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2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)最新文献

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Assessing loaded reverberation chambers: calculating threshold metrics 评估负载混响室:计算阈值度量
2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446) Pub Date : 2003-10-14 DOI: 10.1109/ISEMC.2003.1236716
C.L. Holloway, D. Hill, J. Ladbury, T. Lammers
{"title":"Assessing loaded reverberation chambers: calculating threshold metrics","authors":"C.L. Holloway, D. Hill, J. Ladbury, T. Lammers","doi":"10.1109/ISEMC.2003.1236716","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236716","url":null,"abstract":"In this paper, we present two versions of a threshold metric of a loaded reverberation chamber. One metric is based on the chamber quality factor (Q), and the other is based on the volume of the loaded reverberation chamber. These metrics are baseline quantities that must be exceeded in order to have an effective reverberation chamber. We present an application of these metrics for the case of a reverberation chamber loaded with spheres composed of lossy materials.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114261544","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
A new test system for measurements of fast transients in passenger cars 一种测量乘用车快速瞬变特性的新型测试系统
2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446) Pub Date : 2003-10-14 DOI: 10.1109/ISEMC.2003.1236634
M. Kull, K. Feser, W. Kohler
{"title":"A new test system for measurements of fast transients in passenger cars","authors":"M. Kull, K. Feser, W. Kohler","doi":"10.1109/ISEMC.2003.1236634","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236634","url":null,"abstract":"In present and future passenger cars there is a trend to install more and more electric and electronic devices. Some of the new systems like active body control, electric brake systems and other high power devices have an increasing demand for electric power. High current and voltage peaks with corresponding disturbance can occur during switching of such devices. A new measuring system has been developed to get a better overview of the fast transients and their propagation on the wiring harness. There are several requirements in the automotive area the system has to cover. It must be able to withstand the immunity test with high field strengths and must not influence the measurements and the function of the electric and electronic devices of the car. Therefore several potential free voltage probes with optical data links are used. The whole system is battery supplied and of small size to be suitable for mobile use.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"84 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115747605","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Reflection loss in the case of plane waves impact on infinite absorbing slab
2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446) Pub Date : 2003-10-14 DOI: 10.1109/ISEMC.2003.1236676
M. Badic, M. Marinescu
{"title":"Reflection loss in the case of plane waves impact on infinite absorbing slab","authors":"M. Badic, M. Marinescu","doi":"10.1109/ISEMC.2003.1236676","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236676","url":null,"abstract":"The paper deals with the theory and measurement technique concerning the electromagnetic radiation reflected by a conductive or semiconductive absorbing shield placed in the Fraunhofer region, in connection with the shielding effectiveness equations. It is shown that actual modeling of reflection loss is not correct and a solution is proposed. Together with the demonstration of the correct equation describing the reflected wave authors propose an error analysis and a measuring method as application in EMC.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121407059","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Detecting the use of intentionally transmitting personal electronic devices onboard commercial aircraft 侦测在商用飞机上故意传送个人电子装置的使用
2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446) Pub Date : 2003-10-14 DOI: 10.1109/ISEMC.2003.1236603
R. Woods, J. Ely, L. Vahala
{"title":"Detecting the use of intentionally transmitting personal electronic devices onboard commercial aircraft","authors":"R. Woods, J. Ely, L. Vahala","doi":"10.1109/ISEMC.2003.1236603","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236603","url":null,"abstract":"The need to detect unauthorized usage of intentionally transmitting portable electronic devices (PEDs) onboard commercial aircraft is growing, while still allowing passengers to use selected unintentionally transmitting devices, such as laptop computers and CD players during non-critical stages of flight. The following paper presents an installed system for detecting PEDs over multiple frequency bands. Additionally, the advantages of a fixed verses mobile system are discussed. While data is presented to cover the frequency range of 20 MHz to 6.5 GHz, special attention was given to the Cellular/PCS bands as well as Bluetooth and the FRS radio bands. Measurement data from both the semi-anechoic and reverberation chambers are then analyzed and correlated with data collected on board a commercial aircraft to determine the dominant mode of coupling inside the passenger cabin of the aircraft versus distance from the source. As a final check of system feasibility, several PEDs' transmission signatures were recorded and compared with the expected levels.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129344076","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
An efficient finite element solution using a congruent transformation based model order reduction for interconnect simulation 基于同余变换的模型降阶互连仿真的有效有限元解
2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446) Pub Date : 2003-10-14 DOI: 10.1109/ISEMC.2003.1236701
Yingcai Xiao, E. Li
{"title":"An efficient finite element solution using a congruent transformation based model order reduction for interconnect simulation","authors":"Yingcai Xiao, E. Li","doi":"10.1109/ISEMC.2003.1236701","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236701","url":null,"abstract":"This paper presents an efficient method, which combine finite element method (FEM) and model order reduction (MOR) algorithm for the simulation and modeling of electromagnetic devices and systems over a broadband. In the application of this method, perfectly matched layer (PML) is applied with finite element method to solve unbounded region problem. A Krylov space based model order reduction method is used to reduce the order of model from FEM-PML. With the reduced model, it is available to achieve a fast frequency sweep result efficiently over broadband. By using the proposed method, the time consumption of simulation of interconnects over broadband can be reduced significantly without too much loss of accuracy.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"1999 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128257433","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Characterization of via holes discontinuities by means of numerical de-embedding 用数值去嵌入方法表征通孔不连续
2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446) Pub Date : 2003-10-14 DOI: 10.1109/ISEMC.2003.1236669
G. Antonini, A. Scogna, A. Orlandi
{"title":"Characterization of via holes discontinuities by means of numerical de-embedding","authors":"G. Antonini, A. Scogna, A. Orlandi","doi":"10.1109/ISEMC.2003.1236669","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236669","url":null,"abstract":"A method for de-embedding scattering parameters S of via hole in multilayer printed circuit board is presented. By assuming that the via hole is not electromagnetically coupled with the adjacent lines, the scattering parameters are evaluated starting from the calculation of the transfer scattering matrix T obtained by a three dimensional full wave analysis of the test structure. The numerical approach used to obtain S and T parameters has been validated by comparison with results computed by other independent numerical methods and measurements. The proposed methodology allows a computational time saving and gives useful results for a CAD modeling of via hole discontinuities.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116179389","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Investigation of potential resonances in CEMPIE-PEEC simulations of multilayered PCBs 多层pcb在cepie - peec模拟中的电位共振研究
2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446) Pub Date : 2003-10-14 DOI: 10.1109/ISEMC.2003.1236679
R. Araneo, S. Luan
{"title":"Investigation of potential resonances in CEMPIE-PEEC simulations of multilayered PCBs","authors":"R. Araneo, S. Luan","doi":"10.1109/ISEMC.2003.1236679","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236679","url":null,"abstract":"Accurate simulations of printed circuit boards (PCBs) with power bus are of concern to EMC engineers. Recently the new circuit extraction tool CEMPIE-PEEC has proved to be a robust method for full-wave numerical modeling of printed structures. Nevertheless some sharp odd resonances have been observed in the simulation of some structures. This paper tries to give insights into the reasons of these singularities through comparisons of the CEMPIE-PEEC results with integral - MoM - and differential - FDTD - full-wave methods.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126818361","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
The European EMC Directive - a comparison of existing and new requirements 欧洲EMC指令-现有要求和新要求的比较
2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446) Pub Date : 2003-10-14 DOI: 10.1109/ISEMC.2003.1236571
B. Jones
{"title":"The European EMC Directive - a comparison of existing and new requirements","authors":"B. Jones","doi":"10.1109/ISEMC.2003.1236571","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236571","url":null,"abstract":"A final draft of the revised European EMC Directive has now been published in the Official Journal of the European Communities. It is expected that the text will be agreed with few, if any, changes. This paper provides a comparison of existing and new requirements, topic by topic. It highlights the differences between the existing directive and this revision, explaining the impact on manufacturers and others placing products on the European market.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129080587","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
An analytical model for studying the electromagnetic radiation of power-bus structures 研究电力母线结构电磁辐射的解析模型
2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446) Pub Date : 2003-10-14 DOI: 10.1109/ISEMC.2003.1236596
T. Fischer, M. Leone, M. Albach
{"title":"An analytical model for studying the electromagnetic radiation of power-bus structures","authors":"T. Fischer, M. Leone, M. Albach","doi":"10.1109/ISEMC.2003.1236596","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236596","url":null,"abstract":"The electromagnetic radiation of multilayer boards due to power-bus noise is investigated for an idealized rectangular structure. The derivation of the far field is based on the field equivalence principle, using a lossy cavity model for the required boundary electric field distribution. The maximum electric field is studied within the frequency range 30 MHz-1 GHz. A parameter study shows that the distance between the planes is one of the most effective means for lowering radiated emissions.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117007788","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Impact on EMI profile due to monitor stand high frequency resonance effects 监测站高频共振效应对电磁干扰剖面的影响
2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446) Pub Date : 2003-10-14 DOI: 10.1109/ISEMC.2003.1236576
G. Thomason, V. Ivanov, R. Worley
{"title":"Impact on EMI profile due to monitor stand high frequency resonance effects","authors":"G. Thomason, V. Ivanov, R. Worley","doi":"10.1109/ISEMC.2003.1236576","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236576","url":null,"abstract":"Dell has developed a new method for analyzing the shielding effectiveness and high frequency resonance of different mechanical structures. This method utilizes the Spherical Radiating Standard (SRS) dipole antenna as a stable source, which is placed directly inside the mechanical structure (e.g., computer chassis or monitor stand). By utilizing such a method, quantifiable and repeatable emission measurements can be made when analyzing these different mechanical structures. The purpose of this study was to; 1) analyze the high frequency resonance effect of a monitor stand (MS) utilizing the SRS antenna: and 2) correlate these results with an actual real life setup (portable computer and port replicator inserted into MS).","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131262881","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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