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2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)最新文献

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IVNC 2023 Conference Chairs IVNC 2023会议主席
2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC) Pub Date : 2023-07-10 DOI: 10.1109/ivnc57695.2023.10188963
{"title":"IVNC 2023 Conference Chairs","authors":"","doi":"10.1109/ivnc57695.2023.10188963","DOIUrl":"https://doi.org/10.1109/ivnc57695.2023.10188963","url":null,"abstract":"","PeriodicalId":346266,"journal":{"name":"2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133409699","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Modulated Electron Beam Emission Under RF and Laser Fields 射频和激光场下的调制电子束发射
2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC) Pub Date : 2023-07-10 DOI: 10.1109/IVNC57695.2023.10188886
Lan Jin, Yang Zhou, P. Zhang
{"title":"Modulated Electron Beam Emission Under RF and Laser Fields","authors":"Lan Jin, Yang Zhou, P. Zhang","doi":"10.1109/IVNC57695.2023.10188886","DOIUrl":"https://doi.org/10.1109/IVNC57695.2023.10188886","url":null,"abstract":"We analyze the emission of density-modulated electron beams of different temporal shapes under the excitation of a combined radio frequency (RF) field and a continuous wave or pulsed laser field, using an exact quantum model for photo-/field-emission.","PeriodicalId":346266,"journal":{"name":"2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131314506","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An Integrated Silicon Nanowire Field Emission Electron Source on a Chip with High Electron Transmission 高电子透射率芯片上集成硅纳米线场发射电子源
2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC) Pub Date : 2023-07-10 DOI: 10.1109/IVNC57695.2023.10188878
P. Buchner, M. Hausladen, A. Schels, F. Herdl, S. Edler, M. Bachmann, R. Schreiner
{"title":"An Integrated Silicon Nanowire Field Emission Electron Source on a Chip with High Electron Transmission","authors":"P. Buchner, M. Hausladen, A. Schels, F. Herdl, S. Edler, M. Bachmann, R. Schreiner","doi":"10.1109/IVNC57695.2023.10188878","DOIUrl":"https://doi.org/10.1109/IVNC57695.2023.10188878","url":null,"abstract":"Silicon nanowire field emission arrays (50 × 50 pillars) were fabricated on a silicon glass hybrid wafer. The glass acts both as the support for the whole structure and insulator between cathode and extraction grid. The extraction grid matches the emitter structures and is optically aligned and adhered to the emitter chip by a vacuum compatible epoxide adhesive. These chips exhibit an emission current of about 600 $mu{mathrm{A}}$ at an extraction voltage of 300 V. The electron transmission through the grid is above 80 %. 58-hour longtime measurements were conducted showing low degradation of the emission current and high stability of electron transmission.","PeriodicalId":346266,"journal":{"name":"2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)","volume":"78 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131664408","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Compact Flat Vacuum Light Source Using a Wire Cathode and Cathodoluminescent Phosphors 使用线阴极和阴极发光荧光粉的紧凑的平面真空光源
2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC) Pub Date : 2023-07-10 DOI: 10.1109/IVNC57695.2023.10188973
Jordan T. Ricci, Sergei Mistyuk, C. Hunt
{"title":"A Compact Flat Vacuum Light Source Using a Wire Cathode and Cathodoluminescent Phosphors","authors":"Jordan T. Ricci, Sergei Mistyuk, C. Hunt","doi":"10.1109/IVNC57695.2023.10188973","DOIUrl":"https://doi.org/10.1109/IVNC57695.2023.10188973","url":null,"abstract":"A flat-format vacuum light source using cathodoluminescent phosphors has been designed, modeled, and fabricated. It is found applicable to general and specialty lighting.","PeriodicalId":346266,"journal":{"name":"2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117281696","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Adjoint Optimization of Nanoscale Vacuum-Channel Transistor (NVCT) Geometry 纳米真空通道晶体管(NVCT)几何结构的伴随优化
2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC) Pub Date : 2023-07-10 DOI: 10.1109/IVNC57695.2023.10188877
L. C. Adams, G. Werner, J. Cary
{"title":"Adjoint Optimization of Nanoscale Vacuum-Channel Transistor (NVCT) Geometry","authors":"L. C. Adams, G. Werner, J. Cary","doi":"10.1109/IVNC57695.2023.10188877","DOIUrl":"https://doi.org/10.1109/IVNC57695.2023.10188877","url":null,"abstract":"A new, efficient method for optimizing NVCT geometry is presented. Previous work has shown how adjoint techniques can compute the shape gradient (i.e., gradient with respect to shape perturbations) of a prescribed-emission electron gun using only two particle-in-cell simulations [5]. This work provides an extension to the case of self-consistent emission in Hamiltonian systems by including external parameters as dynamical variables. The structure of the perturbed Hamilton's equations then yields a simple recipe for the evaluation of the adjoint problem. The adjoint problem can be evaluated as a perturbed and time-reversed version of the original simulation. From this, the full gradient can be extracted. This general approach is used to incorporate the modified emission current into the computed shape gradients, enabling full-device gradient-based optimization.","PeriodicalId":346266,"journal":{"name":"2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116483589","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Focusing Electrode on Focal Spot Size and Dose by Carbon Nanotube Based Cold Cathode Electron Beam (C-Beam) 基于碳纳米管的冷阴极电子束聚焦电极的焦斑尺寸和剂量
2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC) Pub Date : 2023-07-10 DOI: 10.1109/IVNC57695.2023.10188986
Y. Yu, K. Park
{"title":"Focusing Electrode on Focal Spot Size and Dose by Carbon Nanotube Based Cold Cathode Electron Beam (C-Beam)","authors":"Y. Yu, K. Park","doi":"10.1109/IVNC57695.2023.10188986","DOIUrl":"https://doi.org/10.1109/IVNC57695.2023.10188986","url":null,"abstract":"Electron beam focusing is crucial for various vacuum electron applications such as scanning electron microscope SEM), electron beam lithography (EBL), electron beam welding (EBW) and so on. We have demonstrated high quality X-ray imaging capable cold cathode electron beam design with focusing electrode. The focal spot size (FSS) and dose characteristics were improved by our focusing electrode integrated C-beam. By optimizing, as small as 0.1 mm of fss and 11.2 % of enhanced dose were confirmed. The authors believe that our sophisticated beam design will pave for next generation X-ray techniques.","PeriodicalId":346266,"journal":{"name":"2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)","volume":"173 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123506431","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Improvement of Electron Emission Properties of Volcano-Structured Silicon Emitters by Titanium Nitride Coating 氮化钛涂层改善火山结构硅发射体的电子发射性能
2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC) Pub Date : 2023-07-10 DOI: 10.1109/IVNC57695.2023.10188996
H. Murata, K. Murakami, M. Nagao
{"title":"Improvement of Electron Emission Properties of Volcano-Structured Silicon Emitters by Titanium Nitride Coating","authors":"H. Murata, K. Murakami, M. Nagao","doi":"10.1109/IVNC57695.2023.10188996","DOIUrl":"https://doi.org/10.1109/IVNC57695.2023.10188996","url":null,"abstract":"We have developed a volcano-structured double-gated field emitter array (FEA). High beam focusing have been achieved by precisely arranged gate electrode, however, high current operation have not been achieved. In this study, we applied TiN coating to volcano-structured Si-FEA, which was formed by reactive sputtering of Ti target and Ar/N2 gases. The TiN coated Si-FEA achieved relatively high current of 4.5 mA/1027 tips and short-term stability of 1 mA for 60 min. Therefore, the TiN coating is promising for high current operation of FEA.","PeriodicalId":346266,"journal":{"name":"2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)","volume":"1989 2","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120849138","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Quantum Nature of Electron-Light and Electron-Matter Interactions 电子-光和电子-物质相互作用的量子性质
2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC) Pub Date : 2023-07-10 DOI: 10.1109/IVNC57695.2023.10188970
Ron Ruimy, I. Kaminer
{"title":"Quantum Nature of Electron-Light and Electron-Matter Interactions","authors":"Ron Ruimy, I. Kaminer","doi":"10.1109/IVNC57695.2023.10188970","DOIUrl":"https://doi.org/10.1109/IVNC57695.2023.10188970","url":null,"abstract":"Coherent modulation of free electron wavefunctions on ultrafast timescales became accessible in recent years thanks to advances in ultrafast transmission electron microscopy. We demonstrate how such coherent modulation of free electrons can significantly alter their coherent quantum interaction with light and matter. We suggest that such coherently modulated free electrons can become a prominent tool in quantum science and technology, enabling ultrafast gate operations and quantum tomographic measurements with exceptionally high spatial resolutions.","PeriodicalId":346266,"journal":{"name":"2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129507188","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Overview of Electron Emission Laws from 2D Materials 二维材料的电子发射规律综述
2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC) Pub Date : 2023-07-10 DOI: 10.1109/IVNC57695.2023.10188881
L. Ang, Y. Ang, Yi-man Luo, Bee Hong Tiang
{"title":"Overview of Electron Emission Laws from 2D Materials","authors":"L. Ang, Y. Ang, Yi-man Luo, Bee Hong Tiang","doi":"10.1109/IVNC57695.2023.10188881","DOIUrl":"https://doi.org/10.1109/IVNC57695.2023.10188881","url":null,"abstract":"In this paper, we present an overview of the novel scaling laws of thermionic emission (TE), field emission (FE) and photoemission (PE) for two-dimensional (2D) materials. For these emerging materials, we express the emission models in the form of $ln(J/K^{beta})propto 1/K$, where J is the emission current density, $K$ is temperature (T) for TE and $K$ is dc or optically field for FE and PE. Here, the scaling is $beta = 3/2$ and $beta = 1$ for electron emission in lateral (or edge) and vertical (or surface) direction, respectively, which is different from the traditional scaling of $beta = 2$ for bulk 3D materials.","PeriodicalId":346266,"journal":{"name":"2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)","volume":"124 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126202130","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Electron Emission-Driven Gas-Liquid Plasma: Seed Sterilization and Surface Modification 电子发射驱动气液等离子体:种子灭菌和表面改性
2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC) Pub Date : 2023-07-10 DOI: 10.1109/IVNC57695.2023.10188991
Siwapon Srisonphan, Naowarat Tephiruk, Khomsan Ruangwong
{"title":"Electron Emission-Driven Gas-Liquid Plasma: Seed Sterilization and Surface Modification","authors":"Siwapon Srisonphan, Naowarat Tephiruk, Khomsan Ruangwong","doi":"10.1109/IVNC57695.2023.10188991","DOIUrl":"https://doi.org/10.1109/IVNC57695.2023.10188991","url":null,"abstract":"Herein we introduce a novel atmospheric streamer plasma device that employs a custom-designed electrode configuration to concentrate the electric field (~60 kV/cm) in a localized region, allowing electron emission and the generation of corona and streamer discharge plasma in an atmospheric ambient. We also introduce electrohydraulic streamer discharge plasma (ESDP), a promising plasma system that combines streamer discharge plasma and plasma-activated water (PAW) at a gas-liquid interface. This system has potential applications in seed sterilization and nanoscale surface modification. Our findings demonstrate that ESDP reduces fungal contamination on Chinese kale seeds by~75% and significantly improves the proportion of healthy seedlings. The combination of nonthermal (gas discharge) plasma and PAW offers advanced disinfection solutions for various applications, including biological, medicinal, environmental, and agricultural fields.","PeriodicalId":346266,"journal":{"name":"2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124948692","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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