2014 15th Latin American Test Workshop - LATW最新文献

筛选
英文 中文
Improving the robustness of a switch box in a mesh of clusters FPGA 提高集群网格FPGA中开关盒的鲁棒性
2014 15th Latin American Test Workshop - LATW Pub Date : 2014-03-12 DOI: 10.1109/LATW.2014.6841901
Arwa Ben Dhia, M. Slimani, L. Naviner
{"title":"Improving the robustness of a switch box in a mesh of clusters FPGA","authors":"Arwa Ben Dhia, M. Slimani, L. Naviner","doi":"10.1109/LATW.2014.6841901","DOIUrl":"https://doi.org/10.1109/LATW.2014.6841901","url":null,"abstract":"As CMOS feature sizes are shrinking, manufacturing defects are becoming a growing concern in micro and nanoelectronics. This work deals with defect tolerance in FPGAs that are surely affected by technology downscaling. In this paper, we are interested in enhancing the defect tolerance of a switch box in a mesh of clusters FPGA, while trying to reduce the hardening cost. First, we had to spot, among the switch box multiplexers, the most eligible one to be hardened. Then, we built different possible architectures for the latter by assembling different standard cells from a 65nm industrial library. These architectures were studied under single defect injection by a tool that models several possible defects for a given design according to its extracted netlist. Eventually, the most robust architecture was picked.","PeriodicalId":305922,"journal":{"name":"2014 15th Latin American Test Workshop - LATW","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-03-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126896027","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信