发布求助
文献互助 智能选刊 最新文献

Proceedings of the European Microscopy Congress 2020最新文献

筛选
英文 中文
Depth Resolution in Ptychography 平面摄影中的深度分辨率
Proceedings of the European Microscopy Congress 2020 Pub Date : 2021-03-01 DOI: 10.22443/RMS.EMC2020.657
Sheng You
{"title":"Depth Resolution in Ptychography","authors":"Sheng You","doi":"10.22443/RMS.EMC2020.657","DOIUrl":"https://doi.org/10.22443/RMS.EMC2020.657","url":null,"abstract":"","PeriodicalId":311343,"journal":{"name":"Proceedings of the European Microscopy Congress 2020","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125482505","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Evaluation of different rectangular scan strategies for HRSTEM imaging 不同矩形扫描策略在HRSTEM成像中的评价
Proceedings of the European Microscopy Congress 2020 Pub Date : 2021-03-01 DOI: 10.22443/rms.emc2020.146
Abner Velazco Torrejón
{"title":"Evaluation of different rectangular scan strategies for HRSTEM imaging","authors":"Abner Velazco Torrejón","doi":"10.22443/rms.emc2020.146","DOIUrl":"https://doi.org/10.22443/rms.emc2020.146","url":null,"abstract":"Scanning transmission electron microscopes (STEMs) equipped with spherical aberration correctors are well known for their ability to obtain images with atomic scale information. The conventional ‘raster’ method scans the probe over the sample line by line. HRSTEM (High resolution STEM) imaging is typically performed by scanning a focused electron probe over a sample at sub-Ångstrom resolution. At such high resolution images, distortions are commonly present because of drift of the sample/stage during raster scanning, predominantly affecting the so-called ‘slow scan direction’ [1].","PeriodicalId":311343,"journal":{"name":"Proceedings of the European Microscopy Congress 2020","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132034518","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Fast versus conventional HAADF-STEM tomography: advantages and challenges 快速与传统HAADF-STEM断层扫描:优势和挑战
Proceedings of the European Microscopy Congress 2020 Pub Date : 2021-03-01 DOI: 10.22443/RMS.EMC2020.765
H. Vanrompay
{"title":"Fast versus conventional HAADF-STEM tomography: advantages and challenges","authors":"H. Vanrompay","doi":"10.22443/RMS.EMC2020.765","DOIUrl":"https://doi.org/10.22443/RMS.EMC2020.765","url":null,"abstract":"Electron tomography has evolved into a powerful technique to study the three-dimensional (3D) structure of functional nanomaterials. Conventionally, electron tomography experiments are based on acquiring tilt series of projection images with an increment of 1-2 ̊ over an angular range that is as large as possible. Although the acquisition of such a tilt series is mostly automated, even under ideal conditions approximately 1 hour is required to obtain all 2D projection images. This is clearly a major drawback when a large number or samples needs to be investigated or when dynamic effects appear during in-situ experiments. It is furthermore clear that 3D studies of radiation sensitive materials are extremely challenging since samples will degrade when long acquisition times are required. One of the emerging challenges in the field of electron tomography is therefore to accelerate the acquisition of tilt series for tomography. At the same time, the quality of the tomographic reconstructions should be maintained and enable one to obtain reliable and quantitative parameters such as e.g. particle size and surface morphology.","PeriodicalId":311343,"journal":{"name":"Proceedings of the European Microscopy Congress 2020","volume":"110 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115698068","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Phase Contrast in Quantum Electron Microscopy 量子电子显微镜的相衬
Proceedings of the European Microscopy Congress 2020 Pub Date : 2021-03-01 DOI: 10.22443/RMS.EMC2020.520
S. Loginov, T. Delft
{"title":"Phase Contrast in Quantum Electron Microscopy","authors":"S. Loginov, T. Delft","doi":"10.22443/RMS.EMC2020.520","DOIUrl":"https://doi.org/10.22443/RMS.EMC2020.520","url":null,"abstract":"","PeriodicalId":311343,"journal":{"name":"Proceedings of the European Microscopy Congress 2020","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128077952","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Probing Chirality with Inelastic Electron-Light Scattering 用非弹性电子光散射探测手性
Proceedings of the European Microscopy Congress 2020 Pub Date : 2021-03-01 DOI: 10.1021/acs.nanolett.0c01130.s001
J. Henke
{"title":"Probing Chirality with Inelastic Electron-Light Scattering","authors":"J. Henke","doi":"10.1021/acs.nanolett.0c01130.s001","DOIUrl":"https://doi.org/10.1021/acs.nanolett.0c01130.s001","url":null,"abstract":"","PeriodicalId":311343,"journal":{"name":"Proceedings of the European Microscopy Congress 2020","volume":"183 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122054931","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Comparison of quantitative analysis for metal catalyst materials using SEM-EDS and ICP-OES 金属催化剂材料的SEM-EDS和ICP-OES定量分析比较
Proceedings of the European Microscopy Congress 2020 Pub Date : 2021-03-01 DOI: 10.22443/RMS.EMC2020.551
Sohee Kim
{"title":"Comparison of quantitative analysis for metal catalyst materials using SEM-EDS and ICP-OES","authors":"Sohee Kim","doi":"10.22443/RMS.EMC2020.551","DOIUrl":"https://doi.org/10.22443/RMS.EMC2020.551","url":null,"abstract":"","PeriodicalId":311343,"journal":{"name":"Proceedings of the European Microscopy Congress 2020","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123539732","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Using Bayesian inference to improve three-dimensional atomic reconstructions from a single projection using Z-contrast imaging 使用贝叶斯推理提高三维原子重建从一个单一的投影使用z对比成像
Proceedings of the European Microscopy Congress 2020 Pub Date : 2021-03-01 DOI: 10.22443/RMS.EMC2020.194
A. Backer
{"title":"Using Bayesian inference to improve three-dimensional atomic reconstructions from a single projection using Z-contrast imaging","authors":"A. Backer","doi":"10.22443/RMS.EMC2020.194","DOIUrl":"https://doi.org/10.22443/RMS.EMC2020.194","url":null,"abstract":"","PeriodicalId":311343,"journal":{"name":"Proceedings of the European Microscopy Congress 2020","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121056269","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Synthesis of 3-dimensional graphene by chemical vapor deposition for high-efficiency electrode in battery 化学气相沉积法制备高效电池电极用三维石墨烯
Proceedings of the European Microscopy Congress 2020 Pub Date : 2021-03-01 DOI: 10.22443/RMS.EMC2020.450
A. Ruammaitree
{"title":"Synthesis of 3-dimensional graphene by chemical vapor deposition for high-efficiency electrode in battery","authors":"A. Ruammaitree","doi":"10.22443/RMS.EMC2020.450","DOIUrl":"https://doi.org/10.22443/RMS.EMC2020.450","url":null,"abstract":"","PeriodicalId":311343,"journal":{"name":"Proceedings of the European Microscopy Congress 2020","volume":"198 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123036113","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Application of an iris aperture to angle-resolved quantitative STEM from low to high scattering angles 从低散射角到高散射角，虹膜孔径在角度分辨定量STEM中的应用
Proceedings of the European Microscopy Congress 2020 Pub Date : 2021-03-01 DOI: 10.22443/RMS.EMC2020.605
A. Rosenauer
{"title":"Application of an iris aperture to angle-resolved quantitative STEM from low to high scattering angles","authors":"A. Rosenauer","doi":"10.22443/RMS.EMC2020.605","DOIUrl":"https://doi.org/10.22443/RMS.EMC2020.605","url":null,"abstract":"","PeriodicalId":311343,"journal":{"name":"Proceedings of the European Microscopy Congress 2020","volume":"109 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117287039","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Charge Discontinuity Induced Polarization Enhancement and Head-to-Head/Tail-to-Tail Polarization Configuration at Multiferroic/Ferroelectric BiFeO3/PbTiO3 Heterointerfaces 多铁/铁电BiFeO3/PbTiO3异质界面的电荷不连续诱导极化增强和头对头/尾对尾极化结构
Proceedings of the European Microscopy Congress 2020 Pub Date : 2021-03-01 DOI: 10.22443/RMS.EMC2020.92
Yinghu Liu
{"title":"Charge Discontinuity Induced Polarization Enhancement and Head-to-Head/Tail-to-Tail Polarization Configuration at Multiferroic/Ferroelectric BiFeO3/PbTiO3 Heterointerfaces","authors":"Yinghu Liu","doi":"10.22443/RMS.EMC2020.92","DOIUrl":"https://doi.org/10.22443/RMS.EMC2020.92","url":null,"abstract":"","PeriodicalId":311343,"journal":{"name":"Proceedings of the European Microscopy Congress 2020","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121135473","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
首页 上一页 下一页 尾页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：481959085
Book学术官方微信