2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)最新文献_第2页

Research on integrated evaluation of military software supportability based on FAHP 基于FAHP的军事软件可保障性综合评价研究

2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS) Pub Date : 2016-10-01 DOI: 10.1109/ICRMS.2016.8050103

Wenjun Li, Xueqiang Yang, Jun Huang, Jing Huang, Yang Zhang

引用次数: 0

Reliability model for load-sharing k-out-of-n system and its numerical algorithms 负荷共享k-out- n系统可靠性模型及其数值算法

2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS) Pub Date : 2016-10-01 DOI: 10.1109/ICRMS.2016.8050060

Mingxi Cai, Guangyan Zhao, Yufeng Sun

引用次数: 0

Discussion of failure cases for contamination in electronics assembly process 电子装配过程中污染失效案例的探讨

2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS) Pub Date : 2016-10-01 DOI: 10.1109/ICRMS.2016.8050057

Fuyao Mo, W. Cai

{"title":"Discussion of failure cases for contamination in electronics assembly process","authors":"Fuyao Mo, W. Cai","doi":"10.1109/ICRMS.2016.8050057","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050057","url":null,"abstract":"Nowadays, with more and more functions of electronic products, an electronic product usually consists of thousands of electronic components, and the reliability of an electronic product is not only determined by the inherent reliability of each component, but is also closely related to the assembly technologies of these components. Soldering is an important process in electronics assembly technologies, and soldering flux is an essential part of it. To enhance the adaptability of products in various environments and protect the components on the printed circuit board (PCB), conformal coating is widely used in electronics assembly technologies. However, incorrect selection or use of these electronic auxiliary materials, it will usually cause a fatal failure in products instead of higher reliability, especially for the components with contact units. This paper will discuss several failure cases on relays, switches and potentiometers, which caused by contamination resulted from incorrect selection or use on electronic auxiliary materials. General ideas and basic methods for failure analysis will also be introduced while the discussion on failure cases. In the end, some helpful advices which would improve the reliability of electronics assembly processes are suggested.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115065064","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

System testability modeling and analysis based on device level failure mode effect and criticality analysis 基于设备级故障模式效应和临界性分析的系统可测试性建模与分析

2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS) Pub Date : 2016-10-01 DOI: 10.1109/ICRMS.2016.8050072

Xiaowei Yang, Hongqi Yang, Jinyong Huang, Zihao Fang

{"title":"System testability modeling and analysis based on device level failure mode effect and criticality analysis","authors":"Xiaowei Yang, Hongqi Yang, Jinyong Huang, Zihao Fang","doi":"10.1109/ICRMS.2016.8050072","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050072","url":null,"abstract":"The testability of equipment has become the key factor affecting equipment availability, and detracts from readiness and mission success. To overcome the current problems associated with the analysis of equipment testability, such as non-comprehensive failure mode coverage, low fault detection rate, and low fault location accuracy, this paper presents a system testability modeling and analysis method based on a summary of the results of device level failure mode effect and criticality analysis (FMECA), which is developed according to the failure data of components and a hardware impact analysis. In particular, we present a mathematical multi-signal model, quantitative methods and mathematical models of system testability, and the implementation processes of system testability modeling. The proposed method allows the failure modes of a module to be obtained accurately and comprehensively. By functioning at the device level, the method provides good fault location accuracy, and improves the authenticity of system testability analysis results. Finally, the testability of an actual electronic system is conducted using CARMES, which is a widely used reliability engineering software. The results verify the effectiveness and authenticity of the presented method, which can also provide a reference for the testability modeling and analysis of follow-up system design.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131066633","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Analog integrated circuits parameters online test system for accelerated test 模拟集成电路参数在线加速测试系统

2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS) Pub Date : 2016-10-01 DOI: 10.1109/ICRMS.2016.8050091

Jiaoying Huang, Can Cui, Cheng Gao, Xubo Lv

{"title":"Analog integrated circuits parameters online test system for accelerated test","authors":"Jiaoying Huang, Can Cui, Cheng Gao, Xubo Lv","doi":"10.1109/ICRMS.2016.8050091","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050091","url":null,"abstract":"The integrated operational amplifiers are widely used in the analog integrated circuits. The reliability of the devices, especially in changing temperature condition, affects the reliability of automation equipment. Accelerated test is a main method to assess electronic components' life. At present, there are some problems in parameters test systems. e.g., multiple devices can't be tested at the same time by the system. The devices are timing taken out of constant temperature drying to measure parameters, but the behavior by human often affects the test results. In high temperature conditions, it is impossible for the system to test devices online and analyze the test results. All above, an online test system of integrated operational amplifier, which is for accelerated test, was designed. Firstly, the design principle of the system was introduced. Secondly, the key modules and their roles in the system were described. In the end, the designed system was applied to assess the life for the integrated operational amplifier. It indicated that the system is able to test parameters for accelerated test. The number of the operational amplifiers can be changed. The test conditions are ambient temperature and accelerated test and so on.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"126 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127983382","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Study on the fuzzing test method for industrial supervisory control configuration software based on genetic algorithm 基于遗传算法的工业监控组态软件模糊测试方法研究

2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS) Pub Date : 2016-10-01 DOI: 10.1109/ICRMS.2016.8050079

Bo Wu, Lei Yun, Xiantao Jin, Beishui Liu, Guanghui Wei

{"title":"Study on the fuzzing test method for industrial supervisory control configuration software based on genetic algorithm","authors":"Bo Wu, Lei Yun, Xiantao Jin, Beishui Liu, Guanghui Wei","doi":"10.1109/ICRMS.2016.8050079","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050079","url":null,"abstract":"Information security of industrial control systems (ICS) is increasingly critical and as a key part of the ICS, the industrial supervisory control configuration software has a great impact on the ICS information security. Accordingly, the current information security issues of the industrial supervisory control configuration software, such as low security protection level, quantities of vulnerabilities, significant harm after attack and lack of effective vulnerability discovery methods, we present a vulnerability discovery method which uses fuzzing test to discover the vulnerabilities in the industrial supervisory control configuration software. First, the information security features of the industrial supervisory control configuration software are analyzed, next the fuzzing test framework is designed according to the information security features obtained, and then the test data generation method based on a Genetic Algorithm (GA) in the fuzzing test is emphatically discussed. The proposed test framework and test data generation method in the fuzzing test can be successfully applied in discovering the vulnerabilities of industrial supervisory control configuration software.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122706907","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Reliability allocation for CNC turrets based on fuzzy comprehensive evaluation 基于模糊综合评价的数控转塔可靠性分配

2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS) Pub Date : 2016-10-01 DOI: 10.1109/ICRMS.2016.8050085

Fei Chen, Qunya Xie, Xiaojuan Chen, Zhaojun Yang, Yifeng Ye, Chao Chen, Zhen Li, Heng Zhang

{"title":"Reliability allocation for CNC turrets based on fuzzy comprehensive evaluation","authors":"Fei Chen, Qunya Xie, Xiaojuan Chen, Zhaojun Yang, Yifeng Ye, Chao Chen, Zhen Li, Heng Zhang","doi":"10.1109/ICRMS.2016.8050085","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050085","url":null,"abstract":"When it comes to the reliability allocation of Computerized Numerical Control (CNC) turrets, there are two problems. One problem is that the corresponding reliability index is only allocated into each subsystem; another problem is that neglecting the coordination between each subsystem will affect the results of reliability allocation. To solve these two problems a new research method for CNC turret reliability allocation is proposed. It classifies the components of the CNC turret system according to the extent to which these components affect the system's reliability. It takes assembly relationships and CNC turret system sealing as two factors. Along with the components screened out, a reliability block diagram (RBD) is built. The reliability allocation method previously proposed is based on fuzzy comprehensive evaluation. It takes the mean time between failures (MTBF) as the index of allocation and assigns reliability to the components screened out, assembly relationships and sealing. Reliability allocation directly for the components of CNC turrets and research into comprehensive consideration of various factors which affect reliability makes the results of reliability allocation more reasonable, and also provides a specific basis for the design of CNC turrets.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"35 12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131453063","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Reliability assessment of car engine based on dynamic Bayesian network 基于动态贝叶斯网络的汽车发动机可靠性评估

2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS) Pub Date : 2016-10-01 DOI: 10.1109/ICRMS.2016.8050144

W. Qian, Jiyao Liu, Qianqian Cao, X. Yin, Liyang Xie

引用次数: 0

Discriminate intermittent from permanent faults based on fault event evaluation and diagnoser 基于故障事件评估和诊断，区分间歇性故障和永久性故障

2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS) Pub Date : 2016-10-01 DOI: 10.1109/ICRMS.2016.8050102

G. Deng, Ning Yan, Rui Kang, Zhi Li, J. Qiu, Guanjun Liu

引用次数: 0

Review on civil aviation safety investment research 民航安全投资研究综述

2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS) Pub Date : 2016-10-01 DOI: 10.1109/ICRMS.2016.8050113

Mingliang Chen, Y. Zhang, Yanqiu Chen

引用次数: 5