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2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)最新文献

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Statistical Characteristics of Radiation Noise from LED Lamps and its Effect on Wireless Medical Telemeters LED灯辐射噪声的统计特性及其对无线医疗遥测仪的影响
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE) Pub Date : 2018-08-01 DOI: 10.1109/EMCEUROPE.2018.8485169
Sazu Arie, Kai Ishida, I. Wu, K. Gotoh, Y. Matsumoto, M. Hirose
{"title":"Statistical Characteristics of Radiation Noise from LED Lamps and its Effect on Wireless Medical Telemeters","authors":"Sazu Arie, Kai Ishida, I. Wu, K. Gotoh, Y. Matsumoto, M. Hirose","doi":"10.1109/EMCEUROPE.2018.8485169","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2018.8485169","url":null,"abstract":"Light-emitting diode (LED) lamps have been widely introduced in clinical settings. However, electromagnetic noise radiated from the switching power supply mounted in LED lamps may interfere with wireless medical telemeters. Radiation noise from most LED lamps is well approximated as Gaussian when the bandwidth of the noise is the same as that of a wireless medical telemeter (Japanese type A). Poor reception of wireless medical telemeter is experimentally confirmed in the presence of additive white Gaussian noise which average power is equivalent to that of radiation noise from LED lamps band-limited to the telemeter channel","PeriodicalId":376960,"journal":{"name":"2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121555289","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Measurement and Investigation of Electromagnetic Shielding Properties of 3,4 Ethylenedioxythiophene - Maghnite - Sodium 3,4乙二氧噻吩-磁铁矿-钠电磁屏蔽性能的测定与研究
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE) Pub Date : 2018-08-01 DOI: 10.1109/EMCEUROPE.2018.8485028
S. M. Benhamou, A. Lozano-Guerrero, Yemouna Madaoui, A. Díaz-Morcillo, M. Hamouni
{"title":"Measurement and Investigation of Electromagnetic Shielding Properties of 3,4 Ethylenedioxythiophene - Maghnite - Sodium","authors":"S. M. Benhamou, A. Lozano-Guerrero, Yemouna Madaoui, A. Díaz-Morcillo, M. Hamouni","doi":"10.1109/EMCEUROPE.2018.8485028","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2018.8485028","url":null,"abstract":"Conducting polymer composite is an alternative to conventional shielding materials. The present study aims to investigate the electromagnetic shielding characteristics and shielding effectiveness of the sheet of 3,4 ethylenedioxythiophene associated with maghnite and sodium. Waveguide measurements are used to obtain the shielding effectiveness of the studied material. Measurements have been carried out over a 9 GHz to 11 GHz frequency band. Also, dielectric probe measurements are performed to recover the dielectric permittivity of the composite. In addition, the reflection loss, the absorption loss and the shielding effectiveness measured from tests were compared with the values calculated from the transmission line theory.","PeriodicalId":376960,"journal":{"name":"2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)","volume":"91 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125171590","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Simulation Methodology of Radiated Emission for IC Stripline Measurements 集成电路带状线测量的辐射发射仿真方法
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE) Pub Date : 2018-08-01 DOI: 10.1109/EMCEUROPE.2018.8485082
W. Heuvelman, R. Janssen, S. Kapora, Stefan Kwaaitaal, E. Rodríguez, J. Kuenen, Gunnar Schulz-Mewes, Philip Axer
{"title":"Simulation Methodology of Radiated Emission for IC Stripline Measurements","authors":"W. Heuvelman, R. Janssen, S. Kapora, Stefan Kwaaitaal, E. Rodríguez, J. Kuenen, Gunnar Schulz-Mewes, Philip Axer","doi":"10.1109/EMCEUROPE.2018.8485082","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2018.8485082","url":null,"abstract":"A simulation methodology is proposed to simulate the radiated emission of an integrated circuit, based on the IC stripline method. Since several years, the development of ICs for in-vehicle networks is going from relatively low frequency controller area network (CAN) and local interconnect network (LIN) applications towards higher frequency ethernet applications. Due to higher frequencies and the strict requirements on EMC for automotive applications there is a need to predict the radiated emission performance of ICs on circuit and system level. For this reason, a simulation flow and methodology has been developed to be able to predict the radiated emission that originates from a single IC. The novel methodology has been validated with simple test structures and with measurements in an IC stripline of an ethernet switch application IC.","PeriodicalId":376960,"journal":{"name":"2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125688553","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Circuit Modeling of Contact Arc and Contact Bounce in a Transient Electromagnetic Compatibility Test 瞬变电磁兼容试验中触点电弧和触点弹跳的电路建模
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE) Pub Date : 2018-08-01 DOI: 10.1109/EMCEUROPE.2018.8485003
J. Li, A. Srikanth, Tianye Ma, P. Gurrala
{"title":"Circuit Modeling of Contact Arc and Contact Bounce in a Transient Electromagnetic Compatibility Test","authors":"J. Li, A. Srikanth, Tianye Ma, P. Gurrala","doi":"10.1109/EMCEUROPE.2018.8485003","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2018.8485003","url":null,"abstract":"Automotive electronic/electrical systems are required to operate as designed while exposed to transient electromagnetic compatibility (EMC) tests. An example of such an EMC test is the CI 220 test, in which pulse voltages produced by switch contact arcing and contact bounce during switching of an inductive load are employed. Apposite but simple modeling is thereby desirable for the EMC engineer to evaluate at the early design phase and avoid failures in advance. In this work, an easy-to-implement circuit model simulating both contacts arcing and contact bounce phenomenon is derived and implemented in L Tspice., in which arc behavior parameters, as well as bounce time, are extracted from the experimental measurement results using a home-made pulse generator. Experimental validation of this developed circuit model under three different loads is also demonstrated.","PeriodicalId":376960,"journal":{"name":"2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127744534","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Interlaboratory Comparison of Radiated Emissions in Automotive EMC 汽车电磁兼容辐射排放的实验室间比较
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE) Pub Date : 2018-08-01 DOI: 10.1109/EMCEUROPE.2018.8485018
R. Aipu, A. Silaghi, A. Buta, P. Nicolae, A. De Sabata
{"title":"Interlaboratory Comparison of Radiated Emissions in Automotive EMC","authors":"R. Aipu, A. Silaghi, A. Buta, P. Nicolae, A. De Sabata","doi":"10.1109/EMCEUROPE.2018.8485018","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2018.8485018","url":null,"abstract":"Interlaboratory comparison is performed to ensure repeatability amongst EMC laboratories worldwide regarding specific test methods. The purpose of this paper is to present an interlaboratory comparison method for radiated emissions (RE) testing used by 5 laboratories. Two statistical analysis methods are used, statistical analysis based on the ζ performance and analysis based on the Z performance. A comb generator with two different antennas (to obtain broadband frequency) is used as an artefact. The sample is moved from one laboratory to another in order to obtain the raw data for the final analysis. Final report is distributed to all the ILC participants.","PeriodicalId":376960,"journal":{"name":"2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127807045","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
The MoM-based Empirical Aperture Approach for Estimating the Shielding Effectiveness of Metallic Enclosures with Joints Through Narrow Slots 基于moma的狭缝接头金属外壳屏蔽效能评估方法
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE) Pub Date : 2018-08-01 DOI: 10.1109/emceurope.2018.8485095
F. Bogdanov, I. Chochia, L. Svanidze, R. Jobava
{"title":"The MoM-based Empirical Aperture Approach for Estimating the Shielding Effectiveness of Metallic Enclosures with Joints Through Narrow Slots","authors":"F. Bogdanov, I. Chochia, L. Svanidze, R. Jobava","doi":"10.1109/emceurope.2018.8485095","DOIUrl":"https://doi.org/10.1109/emceurope.2018.8485095","url":null,"abstract":"In this paper, the MoM-based empirical aperture approach is proposed to estimate the shielding effectiveness (SE) of metallic enclosures with joints through narrow and very narrow slots (apertures). This approach is based on the introduction of an infinitely thin aperture, special node joint basis functions and the concept of a magnetic wire for describing the penetration of EM energy through the real slots (apertures) with joints. First, the proposed approach is verified on a number of narrow apertures by comparing the obtained results with the results obtained by direct MoM. Further, it is applied to a practical problem with joints through a very narrow aperture.","PeriodicalId":376960,"journal":{"name":"2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132709314","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Modal S-Parameter Estimation of EUT Connection of Conducted Disturbance Measurement System 传导扰动测量系统EUT连接的模态s参数估计
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE) Pub Date : 2018-08-01 DOI: 10.1109/EMCEUROPE.2018.8485119
I. Wu, S. Ishigami, K. Gotoh, Y. Matsumoto
{"title":"Modal S-Parameter Estimation of EUT Connection of Conducted Disturbance Measurement System","authors":"I. Wu, S. Ishigami, K. Gotoh, Y. Matsumoto","doi":"10.1109/EMCEUROPE.2018.8485119","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2018.8485119","url":null,"abstract":"A method to determine the modal S-parameters of the input / output ports of the equipment under test (EUT) connection of the conducted disturbance measurement system is investigated. Since the structure of the input terminal of the EUT connection is AC power plug itself, the modal S-parameter at the input port of the EUT connection cannot be measured directly with a vector network analyzer (VNA). To measure the modal S-parameter, the EUT connection needs to be measured through the AC-SMA adapter. In order to remove the effect of the AC-SMA adapter and estimate the unknown modal S-parameter of the EUT connection, the EUT connection with AC-SMA adapter is terminated with open, short and $50 Omega$ matching. From these measurement results, the modal S-parameters of input / output ports of the EUT connection are estimated. As a result, the modal S-parameters of the input / output ports are quite different. Therefore, the influence of the modal S-parameter due to the difference in the structure of the input / output ports of the EUT connection cannot be ignored.","PeriodicalId":376960,"journal":{"name":"2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134049746","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Emission Measurement of a Solar Park in the Frequency Range of 2 to 150 kHz 2 ~ 150khz频率范围内太阳能公园的发射测量
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE) Pub Date : 2018-08-01 DOI: 10.1109/EMCEUROPE.2018.8485049
András Mohos, J. Ladányi
{"title":"Emission Measurement of a Solar Park in the Frequency Range of 2 to 150 kHz","authors":"András Mohos, J. Ladányi","doi":"10.1109/EMCEUROPE.2018.8485049","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2018.8485049","url":null,"abstract":"Although a few years have passed since the first electromagnetic compatibility problems occurred in the frequency range of 2 to 150 kHz, but we still lack fundamental standards, especially related to emission, that would ensure electromagnetic compatibility. Our aim was to get a better picture about the emission of a solar inverter and also about how disturbances generated by more inverters spread and aggregate on the grid. Thus, based on on-site measurements, this paper investigates the non-intentional supraharmonic emission (both current and voltage) of a solar park that consists of a total of 50 individual PV (photovoltaic) modules and inverters. Supraharmonic voltages and currents were measured at three locations: at one individual PV unit, at a busbar collecting the production of ten PV units and at the transformer, which connects the park with the grid. It was shown that the aggregation of these disturbances is a very complex process, but supraharmonic currents are more likely to flow between the inverters than into the grid. Another important result is that an alteration in production does not significantly change emission levels.","PeriodicalId":376960,"journal":{"name":"2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117109999","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Analysis and Mitigation of EMC Effects of Electric Resonances in Circuits 电路中电谐振对电磁兼容影响的分析与抑制
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE) Pub Date : 2018-08-01 DOI: 10.1109/EMCEUROPE.2018.8485123
Matteo Bertocco, A. Sona
{"title":"Analysis and Mitigation of EMC Effects of Electric Resonances in Circuits","authors":"Matteo Bertocco, A. Sona","doi":"10.1109/EMCEUROPE.2018.8485123","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2018.8485123","url":null,"abstract":"In the paper the LC resonance issue is addressed. An approach is discussed based on normalized parameters modeling the conditions under which detrimental EMC resonance effects may occur. The analysis starts from a case-study circuit, where closed-form expressions are derived together with normalized figures of merit. Then, a meaningful example is provided showing that spectral phenomena possibly leading to fail of EMC compliance may be due to resonance with very high-order harmonic frequencies. The proposed approach enable a quick understanding of the effects of the involved circuit parameters, and hence provide a designer a method for troubleshooting and resolution of resonance issues.","PeriodicalId":376960,"journal":{"name":"2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)","volume":"133 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122767491","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Development of Human Body Impedance Equivalent Circuit for Contact Current Measurement 接触电流测量人体阻抗等效电路的研制
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE) Pub Date : 2018-08-01 DOI: 10.1109/EMCEUROPE.2018.8485043
Y. Kamimura, Soma Inagaki, K. Wake
{"title":"Development of Human Body Impedance Equivalent Circuit for Contact Current Measurement","authors":"Y. Kamimura, Soma Inagaki, K. Wake","doi":"10.1109/EMCEUROPE.2018.8485043","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2018.8485043","url":null,"abstract":"This study develops of a human body impedance equivalent circuit for contact current measurements. Experiments are conducted to measure the human body impedance of 19 adult men in the frequency range of 40 Hz to 10 MHz. The 10th and 50th percentile values are obtained. A circuit with optimal component values is built and its frequency characteristics are compared to those of measured values. Although resonance appeared at frequencies of > 15 MHz, the results confirm that the frequency characteristics of the proposed equivalent circuit match those of the human body.","PeriodicalId":376960,"journal":{"name":"2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE)","volume":"05 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128695009","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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