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2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)最新文献

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Microelectronic integrated circuit design automation 微电子集成电路设计自动化
2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2016-06-01 DOI: 10.1109/EDM.2016.7538703
V. Gubkina, A. Rogulina
{"title":"Microelectronic integrated circuit design automation","authors":"V. Gubkina, A. Rogulina","doi":"10.1109/EDM.2016.7538703","DOIUrl":"https://doi.org/10.1109/EDM.2016.7538703","url":null,"abstract":"The automatized design supposed method is relating to elaboration of large-scale integration which is used in converter equipment. A selection believability rising of the optimal decision over a structure and arrangement of elements in a chip by the integration of sheet-oriented, system and logical levels in a design cycle now as a CMOS structures models introduction which is created in terms of layout geometry specific technological processes is become technical result.","PeriodicalId":353623,"journal":{"name":"2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"116 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116291166","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
PMSM analysis in dq axis at generator mode as the part of ISG 作为ISG的一部分，dq轴在发电机模式下的PMSM分析
2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2016-06-01 DOI: 10.1109/EDM.2016.7538794
A. N. Reshetnikov, S. V. Klassen
{"title":"PMSM analysis in dq axis at generator mode as the part of ISG","authors":"A. N. Reshetnikov, S. V. Klassen","doi":"10.1109/EDM.2016.7538794","DOIUrl":"https://doi.org/10.1109/EDM.2016.7538794","url":null,"abstract":"The integration of the internal combustion engine, the starter and the generator into a single power unit allows one to decrease significantly mass and outer dimensions of off-line systems. Analytical and graphical descriptions in dq axis at generator mode are given in this paper. The results of mathematical modeling are obtained.","PeriodicalId":353623,"journal":{"name":"2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125179697","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Insider threats to information security: Problem areas in neutralization 对信息安全的内部威胁:中和中的问题区域
2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2016-06-01 DOI: 10.1109/EDM.2016.7538710
B. Epifantsev, S. Zhumazhanova, P. Lozhnikov
{"title":"Insider threats to information security: Problem areas in neutralization","authors":"B. Epifantsev, S. Zhumazhanova, P. Lozhnikov","doi":"10.1109/EDM.2016.7538710","DOIUrl":"https://doi.org/10.1109/EDM.2016.7538710","url":null,"abstract":"Modern challenges require new productions in the field of information security problems. Topical issues to be addressed. Formulate possible approaches for the removal of these issues on the basis of DLP-systems, biometric identification systems.","PeriodicalId":353623,"journal":{"name":"2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127157938","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Electrostatic discharge protection in 250 nm BCD technology for multi-functional control integrated circuits for power converters 功率变换器多功能控制集成电路中250nm BCD技术的静电放电保护
2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2016-06-01 DOI: 10.1109/EDM.2016.7538776
M. S. Karpovich, Vasily D. Lys, K. E. Blum, V. Vasilyev
{"title":"Electrostatic discharge protection in 250 nm BCD technology for multi-functional control integrated circuits for power converters","authors":"M. S. Karpovich, Vasily D. Lys, K. E. Blum, V. Vasilyev","doi":"10.1109/EDM.2016.7538776","DOIUrl":"https://doi.org/10.1109/EDM.2016.7538776","url":null,"abstract":"This work is devoted to the designing and development of Electrostatic Discharge (ESD) Protection elements for Integrated Circuits in 250 nm BCD (Bipolar, CMOS, DMOS) mixed technology. ESD protection solution has been developed for Multi-Functional Control ICs dedicated to the implementation in AC/DC and DC/DC Power Supply Units. This solution assumes using of different voltage domains and based on current diversion with the use of different protective elements (CLAMP). According to the simulation performed, ESD protection solution shows 2000 V protection in MFC IC developed according to above mentioned IC technology.","PeriodicalId":353623,"journal":{"name":"2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"588 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125249397","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Charge characteristics of lithium-ion accumulators under different voltages 不同电压下锂离子蓄电池的充电特性
2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2016-06-01 DOI: 10.1109/EDM.2016.7538782
Sergey V. Kuchak, A. Voroshilov
{"title":"Charge characteristics of lithium-ion accumulators under different voltages","authors":"Sergey V. Kuchak, A. Voroshilov","doi":"10.1109/EDM.2016.7538782","DOIUrl":"https://doi.org/10.1109/EDM.2016.7538782","url":null,"abstract":"The paper deals with time diagrams of voltage and current of lithium-ion accumulators with LiFePO, cathode material, obtained by the different charge modes. The limits to determine the element state of charge by voltage value are marked out on the basis of the obtained results.","PeriodicalId":353623,"journal":{"name":"2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"69 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121673460","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Analysis of the peculiarities of using multielement photodetector devices for registration of infrared spectra 多元素光电探测器用于红外光谱配准的特点分析
2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2016-06-01 DOI: 10.1109/EDM.2016.7538750
N. Lysenko, V. G. Polovinkin
{"title":"Analysis of the peculiarities of using multielement photodetector devices for registration of infrared spectra","authors":"N. Lysenko, V. G. Polovinkin","doi":"10.1109/EDM.2016.7538750","DOIUrl":"https://doi.org/10.1109/EDM.2016.7538750","url":null,"abstract":"Analysis of the main peculiarities of using multielement photodetector devices (MEPD) in the composition of an IR spectrograph with a diffraction grating monochromator. The following can be referred to such peculiarities: nonlinear wavelength distribution over a photodetector device, differences in geometrical shift of beams in a cryostat window and differences interference lengths for each beam. It is shown with an example of the concrete device that deviation from the linearity at MEPD edges in the operation wavelength range reaches the value of the wavelength range coming for two elements; the geometrical shift difference ±25 mm, the change of interference length being +3 and -4 mm.","PeriodicalId":353623,"journal":{"name":"2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129056323","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Analysis of resonant converters at wide input voltage range 宽输入电压范围谐振变换器分析
2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2016-06-01 DOI: 10.1109/EDM.2016.7538789
S. Mikhalchenko, A. A. Stolyarova
{"title":"Analysis of resonant converters at wide input voltage range","authors":"S. Mikhalchenko, A. A. Stolyarova","doi":"10.1109/EDM.2016.7538789","DOIUrl":"https://doi.org/10.1109/EDM.2016.7538789","url":null,"abstract":"In this article LCC and LLC resonant converters are analyzed and compared as input inverter of the high voltage DC-DC converter operating at wide input voltage range. LLC converter was selected as the most proper for this application. The optimal operation of the LLC converter was considered and selected, the principles of selection of element's value LLC resonant tank was analyzed.","PeriodicalId":353623,"journal":{"name":"2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114209808","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
The chaos oscillator with inertial non-linearity based on a transistor structure with negative resistance 基于负阻晶体管结构的惯性非线性混沌振荡器
2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2016-06-01 DOI: 10.1109/EDM.2016.7538720
A. Semenov, A. Osadchuk, I. Osadchuk, K. Koval, M. Prytula
{"title":"The chaos oscillator with inertial non-linearity based on a transistor structure with negative resistance","authors":"A. Semenov, A. Osadchuk, I. Osadchuk, K. Koval, M. Prytula","doi":"10.1109/EDM.2016.7538720","DOIUrl":"https://doi.org/10.1109/EDM.2016.7538720","url":null,"abstract":"In the paper the results of theoretical and experimental researches of the chaos oscillator with inertial non-linearity based on a bipolar transistor structure with negative resistance are given. The dynamic processes in such oscillator are shown to be described with the Anishchenko-Astakhov mathematical model. Numerical simulation results are confirmed with experimental data.","PeriodicalId":353623,"journal":{"name":"2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124531094","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 26
Monte Carlo simulation of GaAs nanorings formation by droplet epitaxy 液滴外延形成砷化镓纳米晶的蒙特卡罗模拟
2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2016-06-01 DOI: 10.1109/EDM.2016.7538678
M. Vasilenko, N. Shwartz
{"title":"Monte Carlo simulation of GaAs nanorings formation by droplet epitaxy","authors":"M. Vasilenko, N. Shwartz","doi":"10.1109/EDM.2016.7538678","DOIUrl":"https://doi.org/10.1109/EDM.2016.7538678","url":null,"abstract":"Simulation of GaAs nanorings formation by droplet epitaxy was carried out using a kinetic lattice Monte Carlo model. Dependence of nanoring morphology on growth temperature, arsenic flux intensity and gallium drop surface density was demonstrated. The formation conditions for single, double and triple concentric rings were analyzed.","PeriodicalId":353623,"journal":{"name":"2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"166 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132512925","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Experimental investigation of the compensation method for increase of the noise stability of explosion detection EOS 提高爆炸探测系统噪声稳定性补偿方法的实验研究
2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2016-06-01 DOI: 10.1109/EDM.2016.7538754
A. Sidorenko, S. Lisakov, E. Sypin
{"title":"Experimental investigation of the compensation method for increase of the noise stability of explosion detection EOS","authors":"A. Sidorenko, S. Lisakov, E. Sypin","doi":"10.1109/EDM.2016.7538754","DOIUrl":"https://doi.org/10.1109/EDM.2016.7538754","url":null,"abstract":"The article describes features of use of a compensation method of optical noises suppression for the explosion detection electro-optical systems. Results of experimental investigation of compensation method efficiency are given.","PeriodicalId":353623,"journal":{"name":"2016 17th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132861741","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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