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Proceedings of the European Microscopy Congress 2020最新文献

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Non-linear correction of STEM distortions through cross-correlation and pixel-by-pixel optimization 通过互相关和逐像素优化的STEM畸变非线性校正
Proceedings of the European Microscopy Congress 2020 Pub Date : 1900-01-01 DOI: 10.22443/rms.emc2020.721
P. Potapov
{"title":"Non-linear correction of STEM distortions through cross-correlation and pixel-by-pixel optimization","authors":"P. Potapov","doi":"10.22443/rms.emc2020.721","DOIUrl":"https://doi.org/10.22443/rms.emc2020.721","url":null,"abstract":"","PeriodicalId":311343,"journal":{"name":"Proceedings of the European Microscopy Congress 2020","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127506723","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Clearing of hemozoin in Plasmodium parasites enables STED Nanoscopy 清除疟原虫中的血色素使STED纳米显微镜得以实现
Proceedings of the European Microscopy Congress 2020 Pub Date : 1900-01-01 DOI: 10.22443/rms.emc2020.703
Jessica Kehrer
{"title":"Clearing of hemozoin in Plasmodium parasites enables STED Nanoscopy","authors":"Jessica Kehrer","doi":"10.22443/rms.emc2020.703","DOIUrl":"https://doi.org/10.22443/rms.emc2020.703","url":null,"abstract":"","PeriodicalId":311343,"journal":{"name":"Proceedings of the European Microscopy Congress 2020","volume":"379 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116579215","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Probing structural distortions in electronically coupled NdNiO3/SmNiO3 superlattices 电子耦合NdNiO3/SmNiO3超晶格的结构畸变探测
Proceedings of the European Microscopy Congress 2020 Pub Date : 1900-01-01 DOI: 10.22443/rms.emc2020.352
B. Mundet
{"title":"Probing structural distortions in electronically coupled NdNiO3/SmNiO3 superlattices","authors":"B. Mundet","doi":"10.22443/rms.emc2020.352","DOIUrl":"https://doi.org/10.22443/rms.emc2020.352","url":null,"abstract":"","PeriodicalId":311343,"journal":{"name":"Proceedings of the European Microscopy Congress 2020","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133883329","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
In situ transmission electron microscopy study of disorder-order transition in epitaxially stabilized FeGe2 外延稳定FeGe2中无序-有序转变的原位透射电镜研究
Proceedings of the European Microscopy Congress 2020 Pub Date : 1900-01-01 DOI: 10.22443/rms.emc2020.735
Markus Terker
{"title":"In situ transmission electron microscopy study of disorder-order transition in epitaxially stabilized FeGe2","authors":"Markus Terker","doi":"10.22443/rms.emc2020.735","DOIUrl":"https://doi.org/10.22443/rms.emc2020.735","url":null,"abstract":"","PeriodicalId":311343,"journal":{"name":"Proceedings of the European Microscopy Congress 2020","volume":"69 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133860618","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Measuring electric fields by four-dimensional STEM 用四维STEM测量电场
Proceedings of the European Microscopy Congress 2020 Pub Date : 1900-01-01 DOI: 10.22443/rms.emc2020.713
Andreas M Beyer
{"title":"Measuring electric fields by four-dimensional STEM","authors":"Andreas M Beyer","doi":"10.22443/rms.emc2020.713","DOIUrl":"https://doi.org/10.22443/rms.emc2020.713","url":null,"abstract":"","PeriodicalId":311343,"journal":{"name":"Proceedings of the European Microscopy Congress 2020","volume":"204 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114232572","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Thickness Dependence of Orbital Mapping 轨道映射的厚度依赖性
Proceedings of the European Microscopy Congress 2020 Pub Date : 1900-01-01 DOI: 10.22443/rms.emc2020.749
M. Ederer
{"title":"Thickness Dependence of Orbital Mapping","authors":"M. Ederer","doi":"10.22443/rms.emc2020.749","DOIUrl":"https://doi.org/10.22443/rms.emc2020.749","url":null,"abstract":"","PeriodicalId":311343,"journal":{"name":"Proceedings of the European Microscopy Congress 2020","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124906495","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Combination of STEM multislice simulations and 4D STEM: measuring atomic bonding effects STEM多层模拟与4D STEM的结合:测量原子键合效应
Proceedings of the European Microscopy Congress 2020 Pub Date : 1900-01-01 DOI: 10.22443/rms.emc2020.714
Damien Heimes
{"title":"Combination of STEM multislice simulations and 4D STEM: measuring atomic bonding effects","authors":"Damien Heimes","doi":"10.22443/rms.emc2020.714","DOIUrl":"https://doi.org/10.22443/rms.emc2020.714","url":null,"abstract":"","PeriodicalId":311343,"journal":{"name":"Proceedings of the European Microscopy Congress 2020","volume":"124 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129879488","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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