Qingfeng Du, J. Qiu, Kanglin Yin, Huan Li, Kun Shi, Yue Tian, Tiandi Xie
{"title":"High availability verification framework for OpenStack based on fault injection","authors":"Qingfeng Du, J. Qiu, Kanglin Yin, Huan Li, Kun Shi, Yue Tian, Tiandi Xie","doi":"10.1109/ICRMS.2016.8050168","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050168","url":null,"abstract":"The phenomenon of high availability (HA) is of vital importance in cloud architecture. This paper proposes an HA verification framework, called HAVerifier, for OpenStack, a popular open source cloud platform. Fault injection technology has been adopted to verify the system's reliability by determining its health status after injecting faults. The framework proposed in this paper verifies the availability of services by injecting faults into the different components of OpenStack. Service indicators (for example, downtime) are monitored after the faults are injected. The collected metrics are compared with the provided service level agreement to verify whether the platform's availability meets the requirements. The fault injection steps can be implemented dynamically using the proposed framework, and the faults injected into the platform can be restored without manual intervention. Finally, a prototype for this framework is implemented to prove its applicability to verifying the HA of the OpenStack platform.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116458233","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Research on fault injection technology for embedded software based on JTAG interface","authors":"Mengmeng Liu, Zhaoyang Zeng, F. Su, Jueping Cai","doi":"10.1109/ICRMS.2016.8050155","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050155","url":null,"abstract":"Fault injection is an effective method for PHM and testability validation. However, with the increasing complexity of structures and functions, and with the promotion of integration levels for airborne prognostics and health management (PHM) and integrated modular avionics (IMA) systems, fault injection is often difficult to use in conventional “plug,” “probe,” or “adaptor plate” methods. Fault injection based on software also presents a bottleneck for engineering applications in terms of controllability and operability. Seeking to solve the problem of applying software fault injection to testability validation, a fault injection technique based on the Joint Test Action Group (JTAG) interface is proposed in this study. The proposed technique is based on the demands of testability validation, takes into account the development trend in avionics of modularization and integration, and adopts aspects of the JTAG boundary-scan technique. Through use of the boundary-scan technique and chip debugging functions, noncontacted hardware fault injection can be realized. Accurate and controllable fault injection of embedded chip pins/functions can then be achieved that satisfies the requirements of fault simulation and injection effect/time. The problems of fault injection implementations for equipment-oriented IMA architecture can thus be overcome, and a new direction for implementing testability validation of airborne PHM and integrated avionics equipment, thereby effectively promoting and ensuring the achievement of testability indices and PHM functions.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"63 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116447661","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
N. Yang, Jing Feng, Quan Sun, Tianyu Liu, Dao Zhong
{"title":"Online estimation of state-of-health for lithium ion batteries based on charge curves","authors":"N. Yang, Jing Feng, Quan Sun, Tianyu Liu, Dao Zhong","doi":"10.1109/ICRMS.2016.8050034","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050034","url":null,"abstract":"Usable capacity refers to the maximum capacity in theory that a fully charged battery can release, and is often used as an indicator in state of health (SOH) estimation for lithium ion batteries. The traditional method for measuring usable capacity is mainly based on voltage data in the discharge process with a constant current. However, the discharge current of a lithium ion battery in operation always fluctuates due to load changes, which makes the traditional method difficult for realizing online capacity measurement. To overcome the above problems, a novel approach is proposed in this paper to estimate the usable capacity and SOH of lithium ion batteries based on the charge curve. The time intervals between two voltages and currents during charging are used as the health factors to predict the usable capacity, which is then used to perform the SOH estimation. Experiments are implemented based on data provided by the NASA Ames Prognostics Center of Excellence. Results confirm that the proposed method performs well in online estimation of SOH.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123841484","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Wen-jun Wang, Ai-yong Du, Juanli Lv, Le Li, Chunhui Qiu
{"title":"Reliability analysis of turbine-driven auxiliary feedwater pump of a nuclear power plant","authors":"Wen-jun Wang, Ai-yong Du, Juanli Lv, Le Li, Chunhui Qiu","doi":"10.1109/ICRMS.2016.8050097","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050097","url":null,"abstract":"This study analyzed the process of reliability assessment for a turbine-driven auxiliary feedwater (AFW) pump according to the date of a domestic nuclear power plant, starting from the onsite data collection up to the analysis of these data, and evaluation of the reliability parameter. The content includes scope and boundary definition of a turbine-driven AFW pump, reliability data collection and analysis, estimation methods of reliability parameter, and calculation and analysis of reliability parameters, such as probability of failure on demand (γ) and rate of failure to run (λ).","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130356227","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Reliability and performance modeling for mission-oriented k-out-of-n system under common cause failures","authors":"Xiujie Zhao, M. Xie, Qiang Feng","doi":"10.1109/ICRMS.2016.8050159","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050159","url":null,"abstract":"This paper proposes a reliability and performance analysis and modeling methodology for mission-oriented k-out-of-n systems. The system is assumed to suffer both independent internal failures and external common cause shocks, of which arrivals are both modeled by Poisson processes. Periodic missions are assigned to the system due to a fixed schedule. A performance measure is introduced based on the mission workload and number of components working in the system. By modeling the failure modes on such systems with a Markov chain model, the defined reliability and performance is given in analytical forms. In a following numerical example, we illustrate the reliability and performance for such systems by the proposed approach.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130572752","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Fault diagnosis for railway track circuit based on wavelet packet power spectrum and ELM","authors":"Zicheng Wang, Jin Guo, Yadong Zhang, Rong Luo","doi":"10.1109/ICRMS.2016.8050089","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050089","url":null,"abstract":"For enhancing the troubleshooting efficiency of a track circuit, a fault diagnosis method for the track circuit is proposed in this paper. First, a locomotive signal induced voltage model is established based on the transmission-line theory. Then, cases of the induced voltage envelope signals, when the track circuits are in the normal and fault conditions, respectively, are simulated. Next, a three-layer wavelet packet is adopted to decompose the induced voltage envelope signals and power spectrum analysis for the detail signal is realized. 16 time-domain indices of the β power spectrum including the standard deviation, variance, kurtosis value, and the variable coefficient are used as the failure features. Then, the information fusion of the time domain features is implemented using the principal component analysis (PCA) technology. Finally, the fusion features are input to an extreme learning machine (ELM) model to identify the failures. Case analyses show that the fault diagnosis method proposed in this paper can obtain a high accuracy and provide a scientific basis for the on-site maintenance of the track circuit.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129480285","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Research on fault diagnosis training simulation technology based on MCGS","authors":"Xin Guo, Lizi Chen, N. Zhao","doi":"10.1109/ICRMS.2016.8050094","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050094","url":null,"abstract":"Based on MCGS (Monitor and Control Generated System) software a training diagnosis system for a certain kind of equipment is designed and developed. Through analysis of the structure of the equipment composition and working principles of the process a two-dimensional simulation model is established. The model can achieve simple operation training. Using common equipment for fault modeling, a fault tree model is adopted to realize the phenomenon, the reasons for fault diagnosis, and the screening simulation training process. The study shows that the fault diagnosis system based on MCGS software has a short development cycle, low cost and scalability.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128000549","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Failure analysis for micro-short circuit between two pins in printed circuit board assembly","authors":"Chao-Kun Hu, Lina Zhou","doi":"10.1109/ICRMS.2016.8050164","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050164","url":null,"abstract":"Function failure was found successively in one type of smart remote controls when using a period of time. With preliminary investigation by electric circuit, low resistance was found between the neighboring pins on failure sample which connected with flexible printed board and rigid printed board, but the pins on good sample were insulated with the others. After peeling off the flexible printed board, black materials which looked like migration were found by stereomicroscope and metallography microscope. With the help of scanning electron microscope and energy dispersive spectroscope (SEM&EDS), it was detected that the materials mainly contained the elements of Cu (about 50 at.%) and S (about 30 at.%), and the two short pins were almost connected with the black materials. As a result, the black materials which connected to the two pins should be copper sulfide (CuS) and cuprous sulfide (Cu2S). The failure process was as the follows. Some active sulfide was on the surface of board, with the bias voltage and moisture, the copper on the pads of board was sulfurized and migrated with electrochemical reaction. The migration materials which connected to the neighboring pins cause micro-short circuit. However, there was no element of Cu on the clean solder mask, and the element of S could not come from the filling material barium sulfate (BaSO4) because barium sulfate were difficult to break down and the element of Ba had not been detected in the black materials. Finally, with further investigation for the manufacturing process of the assembly, the element of S was detected on copper foil after soldering with the solder paste which used in the failure sample, but the element of S could not be detected with the other type of solder paste. It could conclude that the active sulfide should come from some sulfur-containing materials in the flux of solder paste breaking down in soldering. When soldering, the solvent in the flux was difficult to volatilize due to the flexible printed circuit board (FPC) on the top. Some sulfur-containing materials in the solvent would decompose to active sulfide. So, in order to avoid the failure of micro-short, the solder paste without sulfur containing should be used in soldering.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128124314","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A safety evaluation method for heavy-duty CNC machine tools for the total life cycle based on an entropy weight method","authors":"Guofa Li, Yongchao Huo, Jialong He, Zhaojun Yang, Jian Wang, Guofei Liu","doi":"10.1109/ICRMS.2016.8050055","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050055","url":null,"abstract":"A safety evaluation method based on an entropy weight method is proposed that is aimed at the features of heavy-duty computer numerical control (CNC) machine tools, such as long-life cycle, complex structure, high cost and many hidden safety risks. According to the risk sources of each phase of the total life cycle, the expert-scoring table is formulated and the process of experts' scoring is developed from the perspective of a “man-machine-environment-workpiece” system. Considering the differences in the experts' scoring, an entropy weight method is used to calculate the weight of each expert at each phase of the total life cycle. The proposed method is applied to the XKA28 heavy-duty CNC gantry milling machine, and the safety evaluation is implemented. The results indicate that the proposed method is feasible.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127113947","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Review on civil aviation safety investment research","authors":"Mingliang Chen, Y. Zhang, Yanqiu Chen","doi":"10.1109/ICRMS.2016.8050113","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050113","url":null,"abstract":"Maintaining and improving safety has always been the most important thing for civil aviation. Safety investment is an important material guarantee and basis for civil aviation safety. Insufficient investment in safety and irrational structure of safety investment are the causes of accidents in civil aviation. A review of recent research articles related to safety investment was presented and the research status, achievements, existing problems and development prospects were introduced. The construction method of safety investment index system, the cost-benefit analysis of safety investment, and the safety investment decision-making methods were summarized. A framework was proposed to establish a safety investment index system, conduct of cost-benefit analysis, and to assist in the quantitative decision-making of civil aviation safety investment.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114062630","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}