Proceedings of IEEE International Conference on Computer Aided Design (ICCAD)最新文献

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Optimal wire sizing and buffer insertion for low power and a generalized delay model 低功耗和广义延迟模型的最优导线尺寸和缓冲器插入
Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) Pub Date : 1995-12-01 DOI: 10.1109/ICCAD.1995.480004
J. Lillis, Chung-Kuan Cheng, Ting-Ting Y. Lin
{"title":"Optimal wire sizing and buffer insertion for low power and a generalized delay model","authors":"J. Lillis, Chung-Kuan Cheng, Ting-Ting Y. Lin","doi":"10.1109/ICCAD.1995.480004","DOIUrl":"https://doi.org/10.1109/ICCAD.1995.480004","url":null,"abstract":"We present efficient, optimal algorithms for timing optimization by discrete wire sizing and buffer insertion. Our algorithms are able to minimize dynamic power dissipation subject to given timing constraints. In addition, we compute the complete power-delay tradeoff curve for added flexibility. We extend our algorithm to take into account the effect of signal slew on buffer delay which can contribute substantially to overall delay. The effectiveness of these methods is demonstrated experimentally.","PeriodicalId":367501,"journal":{"name":"Proceedings of IEEE International Conference on Computer Aided Design (ICCAD)","volume":"134 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115092109","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 318
Acceleration techniques for dynamic vector compaction 动态矢量压缩的加速技术
Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) Pub Date : 1995-12-01 DOI: 10.1109/ICCAD.1995.480134
A. Raghunathan, S. Chakradhar
{"title":"Acceleration techniques for dynamic vector compaction","authors":"A. Raghunathan, S. Chakradhar","doi":"10.1109/ICCAD.1995.480134","DOIUrl":"https://doi.org/10.1109/ICCAD.1995.480134","url":null,"abstract":"We present several techniques for accelerating dynamic vector compaction for combinational and sequential circuits. A key feature of all our techniques is that they significantly improve the computation times without adversely affecting the quality of test sets that can be derived using state-of-the-art compaction methods. Our techniques are based on three key ideas: (1) identification of support sets, (2) target fault switching, and (3) use of dynamic equivalent and untestable fault analysis, All these techniques are useful in significantly reducing the number of faults that have to be considered by a test generator or a fault simulator in a dynamic vector compaction system. For fault simulation, support sets quickly identify a large subset of faults that are guaranteed to be undetectable by a given input sequence. For test generation, support sets identify a large subset of faults that are guaranteed to be undetectable by any extension of a partially specified test sequence. Experimental results on ISCAS 89 benchmark circuits and large production VLSI circuits are included. For full scan designs, our acceleration techniques reduce the overall computation times by a factor of 2 to 3 without adversely affecting the quality (size) of the computed test sets or their fault coverages. The improvement factors obtained are higher for larger circuits. The acceleration techniques enabled the computation of compact test sets for large production circuits that the base test generation system was unable to process in more than 2 CPU days on a Silicon Graphics MIPS 4400 workstation. Results for sequential circuits also show that our acceleration techniques significantly improve the computation times for dynamic vector compaction.","PeriodicalId":367501,"journal":{"name":"Proceedings of IEEE International Conference on Computer Aided Design (ICCAD)","volume":"148 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115193875","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 30
Statistical estimation of sequential circuit activity 顺序电路活动的统计估计
Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) Pub Date : 1995-12-01 DOI: 10.1109/ICCAD.1995.479882
T. Chou, K. Roy
{"title":"Statistical estimation of sequential circuit activity","authors":"T. Chou, K. Roy","doi":"10.1109/ICCAD.1995.479882","DOIUrl":"https://doi.org/10.1109/ICCAD.1995.479882","url":null,"abstract":"In this paper, we present a Monte Carlo based technique to estimate signal activity at the internal nodes of sequential logic circuits. The technique takes spatial and temporal correlations of logic signals into consideration. The Monte Carlo based techniques that have been proposed for combinational circuits can not be directly applied to sequential circuits due to the initial transient problem. The proposed approach deals with this problem by gaining insight from Markov chain theory. Experimental results show that the error (%) of estimated activity of individual nodes is within 3% in comparison to that of long run simulation results.","PeriodicalId":367501,"journal":{"name":"Proceedings of IEEE International Conference on Computer Aided Design (ICCAD)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128362074","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 58
Logic decomposition during technology mapping 技术映射期间的逻辑分解
Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) Pub Date : 1995-12-01 DOI: 10.1109/ICCAD.1995.480022
E. Lehman, Yosinori Watanabe, J. Grodstein, H. Harkness
{"title":"Logic decomposition during technology mapping","authors":"E. Lehman, Yosinori Watanabe, J. Grodstein, H. Harkness","doi":"10.1109/ICCAD.1995.480022","DOIUrl":"https://doi.org/10.1109/ICCAD.1995.480022","url":null,"abstract":"A problem in technology mapping is that quality of the final implementation depends significantly on the initially provided circuit structure. To resolve this problem, conventional techniques iteratively but separately apply technology independent transformations and technology mapping. In this paper, we propose a procedure which performs logic decomposition and technology mapping simultaneously. We show that the procedure effectively explores all possible algebraic decompositions. It finds an optimal tree implementation over all the circuit structures examined, while the run time is typically logarithmic in the number of decompositions.","PeriodicalId":367501,"journal":{"name":"Proceedings of IEEE International Conference on Computer Aided Design (ICCAD)","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128952269","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 134
Activity-driven clock design for low power circuits 低功耗电路的活动驱动时钟设计
Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) Pub Date : 1995-12-01 DOI: 10.1109/ICCAD.1995.479992
G. Téllez, A. Farrahi, M. Sarrafzadeh
{"title":"Activity-driven clock design for low power circuits","authors":"G. Téllez, A. Farrahi, M. Sarrafzadeh","doi":"10.1109/ICCAD.1995.479992","DOIUrl":"https://doi.org/10.1109/ICCAD.1995.479992","url":null,"abstract":"In this paper we investigate activity-driven clock trees to reduce the dynamic power consumption of synchronous digital CMOS circuits. Sections of an activity-driven clock tree can be turned on/off by gating the clock signals during the active/idle times of the clocked elements. We propose a method of obtaining the switching activity patterns of the clocked circuits during the high level design process. We formulate three novel activity-driven problems. The objective of these problems is to minimize system's dynamic power consumption. We propose an approximation algorithm based on recursive matching to solve the clock tree construction problem. We solve the gate insertion problems with an exact algorithm employing the dynamic programming paradigm. Finally, we present experimental results that verify the effectiveness of our approach. Our work in this paper is a step in understanding how high level decisions (e.g. behavioral design) can affect a low level design (e.g. clock design).","PeriodicalId":367501,"journal":{"name":"Proceedings of IEEE International Conference on Computer Aided Design (ICCAD)","volume":" 11","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120832851","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 132
System partitioning to maximize sleep time 系统分区以最大化睡眠时间
Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) Pub Date : 1995-12-01 DOI: 10.1109/ICCAD.1995.480155
A. Farrahi, M. Sarrafzadeh
{"title":"System partitioning to maximize sleep time","authors":"A. Farrahi, M. Sarrafzadeh","doi":"10.1109/ICCAD.1995.480155","DOIUrl":"https://doi.org/10.1109/ICCAD.1995.480155","url":null,"abstract":"Partitioning of a system to maximize exploitable sleep time for low-power synthesis is discussed. The motivation is to deactivate the memory refresh circuitry, apply power down or disable the clock signals during the inactive periods of operation of circuit elements, and thus minimize the power consumption. Since it is impractical to have a separate set of control signals for each circuit element (otherwise, the control itself would consume a lot of power), it is advisable to partition a circuit based on the activity patterns of its elements so that the partitions can be switched into sleep mode for long periods of time. In this paper, we formulate this partitioning problem and show that it is NP-hard. We present Geo-Part, a geometric partitioning heuristic for this problem. An efficient implementation of Geo-Part using segment tree data structure is discussed. Experimental results are encouraging.","PeriodicalId":367501,"journal":{"name":"Proceedings of IEEE International Conference on Computer Aided Design (ICCAD)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114359476","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 18
Communication synthesis for distributed embedded systems 分布式嵌入式系统的通信综合
Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) Pub Date : 1995-12-01 DOI: 10.1109/ICCAD.1995.480025
Ti-Yen Yen, W. Wolf
{"title":"Communication synthesis for distributed embedded systems","authors":"Ti-Yen Yen, W. Wolf","doi":"10.1109/ICCAD.1995.480025","DOIUrl":"https://doi.org/10.1109/ICCAD.1995.480025","url":null,"abstract":"Communication synthesis is an essential step in hardware-software co-synthesis: many embedded systems use custom communication topologies and the communication links are often a significant part of the system cost. This paper describes new techniques for the analysis and synthesis of the communication requirements of embedded systems during co-synthesis. Our analysis algorithm derives delay bounds on communication in the system given an allocation of messages to links. This analysis algorithm is used by our synthesis algorithm to choose the required communication links in the system and assign interprocess communication to the links. Experimental results show that our algorithm finds good communication architectures in small amounts of CPU time.","PeriodicalId":367501,"journal":{"name":"Proceedings of IEEE International Conference on Computer Aided Design (ICCAD)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124366665","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 204
Pseudo-random testing and signature analysis for mixed-signal circuits 混合信号电路的伪随机测试与特征分析
Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) Pub Date : 1995-12-01 DOI: 10.1109/ICCAD.1995.479999
Chen-Yang Pan, K. Cheng
{"title":"Pseudo-random testing and signature analysis for mixed-signal circuits","authors":"Chen-Yang Pan, K. Cheng","doi":"10.1109/ICCAD.1995.479999","DOIUrl":"https://doi.org/10.1109/ICCAD.1995.479999","url":null,"abstract":"In this paper, we address the problem of functional testing of mixed-signal circuits using pseudo-random patterns. By embedding the linear, time-invariant (LTI) analog circuit between a digital-to-analog converter (DAC) and an analog-to-digital converter (ADC), we can model the analog and converter circuitry as a digital LTI system and test it using the pseudo-random vectors. We give mathematical analysis and formulate the pseudo-random testing process as the linear transformation of a random process by the analog LTI device under test (DUT). We choose the first and the second moments of the transformed random process, which are closely related to the functionality of the DUT, as the signatures for fault detection. We show that such signatures can be estimated by proper arithmetic operations on the output responses of the DUT to the vectors generated by LFSRs. We illustrate and compare the effectiveness of several possible choices of signatures through analysis and experimental results of several circuits, in terms of their fault detection capabilities and the testing hardware requirements.","PeriodicalId":367501,"journal":{"name":"Proceedings of IEEE International Conference on Computer Aided Design (ICCAD)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131837389","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 37
Delay optimal partitioning targeting low power VLSI circuits 针对低功耗VLSI电路的延迟最优划分
Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) Pub Date : 1995-12-01 DOI: 10.1109/ICCAD.1995.480196
H. Vaishnav, Massoud Pedram
{"title":"Delay optimal partitioning targeting low power VLSI circuits","authors":"H. Vaishnav, Massoud Pedram","doi":"10.1109/ICCAD.1995.480196","DOIUrl":"https://doi.org/10.1109/ICCAD.1995.480196","url":null,"abstract":"In this paper, a delay optimal clustering/partitioning algorithm for minimizing the power dissipation of a circuit is proposed. Traditional approaches for delay optimal partitioning are based on Lawler's clustering algorithm that makes no attempt to explore alternative partitioning solutions that have the same delay but better power implementations. Our algorithm provides a formal mechanism which implicitly enumerates alternate partitionings and selects a partitioning that has the same delay but less power dissipation. For tree circuits, the proposed algorithm produces delay and power optimal partitioning whereas for non-tree circuits it produces delay optimal partitioning with significantly improved power dissipation.","PeriodicalId":367501,"journal":{"name":"Proceedings of IEEE International Conference on Computer Aided Design (ICCAD)","volume":"175 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132356508","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 27
Efficient orthonormality testing for synthesis with pass-transistor selectors 通管选择器合成的有效正交性测试
Proceedings of IEEE International Conference on Computer Aided Design (ICCAD) Pub Date : 1995-12-01 DOI: 10.1109/ICCAD.1995.480021
Michel Berkelaar, L. V. Ginneken
{"title":"Efficient orthonormality testing for synthesis with pass-transistor selectors","authors":"Michel Berkelaar, L. V. Ginneken","doi":"10.1109/ICCAD.1995.480021","DOIUrl":"https://doi.org/10.1109/ICCAD.1995.480021","url":null,"abstract":"This paper presents the mapping problem for pass transistor selector mapping, which has not been addressed before. Pass transistor synthesis is potentially important for semi- or full-custom design techniques, which are increasingly attracting attention. Pass transistors have the advantage that fewer transistors are needed, and that circuits with high fanin and small delay can be constructed. Technology mapping approaches in the existing literature cannot handle these selectors, due to the restriction of I-hot encoding of the control signals. We present a new algorithm to address this problem, which is based an the novel idea of a general Boolean Oracle. Our oracle is based on ATPG techniques, and compared to BDDs, the oracle has the advantage that failure to complete only affects optimization locally, and does not hinder optimization elsewhere in the logic. A limitation of BDDs is that it is difficult to complete the algorithm if a BDD grows too large. The experimental results show up to 82% improvement in transistor count for the MCNC combinatorial multi-level examples.","PeriodicalId":367501,"journal":{"name":"Proceedings of IEEE International Conference on Computer Aided Design (ICCAD)","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1995-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127620412","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
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