可靠性设计

Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510) Pub Date : 2004-05-18 DOI:10.1109/IMTC.2004.1351488

S. Mourad, H. Fujiwara

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引用次数: 2

摘要

本文探讨了VLSI设计的一个重要方面:设计过程如何确保产品的可靠性。虽然可靠性与成品率密切相关，但我们将证明提高成品率不足以保证高可靠性。这是探索该课题的第一阶段，需要进一步研究以得出一些实用的可靠性设计方法。在本文中，我们探索了一种方法来指导工程师的设计选择，以实现可靠的超大规模集成电路设计的最佳实现。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Design for reliability

This paper explores an important aspect VLSI design: how can the design processes assure that a product is reliable. While reliability is closely related to yield, we will show that it is not sufficient to improve yield to assure high reliability. This is the first stage in exploring the topic and needs further study to reach some practical approach for design for reliability. In this paper we explore a methodology to guide the engineer's design choices toward an optimal implementation of reliable VLSI design.

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Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510)

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