传递成型中扫丝的流动建模

X. Chen, Kathy S. Lee, M. Yuen, P. Tong
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引用次数: 2

摘要

传递成型是应用最广泛的集成电路封装工艺之一。在电子产品小型化的时代,钢丝扫描正成为一个关键的工艺缺陷。这是因为当集成电路引线数增加时,导线扫描会导致电气短路,从而导致导线间距减小。预测封装中导线扫描的常用方法首先计算无导线腔内的流动。然后利用无限大介质中流动的流动阻力关系,根据局部速度计算导线上的阻力。最近的实验结果表明,金属丝密度对金属丝扫描有很大的影响。本文对钢丝扫流时的流丝相互作用进行了经验预测和斯托克斯流分析。分析确定了不同金属丝形状、间距和距离壁面位置下金属丝上的流动诱导载荷。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Flow Modeling of Wire Sweep in Transfer Molding
Transfer molding is one of the most widely used process for encapsulating integrated circuits. Wire sweep is becoming a critical process defect in the era of miniaturization of electronic products. This is because wire sweep can cause electrical short as integrated circuit lead count increases which leads to reducing wire pitches. Common practices in predicting wire sweeps in encapsulation calculate first the flow in the cavity without wires. The drag force on the wires is then calculated based on the local velocity using the flow drag relationship of flow in an infinite medium. Recent experimental result has shown that wire density had a strong influence on wire sweep. This paper describes both an empirical prediction and a stokes flow analysis of flow wire interaction on wire sweep. The analysis determined the flow induced loads on the wires for different wire shapes, spacing, and locations from the wall.
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