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2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)最新文献

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Programming Behavioral Test Models for SMT Solving in Scala Scala中SMT求解的编程行为测试模型
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2019-04-01 DOI: 10.1109/ICSTW.2019.00032
B. Aichernig, Benedikt Maderbacher, Stefan Tiran
{"title":"Programming Behavioral Test Models for SMT Solving in Scala","authors":"B. Aichernig, Benedikt Maderbacher, Stefan Tiran","doi":"10.1109/ICSTW.2019.00032","DOIUrl":"https://doi.org/10.1109/ICSTW.2019.00032","url":null,"abstract":"We present a novel approach for modeling cyber-physical systems for analysis and test purposes. Instead of creating a new expressive specification language with sophisticated semantics and complex compilers, we rely on a lightweight version of Back's Action Systems, for which we provide a simple bounded model checker using the SMT solver Z3. In order to model industrial-sized embedded systems, we extend our simple specification language by using the powerful capa-bilities of the modern programming language Scala for creating Domain Specific Languages (DSL). This enables us to use the features of an expressive, object-oriented and functional generalpurpose language without the need to increase the complexity of the model checker. We demonstrate how to model a railway interlocking system with a configurable track layout and sketch the application to model-based testing.","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130721620","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
PIT-HOM: an Extension of Pitest for Higher Order Mutation Analysis PIT-HOM: Pitest在高阶突变分析中的推广
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2019-04-01 DOI: 10.1109/ICSTW.2019.00036
Thomas Laurent, Anthony Ventresque
{"title":"PIT-HOM: an Extension of Pitest for Higher Order Mutation Analysis","authors":"Thomas Laurent, Anthony Ventresque","doi":"10.1109/ICSTW.2019.00036","DOIUrl":"https://doi.org/10.1109/ICSTW.2019.00036","url":null,"abstract":"Mutation testing is a well-known, effective, fault-based testing criterion. First order mutation introduces defects in the form of a single small syntactic change. While the technique has been shown to be effective, it has some limits. Higher order mutation, where the faults introduced include multiple changes, has been proposed as a way to address some of these limits. Although the technique has shown promising results, there is no practical tool available for the application and study of higher order mutation on Java programs. In this paper we present PIT-HOM, an extension of Pitest (PIT) for higher order mutation. Pitest is a practical mutation analysis tool for Java, applicable on real-world codebases. PIT-HOM combines mutants in a same class to create higher order mutants of user-defined orders, it runs the mutants and reports the results in an easy to process format. We validate PIT-HOM using two small Java programs and report its performance as well as some characteristics of the mutants it creates.","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122239246","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Scenario Sampling for Cyber Physical Systems using Combinatorial Testing 使用组合测试的网络物理系统场景采样
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2019-04-01 DOI: 10.1109/ICSTW.2019.00053
A. Yamada, Clovis Eberhart, F. Ishikawa, Nian-Ze Lee
{"title":"Scenario Sampling for Cyber Physical Systems using Combinatorial Testing","authors":"A. Yamada, Clovis Eberhart, F. Ishikawa, Nian-Ze Lee","doi":"10.1109/ICSTW.2019.00053","DOIUrl":"https://doi.org/10.1109/ICSTW.2019.00053","url":null,"abstract":"Physical and continuous aspects are inevitable in cyber physical systems like automated driving systems. Despite the success of combinatorial testing on discrete systems, there is a fundamental challenge in applying combinatorial testing techniques when continuous parameters are involved. This extended abstract presents an initial step towards applying combinatorial testing to systems in which discrete and continuous parameters are mixed. We define a generic XML-based language for describing the test space of such systems and provide a prototype implementation to generate test cases, using externally the combinatorial test tool PICT.","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115312522","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Using Imprecise Test Oracles Modelled by FSM 使用由FSM建模的不精确测试oracle
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2019-04-01 DOI: 10.1109/ICSTW.2019.00029
Omer Nguena Timo, A. Petrenko, S. Ramesh
{"title":"Using Imprecise Test Oracles Modelled by FSM","authors":"Omer Nguena Timo, A. Petrenko, S. Ramesh","doi":"10.1109/ICSTW.2019.00029","DOIUrl":"https://doi.org/10.1109/ICSTW.2019.00029","url":null,"abstract":"Test oracles are usually used to evaluate the behaviors of systems under test to reveal faults. In a typical conformance testing scenario, a test oracle is a deterministic finite state machine (FSM). However, uncertainty occurring in the design of an oracle may result in a set of potential candidate oracles which can compactly be represented by a nondeterministic FSM thus modelling an imprecise test oracle. In the context of testing deterministic systems, such an oracle should ideally be reduced to a precise, i.e., deterministic oracle. We elaborate two scenarios for dealing with imprecise test oracles that involve a domain expert playing the role of an \"ultimate\" oracle. In the first scenario, the expert chooses a right oracle by inspecting the generated tests differentiating all potential precise oracles which can be derived from a given imprecise one. In the second scenario, the expert evaluates tests one by one while they are generated, and the imprecise oracle is iteratively reduced until a single precise oracle remains, if at all.","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122727088","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
ITEQS 2019 Program Committee 2019项目委员会
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2019-04-01 DOI: 10.1109/icstw.2019.00014
{"title":"ITEQS 2019 Program Committee","authors":"","doi":"10.1109/icstw.2019.00014","DOIUrl":"https://doi.org/10.1109/icstw.2019.00014","url":null,"abstract":"","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"440 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116186522","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
MLST 2019 Program Committee MLST 2019项目委员会
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2019-04-01 DOI: 10.1109/icstw.2019.00022
{"title":"MLST 2019 Program Committee","authors":"","doi":"10.1109/icstw.2019.00022","DOIUrl":"https://doi.org/10.1109/icstw.2019.00022","url":null,"abstract":"","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122248467","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
INTUITESTBEDS 2019 Program Committee INTUITESTBEDS 2019项目委员会
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2019-04-01 DOI: 10.1109/icstw.2019.00018
{"title":"INTUITESTBEDS 2019 Program Committee","authors":"","doi":"10.1109/icstw.2019.00018","DOIUrl":"https://doi.org/10.1109/icstw.2019.00018","url":null,"abstract":"","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133315511","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Behavioral Models and Scenario Selection for Testing IoT Trickle-Based Lossy Multicast Networks 基于涓滴的物联网有损多播网络测试行为模型和场景选择
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2019-04-01 DOI: 10.1109/ICSTW.2019.00047
Ngo Minh Thang Nguyen, Boutheina Bannour, Arnault Lapitre, P. L. Gall
{"title":"Behavioral Models and Scenario Selection for Testing IoT Trickle-Based Lossy Multicast Networks","authors":"Ngo Minh Thang Nguyen, Boutheina Bannour, Arnault Lapitre, P. L. Gall","doi":"10.1109/ICSTW.2019.00047","DOIUrl":"https://doi.org/10.1109/ICSTW.2019.00047","url":null,"abstract":"The Trickle algorithm is widely used to manage information dissemination in Wireless Sensor Networks (WSN) and it continues to be studied, in order to evaluate its performance or to derive variants or use in higher-level protocols. In this paper, we propose behavioural test models for the Trickle-based Multicast Protocol for Low Power and Lossy Networks (MPL). MPL proposes to use Trickle not only to schedule on-demand retransmissions but also to discover new information that has not yet been received, eventually due to non-deterministic packets loss. Testing such a protocol is challenging as it is used in particular to update sensors functionalities by disseminating prioritized large-scale firmware upgrades in the network. As part of our contribution, we have implemented reachability-based techniques which allow the selection of distributed test objectives in the form of timed scenarios with high-coverage of critical multicast communications achieving an up-to-date state of the sensors network.","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115347145","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Message from the NEXTA 2019 Chairs 2019届下届主席致辞
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2019-04-01 DOI: 10.1109/icstw.2019.00023
Adnan Causevic, P. Potena, Kristian Wiklund, Markus Borg
{"title":"Message from the NEXTA 2019 Chairs","authors":"Adnan Causevic, P. Potena, Kristian Wiklund, Markus Borg","doi":"10.1109/icstw.2019.00023","DOIUrl":"https://doi.org/10.1109/icstw.2019.00023","url":null,"abstract":"We are pleased to welcome you to the NEXTA 2019 workshop session, as part of the NEXTINTUI-VV-PART Joint Workshop Day (bringing together the workshops NEXTA, INTUITTESTBEDS, VVIoT, and TAIC PART), which is organized with the 12th IEEE International Conference on Testing, Verification and Validation of Software (ICST 2019) in Xi’an, China. This will be a forum to bring together researchers and practitioners, enabling them to exchange ideas, address fundamental challenges in software test automation, testing through the GUI, testing event-driven software, V&V of IoT, and address software problems faced by the industry.","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"0 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128365522","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Message from the VVIoT 2019 Chairs 2019年VVIoT主席致辞
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2019-04-01 DOI: 10.1109/icstw.2019.00015
{"title":"Message from the VVIoT 2019 Chairs","authors":"","doi":"10.1109/icstw.2019.00015","DOIUrl":"https://doi.org/10.1109/icstw.2019.00015","url":null,"abstract":"","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129691951","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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