{"title":"A Multi-Axial Thermo-Mechanical Fatigue Tester for Electronic Packaging Materials","authors":"Minfu Lu, Sheng Liu","doi":"10.1115/imece1996-0894","DOIUrl":"https://doi.org/10.1115/imece1996-0894","url":null,"abstract":"\u0000 A multi-axial thermo-mechanical mini-fatigue tester has been developed at Wayne State University for investigating the behaviors of small specimens, particularly in the field of electronic packaging materials and structures. The testing and calibration of machine is described in this paper. Materials tested include a copper wire, two kinds of polyimide films, a lead-free solder alloy.","PeriodicalId":375055,"journal":{"name":"Sensing, Modeling and Simulation in Emerging Electronic Packaging","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130318248","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Cure Kinetics for Conductive Adhesives","authors":"Y. Mei, Sean X. Wu, C. Yeh","doi":"10.1115/imece1996-0886","DOIUrl":"https://doi.org/10.1115/imece1996-0886","url":null,"abstract":"\u0000 Conductive adhesives as solder replacement play more and more important role in surface-mounting technology. The magnitude and duration of cure cycle temperature significantly influence the final physical and mechanical properties of the joints. Therefore, a knowledge of the reaction kinetics is essential for relating the physical properties to the extent of reaction of the system. A series of isothermal tests was processed, and the experimentally obtained results were checked against the proposed kinetic model. A modified kinetic model is proposed to describe the rate of degree of cure, and a good agreement was found between modeling and test results.","PeriodicalId":375055,"journal":{"name":"Sensing, Modeling and Simulation in Emerging Electronic Packaging","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126154076","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Curing Analysis of a Flip-Chip-on-Board Electronic Package","authors":"Wenjie Zheng","doi":"10.1115/imece1996-0885","DOIUrl":"https://doi.org/10.1115/imece1996-0885","url":null,"abstract":"\u0000 A curing analysis of a Flip-Chip-On-Board (FCOB) assembly is reported in this paper. It is very important to understand the curing process of the FCOB assembly because a good curing scheme may obtain full mechanical and thermal properties of the epoxy. In order to do numerical simulations of the curing process, it is essential to establish the cure kinetic equations of the epoxy. Differential Scanning Calorimetry (DSC) tests were performed to collect experimental data. It was shown that the cure reaction satisfies the Arrhenius relation. It also was verified experimentally that the chemical curing reaction may be incomplete at lower isothermal cure temperatures. Various cure kinetic equations were used to fit the experimental cure data. The results show that the kinetic equations can be used to predict other DSC experiments quite well.\u0000 Two FEM models of the FCOB assembly, associated with the two different curing schemes, were analyzed by use of the FEM software ABAQUS. The cure kinetic equations were implemented in a user subroutine to update the heat generation due to the chemical reaction of the epoxy. Due to the part’s thinness, the results show that both the temperature and the degree of cure are distributed very uniformly over the FCOB assembly in the whole curing process, and that the history responses are almost independent of the sizes of the models. It is also proved numerically that the proposed curing scheme is better in that it may have the epoxy more fully cured.","PeriodicalId":375055,"journal":{"name":"Sensing, Modeling and Simulation in Emerging Electronic Packaging","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130996794","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Thermal Management in Direct Chip Attach Assemblies","authors":"D. Baldwin, J. T. Beerensson, S. Sitaraman","doi":"10.1115/1.2793844","DOIUrl":"https://doi.org/10.1115/1.2793844","url":null,"abstract":"\u0000 Direct chip attach packaging technologies are finding increasing application in electronics manufacturing particularly in telecommunications and consumer electronics. In these systems, bare die with bumped interconnect bond pads are assembled in a flip chip configuration (i.e., active face down) directly to low-cost organic substrates. In this work, the thermal management of three direct chip attach technologies is investigated. Experimental measurements are conducted exploring the junction-to-ambient thermal resistance and thermal dissipation path for the three interconnect technologies which include solder attach, anisotropic adhesive attach, and isotropic adhesive attach. A first order chip-scale thermal design model is developed for flip chip assemblies exhibiting good agreement with the experimental measurements.","PeriodicalId":375055,"journal":{"name":"Sensing, Modeling and Simulation in Emerging Electronic Packaging","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134277614","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Flow Modeling of Wire Sweep in Transfer Molding","authors":"X. Chen, Kathy S. Lee, M. Yuen, P. Tong","doi":"10.1115/imece1996-0890","DOIUrl":"https://doi.org/10.1115/imece1996-0890","url":null,"abstract":"\u0000 Transfer molding is one of the most widely used process for encapsulating integrated circuits. Wire sweep is becoming a critical process defect in the era of miniaturization of electronic products. This is because wire sweep can cause electrical short as integrated circuit lead count increases which leads to reducing wire pitches. Common practices in predicting wire sweeps in encapsulation calculate first the flow in the cavity without wires. The drag force on the wires is then calculated based on the local velocity using the flow drag relationship of flow in an infinite medium. Recent experimental result has shown that wire density had a strong influence on wire sweep. This paper describes both an empirical prediction and a stokes flow analysis of flow wire interaction on wire sweep. The analysis determined the flow induced loads on the wires for different wire shapes, spacing, and locations from the wall.","PeriodicalId":375055,"journal":{"name":"Sensing, Modeling and Simulation in Emerging Electronic Packaging","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-11-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115510311","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}