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2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)最新文献

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Applying Change Impact Analysis Test to Migration Test Case Extraction Based on IDAU and Graph Analysis Techniques 基于IDAU和图分析技术的变更影响分析测试在迁移测试用例提取中的应用
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2019-04-01 DOI: 10.1109/ICSTW.2019.00041
Tomohiro Takeda, Masakazu Takahashi, Tsuyoshi Yumoto, Satoshi Masuda, T. Matsuodani, K. Tsuda
{"title":"Applying Change Impact Analysis Test to Migration Test Case Extraction Based on IDAU and Graph Analysis Techniques","authors":"Tomohiro Takeda, Masakazu Takahashi, Tsuyoshi Yumoto, Satoshi Masuda, T. Matsuodani, K. Tsuda","doi":"10.1109/ICSTW.2019.00041","DOIUrl":"https://doi.org/10.1109/ICSTW.2019.00041","url":null,"abstract":"The importance of software testing in enterprise system development is growing more and more from cost reduction, quality improvement and time-to-market of their enterprise services. Especially in recent years, companies with the spread of API economy trend has been faced with the need to publish their services via public API-Gateway as Restful-API services. Simultaneously, there is a need for software testing for a part of migrated function from a legacy monolithic architecture to microservice one. In this situation, we have a concern how far range implementation is influenced by getting rid of migrated function's implementation, new function as microservice and isolated data on cloud container. Despite existing several test case extraction methodologies, these are not enough to reveal rage of influence in this case. Therefore, we propose a new test case extraction methodology for a part of system modification and system transition like migrating to microservices from a monolithic system. Our approach focuses on the interaction between function and data to extract test cases from only influenced ranges. On that account, we leverage improved \"Impact Data All Used\" method as \"Code-Based - Impact Data All used.\" Moreover, we apply graph mining techniques to extracted test cases for reducing the number of test cases efficiently. As a result of this study, by exhaustively searching CRUD operations in source codes level, clarified that it is possible to extract dependencies between functions and data as test cases which are not able to be detected by previous study's IDAU method. Moreover, we suggest the possibility of a test case reduction model by Bonachich Power Centrality and Link-Community analysis.","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114603450","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Message from the ICST 2019 Program Chairs 来自2019年ICST项目主席的信息
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2019-04-01 DOI: 10.1109/icstw.2019.00005
Qin Shi Huang, Z. Yang, Qinghua Zheng, Myra Cohen, A. Memon
{"title":"Message from the ICST 2019 Program Chairs","authors":"Qin Shi Huang, Z. Yang, Qinghua Zheng, Myra Cohen, A. Memon","doi":"10.1109/icstw.2019.00005","DOIUrl":"https://doi.org/10.1109/icstw.2019.00005","url":null,"abstract":"We are very pleased to present the proceedings of the 12th International Conference on Software Testing, Verification & Validation on behalf of the entire Program Committee. This year’s edition of ICST is in Xi’an, one of the oldest cities in China, home of the famous Terracotta Army of Emperor Qin Shi Huang. This is the first time that ICST has been held in China. Given the strong community of software testing researchers in this region, it is fitting that we are holding ICST here this year.","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"171 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122192113","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An Empirical Comparison of Mutant Selection Assessment Metrics 突变体选择评估指标的实证比较
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2019-04-01 DOI: 10.1109/ICSTW.2019.00037
J Zhang, Lingming Zhang, Dan Hao, Lu Zhang, M. Harman
{"title":"An Empirical Comparison of Mutant Selection Assessment Metrics","authors":"J Zhang, Lingming Zhang, Dan Hao, Lu Zhang, M. Harman","doi":"10.1109/ICSTW.2019.00037","DOIUrl":"https://doi.org/10.1109/ICSTW.2019.00037","url":null,"abstract":"Mutation testing is expensive due to the large number of mutants, a problem typically tackled using selective techniques, thereby raising the fundamental question of how to evaluate the selection process. Existing mutant selection approaches rely on one of two types of metrics (or assessment criteria), one based on adequate test sets and the other based on inadequate test sets. This raises the question as to whether these two metrics are correlated, complementary or substitutable for one another. The tester's faith in mutant selection as well as the validity of previous research work using only one metric rely on the answer to this question, yet it currently remains unanswered. To answer it, we perform qualitative and quantitative comparisons with 104 different projects, consisting of over 600,000 lines of code. Our results indicate a strong connection between the two types of metrics (R^2=0.8622 on average). The strategy for dealing with equivalent mutants and test density is observed to have a negligible impact for mutant selection.","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128706038","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Designing Fulfilling Test Cases with Test Aspect Model 用测试方面模型设计可实现的测试用例
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2019-04-01 DOI: 10.1109/ICSTW.2019.00044
A. Satoh, Shizuka Ban, Yuzuru Harayama, Kunio Yamamoto
{"title":"Designing Fulfilling Test Cases with Test Aspect Model","authors":"A. Satoh, Shizuka Ban, Yuzuru Harayama, Kunio Yamamoto","doi":"10.1109/ICSTW.2019.00044","DOIUrl":"https://doi.org/10.1109/ICSTW.2019.00044","url":null,"abstract":"UML Testing Profile 2.0 (UTP 2) has improved the possibilities of various modeling related to test architecture compared to past UTP. On the other hand, UTP 2 does not mention much about the derivation of test requirements, which is one of important activities in testing. The test aspect helps test engineers to derive test requirements. In this paper, we show concrete examples that test aspects extract test requirements and test cases not specified in the development model. Then, we show that test engineers can expand test requirements by visualizing the test aspect and can design test case without oversight.","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123490996","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Message from the IWCT 2019 Chairs 2019年IWCT主席致辞
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2019-04-01 DOI: 10.1109/icstw.2019.00019
{"title":"Message from the IWCT 2019 Chairs","authors":"","doi":"10.1109/icstw.2019.00019","DOIUrl":"https://doi.org/10.1109/icstw.2019.00019","url":null,"abstract":"We would like to welcome you to the 8th International Workshop on Combinatorial Testing (IWCT 2019), which is organized in conjunction with the IEEE International Conference on Software Testing, Verification and Validation (ICST 2019). After the successful edition in Montreal (2012), Luxembourg (2013), Cleveland (2014), Graz (2015), Chicago (2016), Tokyo (2017), Vasteras (2018), the eighth edition is held in Xi’an, on April 23th 2019.","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124530838","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
TAIC PART 2019 Program Committee 2019年项目委员会
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2019-04-01 DOI: 10.1109/icstw.2019.00009
{"title":"TAIC PART 2019 Program Committee","authors":"","doi":"10.1109/icstw.2019.00009","DOIUrl":"https://doi.org/10.1109/icstw.2019.00009","url":null,"abstract":"","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"577 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115895140","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Message from the INTUITESTBEDS 2019 Chairs 来自INTUITESTBEDS 2019椅子的信息
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2019-04-01 DOI: 10.1109/icstw.2019.00017
{"title":"Message from the INTUITESTBEDS 2019 Chairs","authors":"","doi":"10.1109/icstw.2019.00017","DOIUrl":"https://doi.org/10.1109/icstw.2019.00017","url":null,"abstract":"","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128834329","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Augmented Testing: Industry Feedback To Shape a New Testing Technology 增强测试:行业反馈塑造新的测试技术
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2019-04-01 DOI: 10.1109/ICSTW.2019.00048
M. Naß, Emil Alégroth, R. Feldt
{"title":"Augmented Testing: Industry Feedback To Shape a New Testing Technology","authors":"M. Naß, Emil Alégroth, R. Feldt","doi":"10.1109/ICSTW.2019.00048","DOIUrl":"https://doi.org/10.1109/ICSTW.2019.00048","url":null,"abstract":"Manual testing is the most commonly used approach in the industry today for acceptance-and system-testing of software applications. Test automation has been suggested to address drawbacks with manual testing but both test automation and manual testing have several challenges that limit their return of investment for system-and acceptance-test automation. Hence, there is still an industrial need for another approach to testing that can mitigate the challenges associated with system-and acceptance-testing and make it more efficient and cost effective for the industry. In this paper we present a novel technique we refer to as Augmented Testing (AT). AT is defined as testing through a visual layer between the tester and the System Under Test (SUT) that superimposes information on top of the GUI. We created a prototype for AT and performed an industrial workshop study with 10 software developers to get their perceived benefits and drawbacks of AT. The benefits and drawbacks will be useful for further development of the technique and prototype for AT. The workshop study identified more benefits than drawbacks with AT. Two of the identified benefits were: \"Know what to test and what has been tested\" and \"Less manual work\". Due to these results, we believe that AT is a promising technique that deserves more research since it may provide industry with new benefits that current techniques lack.","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114887424","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
VVIoT 2019 Program Committee VVIoT 2019项目委员会
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2019-04-01 DOI: 10.1109/icstw.2019.00016
{"title":"VVIoT 2019 Program Committee","authors":"","doi":"10.1109/icstw.2019.00016","DOIUrl":"https://doi.org/10.1109/icstw.2019.00016","url":null,"abstract":"","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124846548","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Using Parameter Mapping to Avoid Forbidden Tuples in a Covering Array 使用参数映射避免覆盖数组中的禁止元组
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2019-04-01 DOI: 10.1109/ICSTW.2019.00060
Chang Rao, Nan Li, Yu Lei, R. Kacker, D. R. Kuhn, Jin Guo
{"title":"Using Parameter Mapping to Avoid Forbidden Tuples in a Covering Array","authors":"Chang Rao, Nan Li, Yu Lei, R. Kacker, D. R. Kuhn, Jin Guo","doi":"10.1109/ICSTW.2019.00060","DOIUrl":"https://doi.org/10.1109/ICSTW.2019.00060","url":null,"abstract":"This paper addresses an optimization problem that occurs when we try to remove from a covering array (CA) the rows that do not satisfy a given set of constraints. That is, how to minimize the number of rows to be removed? The key observation is that the columns of a CA can be swapped without affecting coverage. This makes it possible to explore different ways to map the parameters involved in the constraints to the columns in the CA, which further allows us to reduce the number of rows that must be removed. In order to find an optimal mapping, our approach maps one parameter at a time and employs a greedy algorithm that tries to minimize the number of rows to be removed at each step. We report several experiments in which we compared our approach to two other approaches, i.e., the identity-based approach, and the random approach. The results show that our approach can remove fewer rows than the other two approaches.","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129690336","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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