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International Journal on Intelligent Electronic Systems最新文献

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ANALYSIS OF CLUSTER DIMENSION AND MORPHOLOGY OF ROOM TEMPERATURE GROWN NANOCARBON USING CATHODIC ARC AND ITS INFLUENCE ON FIELD ASSISTED ELECTRON EMISSION 阴极电弧室温生长纳米碳簇维数和形貌分析及其对场辅助电子发射的影响
International Journal on Intelligent Electronic Systems Pub Date : 2008-07-01 DOI: 10.18000/IJIES.30021
S. Niranjana, De Shounak, V. Moorthy, U. Niranjan, B. Satyanarayana
{"title":"ANALYSIS OF CLUSTER DIMENSION AND MORPHOLOGY OF ROOM TEMPERATURE GROWN NANOCARBON USING CATHODIC ARC AND ITS INFLUENCE ON FIELD ASSISTED ELECTRON EMISSION","authors":"S. Niranjana, De Shounak, V. Moorthy, U. Niranjan, B. Satyanarayana","doi":"10.18000/IJIES.30021","DOIUrl":"https://doi.org/10.18000/IJIES.30021","url":null,"abstract":"Low temerpatuere grown nanocluster carbon thin films grown using a continuous cathodic arc process at room temperature are found to be interesting material for wide range of and nanoelectronic application. Reported is the study of the influence of background gases such as helium and nitrogen on the nanoclsuter dimension and morphology and a possible influence of the -4 same to field assisted electron emission properties. The Helium partial pressure was changed from 5x10 to 50 Torr under two -4 -3 different nitrogen partial pressure conditions namely 1x10 Torr and 1x10 Torr respectively. Raman and SEM data for these samples were used to estimate the cluster dimension structural and morphological properties. The surface morphology of the films grown, varied from atomic smooth surface to clusters with varying sizes (50–200 nm). A methodology for the estimation of cluster dimension from the Raman data was established and the estimated data compared with dimensions derived from SEM images. Effort was made to look at the possible correlation of between process parameters, estimated parameters and field assisted electron emission data. The curve fitting analysis and the observed correlation, indicates possibility of establishing Raman Spectroscopy as an instantaneous characterization approach for the evaluation of nanocarbons.","PeriodicalId":368328,"journal":{"name":"International Journal on Intelligent Electronic Systems","volume":"295 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116224314","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
A COMPARATIVE ANALYSIS OF MRAS BASED AND EXTENDED KALMAN FILTER BASED SENSORLESS VECTOR CONTROL OF INDUCTION MOTOR DRIVES 基于mras和基于扩展卡尔曼滤波的感应电机无传感器矢量控制的比较分析
International Journal on Intelligent Electronic Systems Pub Date : 1900-01-01 DOI: 10.18000/IJIES.30064
Rashmi M.P, S. Rajapandian, S. Devegowda
{"title":"A COMPARATIVE ANALYSIS OF MRAS BASED AND EXTENDED KALMAN FILTER BASED SENSORLESS VECTOR CONTROL OF INDUCTION MOTOR DRIVES","authors":"Rashmi M.P, S. Rajapandian, S. Devegowda","doi":"10.18000/IJIES.30064","DOIUrl":"https://doi.org/10.18000/IJIES.30064","url":null,"abstract":"","PeriodicalId":368328,"journal":{"name":"International Journal on Intelligent Electronic Systems","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125195420","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
STUDY AND ANALYSIS OF DEFECT AMPLIFICATION INDEX IN TECHNOLOGY VARIANT BUSINESS APPLICATION DEVELOPMENT THROUGH FAULT INJECTION PATTERNS 通过故障注入模式研究和分析技术变体业务应用开发中的缺陷放大指数
International Journal on Intelligent Electronic Systems Pub Date : 1900-01-01 DOI: 10.18000/IJIES.30068
.P MohammedShareef, S. Ravichandran, S. Balasubramaniam
{"title":"STUDY AND ANALYSIS OF DEFECT AMPLIFICATION INDEX IN TECHNOLOGY VARIANT BUSINESS APPLICATION DEVELOPMENT THROUGH FAULT INJECTION PATTERNS","authors":".P MohammedShareef, S. Ravichandran, S. Balasubramaniam","doi":"10.18000/IJIES.30068","DOIUrl":"https://doi.org/10.18000/IJIES.30068","url":null,"abstract":"The experiment was primarily undertaken to analyse software system behaviour in the presence of defects to enable proactive and cost effective preventive measures. This paper defines the experiments that have been conducted by Trimentus Technologies (Trimentus) on Fault Injection modelling: Explanation of Fault Injection modelling and its benefits Results proposed out of the experiment conducted Trimentus Technologies’ approach towards fault injection experiments Implementation methodology followed Actual inferences arrived at subsequent to analysis of results Benefits accrued as a result of the study This experiment was conducted as a part of Trimentus’s Einstein Research Laboratory (ERL) initiatives.","PeriodicalId":368328,"journal":{"name":"International Journal on Intelligent Electronic Systems","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127077514","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
FIN-FET TECHNOLOGY FOR ULTRA LOW POWER DESIGN 超低功耗设计的鳍状场效应技术
International Journal on Intelligent Electronic Systems Pub Date : 1900-01-01 DOI: 10.18000/IJIES.30119
Shivani Kothari
{"title":"FIN-FET TECHNOLOGY FOR ULTRA LOW POWER DESIGN","authors":"Shivani Kothari","doi":"10.18000/IJIES.30119","DOIUrl":"https://doi.org/10.18000/IJIES.30119","url":null,"abstract":"","PeriodicalId":368328,"journal":{"name":"International Journal on Intelligent Electronic Systems","volume":"143 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123279703","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Design and performance evaluation Of three phase induction motor using Optimization techniques and genetic algorithms 基于优化技术和遗传算法的三相异步电动机设计与性能评价
International Journal on Intelligent Electronic Systems Pub Date : 1900-01-01 DOI: 10.18000/IJIES.30048
A. Krishnamoorthy, K. Dharmalingam
{"title":"Design and performance evaluation Of three phase induction motor using Optimization techniques and genetic algorithms","authors":"A. Krishnamoorthy, K. Dharmalingam","doi":"10.18000/IJIES.30048","DOIUrl":"https://doi.org/10.18000/IJIES.30048","url":null,"abstract":"Optimization is usually done for any one of the functions associated with a system. In design problems usually a single objective function (say, Cost, Efficiency, Volume of Material used, Starting Current etc.) will be identified, which shall include the constraints imposed on the system also. Optimization can also be carried out with multiple objectives (say, Cost & Efficiency, Volume of Material & Stress handling capacity etc.), in which case, the problem becomes multi – objective programming problem and it can be solved by constructing an overall objective function as a linear combination of multiple objective functions. A research work is under progress on “Design and Performance Evaluation of Three Phase Induction Motor using Optimization Techniques and Genetic Algorithms”, which aims at developing a software, which upon providing minimum basic input data about the machine (such as overall dimensions, specification constraints etc) to be designed, designs the various parameters ably supported with suitable optimization techniques, to obtain an optimized end result. Induction motor design optimization is a problem in non-linear programming solved by the method of Sequential Unconstrained Minimization Technique (SUMT). Design Optimization is to be carried out using Hooke and Jeeves method of optimization and also using Genetic Algorithms.","PeriodicalId":368328,"journal":{"name":"International Journal on Intelligent Electronic Systems","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123436852","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Application of Programmable Logic Devices In Safety Systems 可编程逻辑器件在安全系统中的应用
International Journal on Intelligent Electronic Systems Pub Date : 1900-01-01 DOI: 10.18000/IJIES.30002
S. Sambasivan, M. K. Misra
{"title":"Application of Programmable Logic Devices In Safety Systems","authors":"S. Sambasivan, M. K. Misra","doi":"10.18000/IJIES.30002","DOIUrl":"https://doi.org/10.18000/IJIES.30002","url":null,"abstract":"The evolution of Microelectronics has made the application of Programmable Logic Devices (PLDs) inevitable in modern digital circuit designs and when they are deployed in Safety Systems, their Reliability and Safety need to be proved beyond doubt. The design will have to meet the stringent requirements. This paper provides a review of commercially available PLDs and the design methodologies to be adopted while deploying them in safety systems.","PeriodicalId":368328,"journal":{"name":"International Journal on Intelligent Electronic Systems","volume":"33 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116743373","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
DESIGN OF LOGIC GATES USING TOP GATED CARBON NANOTUBE FIELD EFFECT TRANSISTOR 顶门控碳纳米管场效应晶体管逻辑门的设计
International Journal on Intelligent Electronic Systems Pub Date : 1900-01-01 DOI: 10.18000/IJIES.30096
Sridevi, T. Jayanthy
{"title":"DESIGN OF LOGIC GATES USING TOP GATED CARBON NANOTUBE FIELD EFFECT TRANSISTOR","authors":"Sridevi, T. Jayanthy","doi":"10.18000/IJIES.30096","DOIUrl":"https://doi.org/10.18000/IJIES.30096","url":null,"abstract":"","PeriodicalId":368328,"journal":{"name":"International Journal on Intelligent Electronic Systems","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128627694","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
ENERGY CONSIDERATION IN METAL MACHINING 金属加工中的能量考虑
International Journal on Intelligent Electronic Systems Pub Date : 1900-01-01 DOI: 10.18000/IJIES.30142
S. Desai, Swamini Chopra, R. Pawade
{"title":"ENERGY CONSIDERATION IN METAL MACHINING","authors":"S. Desai, Swamini Chopra, R. Pawade","doi":"10.18000/IJIES.30142","DOIUrl":"https://doi.org/10.18000/IJIES.30142","url":null,"abstract":"We cannot say that present day machining processes are clean. Current trends in the manufacturing sector will not be acceptable in the future. This will an arise need for extensive research and development work necessary to meet the environmental concern. Although research on promising green energy technologies manage to supply partially for current machining systems; the high energy-efficient machining systems that demand less energy remain important and highly desirable. The energy-efficient machining system requires a comprehensive understanding as well as optimization of energy consumption. This paper focuses upon the energy requirement during actual metal machining. The first part explains about the basics of energy in machining and the flow of energy in a production line. In the later part, two energy models are described that shows dependence of energy consumption in machining process upon the operating parameters and set-up parameters. Effects of these different parameters on specific energy consumption are also summarized. Finally, a brief introduction to few energy optimization techniques is given.","PeriodicalId":368328,"journal":{"name":"International Journal on Intelligent Electronic Systems","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124659325","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Sensor Fault Diagnosis in State Feedback Systems using Artificial Neural Networks 基于人工神经网络的状态反馈系统传感器故障诊断
International Journal on Intelligent Electronic Systems Pub Date : 1900-01-01 DOI: 10.18000/IJIES.30010
V. Manikandan, K. Ramakrishan, N. Devarajan, C. K. Babu, R. VenkatateswaraBhupathi
{"title":"Sensor Fault Diagnosis in State Feedback Systems using Artificial Neural Networks","authors":"V. Manikandan, K. Ramakrishan, N. Devarajan, C. K. Babu, R. VenkatateswaraBhupathi","doi":"10.18000/IJIES.30010","DOIUrl":"https://doi.org/10.18000/IJIES.30010","url":null,"abstract":"A simulation before test method for fault diagnosis and classification towards sensor fault in linear time invariant state feed back system is presented in this paper. The novelty of the approach lies in associating with each state feedback gain factor a scalar , which is defined as the sensor healthiness factor. This scalar is made to vary from 1 (no fault condition) to 0 (full fault condition) in predetermined steps. The intermediate values of portray the deterioration modes of the sensor. The Integral Square Error (ISE) criterion is employed for extracting the signature of the fault and the classification is done using Artificial Neural Network (ANN) classifier. The proposed diagnosis approach is applied to a dc motor system to validate the effectiveness of the technique.program inspections, static & dynamic analysis and V&V techniques","PeriodicalId":368328,"journal":{"name":"International Journal on Intelligent Electronic Systems","volume":"101 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116347538","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
MONITORING NETWORK MANAGEMENT USING CLIENT/SERVER PERFORMANCE 使用客户机/服务器性能监视网络管理
International Journal on Intelligent Electronic Systems Pub Date : 1900-01-01 DOI: 10.18000/IJIES.30054
Vallinayagi, K. Sujatha
{"title":"MONITORING NETWORK MANAGEMENT USING CLIENT/SERVER PERFORMANCE","authors":"Vallinayagi, K. Sujatha","doi":"10.18000/IJIES.30054","DOIUrl":"https://doi.org/10.18000/IJIES.30054","url":null,"abstract":"","PeriodicalId":368328,"journal":{"name":"International Journal on Intelligent Electronic Systems","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121480313","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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