提出了一种新的阵列结构，实现了电阻元件的软失效检测和过流老化试验

2016 International Conference on Microelectronic Test Structures (ICMTS) Pub Date : 2016-03-01 DOI:10.1109/ICMTS.2016.7476173

Shingo Sato, Y. Omura

{"title":"提出了一种新的阵列结构，实现了电阻元件的软失效检测和过流老化试验","authors":"Shingo Sato, Y. Omura","doi":"10.1109/ICMTS.2016.7476173","DOIUrl":null,"url":null,"abstract":"A new array structure to detect the soft failure of resistive elements is reported. By adding terminals to sense local potentials and high pass filtering a bit map image, it becomes possible to detect soft failure. Thanks to a simplified peripheral circuit, the layout area is drastically reduced and an aging test with overcurrent becomes possible.","PeriodicalId":344487,"journal":{"name":"2016 International Conference on Microelectronic Test Structures (ICMTS)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Proposal of a new array structure to enable the detection of soft failure and the aging test with overcurrent of resistive element\",\"authors\":\"Shingo Sato, Y. Omura\",\"doi\":\"10.1109/ICMTS.2016.7476173\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new array structure to detect the soft failure of resistive elements is reported. By adding terminals to sense local potentials and high pass filtering a bit map image, it becomes possible to detect soft failure. Thanks to a simplified peripheral circuit, the layout area is drastically reduced and an aging test with overcurrent becomes possible.\",\"PeriodicalId\":344487,\"journal\":{\"name\":\"2016 International Conference on Microelectronic Test Structures (ICMTS)\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-03-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 International Conference on Microelectronic Test Structures (ICMTS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMTS.2016.7476173\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 International Conference on Microelectronic Test Structures (ICMTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMTS.2016.7476173","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

报道了一种用于检测电阻元件软失效的新型阵列结构。通过增加终端检测局部电位，并对位图图像进行高通滤波，使软故障检测成为可能。由于外围电路的简化，布局面积大大减少，并且可以进行过流老化测试。

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Proposal of a new array structure to enable the detection of soft failure and the aging test with overcurrent of resistive element

A new array structure to detect the soft failure of resistive elements is reported. By adding terminals to sense local potentials and high pass filtering a bit map image, it becomes possible to detect soft failure. Thanks to a simplified peripheral circuit, the layout area is drastically reduced and an aging test with overcurrent becomes possible.

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2016 International Conference on Microelectronic Test Structures (ICMTS)

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