2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)最新文献

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Failure Analysis for SIP IC EOS fail SIP IC EOS故障分析

2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Pub Date : 2022-07-18 DOI: 10.1109/IPFA55383.2022.9915777

Bardon Cui, Qiquan You

引用次数: 0

The effects of solid-state and hydrothermal synthesis methods of BaTiO3 on the reliability of multilayer ceramic capacitors 固相法和水热法合成BaTiO3对多层陶瓷电容器可靠性的影响

2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Pub Date : 2022-07-18 DOI: 10.1109/IPFA55383.2022.9915761

Pengfei Pan, Weiguang Zhou

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引用次数: 0

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