction finding and signal parameter estimation","authors":"J. Worms","doi":"10.1109/IMTC.2004.1351200","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351200","url":null,"abstract":"The experimental direction finder system COSBA (\"COnformal Seekerhead Broadband Array\") is described in this paper. The system is used for the localization of arriving signals in a frequency region of several GHz. In future the frequency of the arriving signals will be estimated by the methods proposed by Tsui or Zoltowski. To estimate the angles of arrivals, the polarization states and the complex amplitudes of the received signals sequential sampling methods are applied.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131639969","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A constant temperature operation thermo-resistive /spl Sigma/-/spl Delta/ transducer 恒温操作热阻/spl Sigma/-/spl Delta/传感器
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351274
A. Oliveira, A. S. Costa, L. S. Palma, A.C.C. Lima, R. Freire
{"title":"A constant temperature operation thermo-resistive /spl Sigma/-/spl Delta/ transducer","authors":"A. Oliveira, A. S. Costa, L. S. Palma, A.C.C. Lima, R. Freire","doi":"10.1109/IMTC.2004.1351274","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351274","url":null,"abstract":"In this paper, we propose a feedback architecture, with thermo-resistive sensor, based on the so called thermal sigma-delta principle. The architecture uses a 1-bit sigma-delta modulator in which a considerable part of the conversion function is performed by a thermo-resistive sensor. The sensor is modeled using the electrical equivalence principle and the applied measurement method is at constant temperature. This transducer architecture is able to realize digital measurement of physical quantities that interact with the sensor, such as temperature, thermal radiation, or fluid velocity.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"111 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128949197","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Contributions to model characterization of geophone sensor 对检波器传感器模型表征的贡献
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351455
X. Roset, J. del Río, A. Mànuel, R. Palomera-Garcia
{"title":"Contributions to model characterization of geophone sensor","authors":"X. Roset, J. del Río, A. Mànuel, R. Palomera-Garcia","doi":"10.1109/IMTC.2004.1351455","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351455","url":null,"abstract":"In an oceanographic campaign of seismic prospecting it is often needed equipments with geophones to measure the motion of the sea bed. Normally, the signal is weak compared to the noise because the source is a few kilometres away from the sensor. The noise is due to the ambient in the ocean (seismic activity, currents, etc) and the electronic noise in the equipment (sensor, amplifier stage, A/D converter, hard disc and connexions). In order to characterize the electromagnetic geophone sensor and the performance with amplifier stage we have found models of a geophone sensor and we have simulated them with different amplifiers to improve the ratio S/N.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117327659","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Multi-modal medical image registration based on non-rigid transformations and feature point extraction by using wavelets 基于非刚性变换和小波特征点提取的多模态医学图像配准
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351158
R. Rosas-Romero, J. Rodríguez-Asomoza, V. Alarcón-Aquino, D. Baez-López
{"title":"Multi-modal medical image registration based on non-rigid transformations and feature point extraction by using wavelets","authors":"R. Rosas-Romero, J. Rodríguez-Asomoza, V. Alarcón-Aquino, D. Baez-López","doi":"10.1109/IMTC.2004.1351158","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351158","url":null,"abstract":"In order to correctly match two sets of images from different modalities, our method applies a non-rigid transformation to one set to get as close as possible to the other. This requires the estimation of the optimal similarity transformation between the two set of images. Estimation of the non-rigid deformation between the two sets of images is referred to as the deformation estimation between the pair of three-dimensional object extracted from both sets. We present a new methodology for image registration by first extracting objects from the set of images by reconstructing the object surfaces where this extraction supports semi-automatic segmentation of sets of 3-D medical images and then finding the best similarity transformation based on matching of two sets of surface points, but also incorporates the matching of two sets of feature points, and we have shown that deformation estimates based on simultaneous matching of surfaces and features are more accurate than those based on surface matching alone. This is especially true when the deformation involves physically realistic cases, such as those in human organs. Our technique uses free-form deformation models and applies the wavelet transform to extract feature points in the 3-D space. Feature point extraction also provides a means to compute the error in our estimates. We have applied our method to register sequences of MRI images to histology images of the carotid artery.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131162685","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
A microwave imaging method for NDE/NDT based on the SMW technique for the electromagnetic field prediction 基于电磁场预测 SMW 技术的无损检测/无损检测微波成像方法
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351024
S. Caorsi, M. Donelli, A. Massa, M. Pastorino, A. Randazzo, A. Rosani
{"title":"A microwave imaging method for NDE/NDT based on the SMW technique for the electromagnetic field prediction","authors":"S. Caorsi, M. Donelli, A. Massa, M. Pastorino, A. Randazzo, A. Rosani","doi":"10.1109/IMTC.2004.1351024","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351024","url":null,"abstract":"In the framework of microwave imaging techniques for NDE/NDT, this paper presents an innovative approach based on the use of the SMW inversion procedure for the electric field prediction. Starting from the integral form of inverse scattering equations, the problem of determining the presence of an unknown defect in a known host domain is recast into an optimization one by defining a suitable cost function and reducing the problem unknowns only to the flaw \"descriptors\". By considering the effective inversion technique based on the SMW formula, the estimation of the secondary unknowns (namely, the electric field distributions) is performed in a cost-effective way. Selected numerical results are finally presented in order to validate the approach showing current potentialities and limitations.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"86 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130983648","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Generalized inverse reconstruction algorithm with threshold 具有阈值的广义逆重构算法
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351100
Huaxiang Wang, Yongbo He, Chao Wang
{"title":"Generalized inverse reconstruction algorithm with threshold","authors":"Huaxiang Wang, Yongbo He, Chao Wang","doi":"10.1109/IMTC.2004.1351100","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351100","url":null,"abstract":"In this paper, a method called the generalized inverse image reconstruction algorithm with threshold based on the Geselowitz sensitivity theorem is proposed, and the selection way of the regularization parameter is also presented. Both theoretical and experimental results show that this proposed algorithm can provide images superior to those obtained with filtered back-projection (FBP) and the sensitivity coefficient algorithm.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"212 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133640273","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A photoelectric method to determine lateral distribution of the effective contact potential difference in MOS structures 一种确定MOS结构中有效接触电位差横向分布的光电方法
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351114
A. Kudła, L. Borowicz, H. Przewlocki
{"title":"A photoelectric method to determine lateral distribution of the effective contact potential difference in MOS structures","authors":"A. Kudła, L. Borowicz, H. Przewlocki","doi":"10.1109/IMTC.2004.1351114","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351114","url":null,"abstract":"The most accurate method of determination of contact potential difference in MOS structure is photoelectrical method. Some important limitations of this method are caused by the UV light source. Application of argon laser with frequency doubler allows getting high power density light spot with theoretical diameter below micrometer. This way both structures with optically thick gate and MOS structure parameters lateral distribution could be investigated. Measurements of contact potential difference lateral distribution on MOS structure show significant difference in values on single structure. The lowest values are in the corner of squared structure, the higher on the middle of the edge and the highest at the structure center. The origin of these differences could be mechanical stress or different conditions for chemical diffusion under metallic gate.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"540 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127650868","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Design for reliability 可靠性设计
Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351488
S. Mourad, H. Fujiwara
{"title":"Design for reliability","authors":"S. Mourad, H. Fujiwara","doi":"10.1109/IMTC.2004.1351488","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351488","url":null,"abstract":"This paper explores an important aspect VLSI design: how can the design processes assure that a product is reliable. While reliability is closely related to yield, we will show that it is not sufficient to improve yield to assure high reliability. This is the first stage in exploring the topic and needs further study to reach some practical approach for design for reliability. In this paper we explore a methodology to guide the engineer's design choices toward an optimal implementation of reliable VLSI design.","PeriodicalId":386903,"journal":{"name":"Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124131977","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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