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2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)最新文献

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Reduce Test Cost by Reusing Test Oracles through Combinatorial Join 通过组合连接复用Test oracle来降低测试成本
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2019-04-22 DOI: 10.1109/ICSTW.2019.00061
Hiroshi Ukai, Xiao Qu, H. Washizaki, Y. Fukazawa
{"title":"Reduce Test Cost by Reusing Test Oracles through Combinatorial Join","authors":"Hiroshi Ukai, Xiao Qu, H. Washizaki, Y. Fukazawa","doi":"10.1109/ICSTW.2019.00061","DOIUrl":"https://doi.org/10.1109/ICSTW.2019.00061","url":null,"abstract":"Methods to generate combinatorial test suites have been extensively studied in the combinatorial interaction testing (CIT) community, but the creation of test oracles for the test cases remains a challenging and expensive task because they are created manually. In this paper, we propose a novel technique to \"join\" multiple test suites into one while satisfying the required combinatorial coverage of the system under test. This technique allows test oracles designed and created in earlier testing phases to be reused in later ones. Our study results indicate that the technique can reduce the total test cost to design and execute a test suite by more than 55% compared to the conventional testing approach.","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128320098","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Learning to Restrict Test Range for Compiler Test 学习限制编译器测试的测试范围
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2019-04-22 DOI: 10.1109/ICSTW.2019.00064
Junhua Zhu, LiMing Wang, Y. Gu, Xiaojun Lin
{"title":"Learning to Restrict Test Range for Compiler Test","authors":"Junhua Zhu, LiMing Wang, Y. Gu, Xiaojun Lin","doi":"10.1109/ICSTW.2019.00064","DOIUrl":"https://doi.org/10.1109/ICSTW.2019.00064","url":null,"abstract":"it is a tremendous challenge to guarantee the correctness of compilers in a limited time, especially when the compiler product is immature. It is necessary to restrict the test range to avoid over-testing, since our compiler products are usually delivered for specific domain. We perform feature extraction on user code through machine learning and use feature information for fuzzy test case generation. The probability of bugs detected has been improved 3.7 times and case size has been reduced 70%.","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116573145","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Crucial Tool Features for Successful Combinatorial Input Parameter Testing in an Industrial Application 在工业应用中成功组合输入参数测试的关键工具特征
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2019-04-22 DOI: 10.1109/ICSTW.2019.00050
C. Eitner, F. Wotawa
{"title":"Crucial Tool Features for Successful Combinatorial Input Parameter Testing in an Industrial Application","authors":"C. Eitner, F. Wotawa","doi":"10.1109/ICSTW.2019.00050","DOIUrl":"https://doi.org/10.1109/ICSTW.2019.00050","url":null,"abstract":"In this paper, we report on the use of available combinatorial testing tools on a large industrial object-oriented .N E T application to find out whether combinatorial testing methods are readily usable to perform combinatorial input parameter testing in an industrial setup. In particular, we applied CAmetrics and CCM to compute the combinatorial coverage of existing tests, and CAgen and ACTS to generate test suites from scratch. We identified shortcomings in some of the tools that may prevent them from being used in practice.","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116000533","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Testing When Mobile Apps Go to Background and Come Back to Foreground 测试手机应用进入后台和返回前台的时间
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2019-04-22 DOI: 10.1109/ICSTW.2019.00038
A. C. Paiva, João M. E. P. Gouveia, Jean-David Elizabeth, M. Delamaro
{"title":"Testing When Mobile Apps Go to Background and Come Back to Foreground","authors":"A. C. Paiva, João M. E. P. Gouveia, Jean-David Elizabeth, M. Delamaro","doi":"10.1109/ICSTW.2019.00038","DOIUrl":"https://doi.org/10.1109/ICSTW.2019.00038","url":null,"abstract":"Mobile applications have some specific characteristics not found on web and desktop applications. The mobile testing tools available may not be prepared to detect problems related to those specificities. So, it is important to assess the quality of the test cases generated/executed by mobile testing tools in order to check if they are able to find those specific problems. One way to assess the quality of a test suite is through mutation testing. This paper presents new mutation operators created to inject faults leading to known failures related to the non-preservation of users transient UI state when mobile applications go to background and then come back to foreground. A set of mutation operators is presented and the rational behind its construction is explained. A case study illustrates the approach to evaluate a mobile testing tool. In this study, the tool used is called iMPAcT tool, however any other mobile testing tool could be used. The experiments are performed over mobile applications publicly available on the Google Play store. The results are presented and discussed. Finally, some improvements are suggested for the iMPAcT tool in order to be able to generate test cases that can kill more mutants and so, hopefully, detect more failures in the future.","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"33 14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126019645","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
A Framework for Automated Combinatorial Test Generation, Execution, and Fault Characterization 用于自动组合测试生成、执行和故障表征的框架
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2019-04-22 DOI: 10.1109/ICSTW.2019.00057
Joshua Bonn, Konrad Foegen, H. Lichter
{"title":"A Framework for Automated Combinatorial Test Generation, Execution, and Fault Characterization","authors":"Joshua Bonn, Konrad Foegen, H. Lichter","doi":"10.1109/ICSTW.2019.00057","DOIUrl":"https://doi.org/10.1109/ICSTW.2019.00057","url":null,"abstract":"Fault characterization is an important part of combinatorial testing, enabling it to automatically narrow down failed test inputs to specific failure-inducing combinations. As most current fault characterization algorithms adaptively generate more test inputs based on previous test execution results, a framework that integrates modelling, generation, execution, and fault characterization is necessary. Until now, no such framework exists, resulting in much manual work needed to identify failureinducing combinations.We therefore introduce COFFEe, which is a framework for completely automatic combinatorial testing and fault characterization. In this paper, we derive an architecture for the framework and present coffee4j, a Java implementation of COFFEe that integrates the JUnit5 test framework.","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128797481","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 15
Partitioned Search with Column Resampling for Locating Array Construction 用列重采样的分区搜索定位阵列结构
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2019-04-22 DOI: 10.1109/ICSTW.2019.00056
Erin Lanus, C. Colbourn, D. Montgomery
{"title":"Partitioned Search with Column Resampling for Locating Array Construction","authors":"Erin Lanus, C. Colbourn, D. Montgomery","doi":"10.1109/ICSTW.2019.00056","DOIUrl":"https://doi.org/10.1109/ICSTW.2019.00056","url":null,"abstract":"Locating arrays are designs used in combinatorial testing with the property that every set of d t-way interactions appears in a unique set of tests. Using a locating array to conduct fault testing ensures that faulty interactions can be located when there are d or fewer faults. Locating arrays are fairly new and few techniques have been explored for their construction. Most of the available work is limited to finding only one fault. Known general methods require a covering array of strength t+d and produce many more tests than are needed. We present Partitioned Search with Column Resampling (PSCR), a randomized computational search algorithmic framework to verify if an array is (d, t)-locating by partitioning the search space to decrease the number of comparisons. If a candidate array is not locating, random resampling is performed until a locating array is constructed or an iteration limit is reached. Results are compared against known locating array constructions from covering arrays of higher strength and against published results of mixed level locating arrays for parameters of real-world systems. The use of PSCR to build larger locating arrays from a variety of ingredient arrays is explored.","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129211390","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Automatic Refinement of ASM Abstract Test Cases ASM抽象测试用例的自动细化
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2019-04-22 DOI: 10.1109/ICSTW.2019.00025
Paolo Arcaini, E. Riccobene
{"title":"Automatic Refinement of ASM Abstract Test Cases","authors":"Paolo Arcaini, E. Riccobene","doi":"10.1109/ICSTW.2019.00025","DOIUrl":"https://doi.org/10.1109/ICSTW.2019.00025","url":null,"abstract":"Model refinement is a specification approach widely used in formal modeling to deal with the complexity of large and complicated requirements. Specific artefacts are usually developed to complement specification with validation and verification activities. To avoid boresome and time-consuming activities when reusing models, in a model refinement specification process, techniques supporting reusability of formal development artefacts are highly desirable. In this paper, we tackle the problem of defining a technique for automatic refinement of abstract test cases for formal models given in terms of the Abstract State Machines (ASMs). We present an approach, based on a classical test generation technique exploiting model checking, able to reuse information of test cases obtained at a given level of abstraction in order to define, in an automatic way, the same kind of artefacts at a subsequent refinement level. We evaluate our approach on real case studies specified in ASMs by a sequence of refinement models.","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125689443","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Prediction of Undetected Faults in Safety-Critical Software 安全关键软件中未发现故障的预测
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2019-04-22 DOI: 10.1109/ICSTW.2019.00069
Johan Sundell, Richard Torkar, K. Lundqvist, H. Forsberg
{"title":"Prediction of Undetected Faults in Safety-Critical Software","authors":"Johan Sundell, Richard Torkar, K. Lundqvist, H. Forsberg","doi":"10.1109/ICSTW.2019.00069","DOIUrl":"https://doi.org/10.1109/ICSTW.2019.00069","url":null,"abstract":"Safety-critical software systems need to meet exceptionally strict standards in terms of dependability. Best practice to achieve this is to follow and develop the software according to domain specific standards. These standards give guidelines on development and testing activities. The challenge is that even if you follow the steps of the appropriate standard you have no quantification of the amount of faults potentially still lingering in the system. This paper presents a way to statistically estimate the amount of undetected faults, based on test results.","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"170 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133493825","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Efficient and Guaranteed Detection of t-Way Failure-Inducing Combinations t路诱导故障组合的有效和保证检测
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2019-04-22 DOI: 10.1109/ICSTW.2019.00054
Paolo Arcaini, A. Gargantini, M. Radavelli
{"title":"Efficient and Guaranteed Detection of t-Way Failure-Inducing Combinations","authors":"Paolo Arcaini, A. Gargantini, M. Radavelli","doi":"10.1109/ICSTW.2019.00054","DOIUrl":"https://doi.org/10.1109/ICSTW.2019.00054","url":null,"abstract":"Combinatorial testing is a widely applied black-box testing technique, which is used to detect failures caused by parameter interactions (we call them failure-inducing combinations). Traditional combinatorial testing techniques provide fault detection, but most of them have weak fault diagnosis. In this paper, we propose a new fault characterization method called MixTgTe to locate all the failure-inducing combinations in a system under test, up to an interaction size decided by the user. Our method is based on adaptive black-box testing, in which test cases are generated based on outcomes of previous tests. We show that our method performs better than existing strategies that explore all the faults first, and then obtain the failure-inducing combination(s) for each failure.","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129702874","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Practical Fault Localization with Combinatorial Test Design 组合试验设计的实用故障定位
2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Pub Date : 2019-04-01 DOI: 10.1109/ICSTW.2019.00063
D. Blue, Andrew Hicks, Ryan Rawlins, Rachel Tzoref
{"title":"Practical Fault Localization with Combinatorial Test Design","authors":"D. Blue, Andrew Hicks, Ryan Rawlins, Rachel Tzoref","doi":"10.1109/ICSTW.2019.00063","DOIUrl":"https://doi.org/10.1109/ICSTW.2019.00063","url":null,"abstract":"Combinatorial test design is a well-known effective technique for test planning. However, in order to fully realize its potential in industrial settings, it needs to be considered as an integral part of the end to end testing flow rather than as an isolated component. In this work, we present an automated end to end solution for CTD-based test optimization, generation, execution and fault localization, implemented in an industrial framework. We further report on our initial promising experience in applying it to an industrial product.","PeriodicalId":310230,"journal":{"name":"2019 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126941495","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
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