Simulation Methodology of Radiated Emission for IC Stripline Measurements

Abstract

A simulation methodology is proposed to simulate the radiated emission of an integrated circuit, based on the IC stripline method. Since several years, the development of ICs for in-vehicle networks is going from relatively low frequency controller area network (CAN) and local interconnect network (LIN) applications towards higher frequency ethernet applications. Due to higher frequencies and the strict requirements on EMC for automotive applications there is a need to predict the radiated emission performance of ICs on circuit and system level. For this reason, a simulation flow and methodology has been developed to be able to predict the radiated emission that originates from a single IC. The novel methodology has been validated with simple test structures and with measurements in an IC stripline of an ethernet switch application IC.