2016 International Conference on Microelectronic Test Structures (ICMTS)最新文献_第4页

A reliable Schottky barrier height extraction procedure 一个可靠的肖特基屏障高度提取程序

2016 International Conference on Microelectronic Test Structures (ICMTS) Pub Date : 2016-03-28 DOI: 10.1109/ICMTS.2016.7476206

B. Tsui, Tze-Yu Fu

引用次数: 0

Test structures for CMOS RF reliability assessment CMOS射频可靠性评估的测试结构

2016 International Conference on Microelectronic Test Structures (ICMTS) Pub Date : 2016-03-28 DOI: 10.1109/ICMTS.2016.7476178

L. Heiß, Andreas Lachmann, R. Schwab, G. Panagopoulos, Peter Baumgartner, Mamatha Yakkegondi Virupakshappaa, D. Schmitt-Landsiedel

引用次数: 0

Advanced ioff measureable MOSFET array with eliminating leakage current of peripheral circuits 先进的可测量MOSFET阵列，可消除外围电路的漏电流

2016 International Conference on Microelectronic Test Structures (ICMTS) Pub Date : 2016-03-01 DOI: 10.1109/ICMTS.2016.7476174

Tsuyoshi Suzuki, S. Mori, H. Oishi, M. Bairo, Manabu Tomita, K. Ogawa, Y. Fukuzaki, H. Ohnuma

引用次数: 1

A test structure for analysis of metal wire effect on temperature distribution in stacked IC 一种用于分析金属线对堆叠集成电路温度分布影响的测试结构

2016 International Conference on Microelectronic Test Structures (ICMTS) Pub Date : 2016-03-01 DOI: 10.1109/ICMTS.2016.7476167

T. Matsuda, Haruka Demachi, H. Iwata, T. Hatakeyama, T. Ohzone

引用次数: 2

Proposal of a new array structure to enable the detection of soft failure and the aging test with overcurrent of resistive element 提出了一种新的阵列结构，实现了电阻元件的软失效检测和过流老化试验

2016 International Conference on Microelectronic Test Structures (ICMTS) Pub Date : 2016-03-01 DOI: 10.1109/ICMTS.2016.7476173

Shingo Sato, Y. Omura

引用次数: 1

Statistical analysis and modeling of Random Telegraph Noise based on gate delay variation measurement 基于门延迟变化测量的随机电报噪声统计分析与建模

2016 International Conference on Microelectronic Test Structures (ICMTS) Pub Date : 2016-03-01 DOI: 10.1109/ICMTS.2016.7476179

A. M. Mahfuzul Islam, Tatsuya Nakai, H. Onodera

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引用次数: 1