Analog integrated circuits parameters online test system for accelerated test

Abstract

The integrated operational amplifiers are widely used in the analog integrated circuits. The reliability of the devices, especially in changing temperature condition, affects the reliability of automation equipment. Accelerated test is a main method to assess electronic components' life. At present, there are some problems in parameters test systems. e.g., multiple devices can't be tested at the same time by the system. The devices are timing taken out of constant temperature drying to measure parameters, but the behavior by human often affects the test results. In high temperature conditions, it is impossible for the system to test devices online and analyze the test results. All above, an online test system of integrated operational amplifier, which is for accelerated test, was designed. Firstly, the design principle of the system was introduced. Secondly, the key modules and their roles in the system were described. In the end, the designed system was applied to assess the life for the integrated operational amplifier. It indicated that the system is able to test parameters for accelerated test. The number of the operational amplifiers can be changed. The test conditions are ambient temperature and accelerated test and so on.