2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)最新文献

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Temperature acceleration models in reliability predictions: Justification & improvements 可靠性预测中的温度加速模型:论证与改进
2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2010-04-15 DOI: 10.1109/RAMS.2010.5448028
F. Bayle, A. Mettas
{"title":"Temperature acceleration models in reliability predictions: Justification & improvements","authors":"F. Bayle, A. Mettas","doi":"10.1109/RAMS.2010.5448028","DOIUrl":"https://doi.org/10.1109/RAMS.2010.5448028","url":null,"abstract":"Reliability predictions have been for a long time a difficult task, due to the conflict between high reliability requirements and the lack of component manufacturer data. As the data available during the development phase is the product bill of materials, reliability prediction methods have developed component reliability models based on in-service field return data and/or physics of failure. The repartition of these two approaches has changed over time, where predictions were mainly based on empirical data at the beginning (MIL-HDBK-217), but more recently attempts have been made to incorporate some form of physics of failure (MIL217+, FIDES). Note, that even in these attempts the acceleration factor coefficients are still based on empirical data.","PeriodicalId":299782,"journal":{"name":"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)","volume":"183 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122046046","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 52
Feasibility of provisioning spares using reliability software programs 使用可靠性软件程序发放备件的可行性
2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2010-04-15 DOI: 10.1109/RAMS.2010.5448065
Reuben A. Mann, Peter C. Rich
{"title":"Feasibility of provisioning spares using reliability software programs","authors":"Reuben A. Mann, Peter C. Rich","doi":"10.1109/RAMS.2010.5448065","DOIUrl":"https://doi.org/10.1109/RAMS.2010.5448065","url":null,"abstract":"Accurate modeling of a system's operational availability is vital to determine its sparing needs. Two different families of sparing tools are available to model operational availability. The first was designed for use by the logistics community and the second was designed by the reliability community. Both of these families of tools were analyzed to obtain an understanding on their differences for the following attributes: 1. System structure 2. Reliability distributions 3. Corrective maintenance distributions 4. Preventative maintenance 5. Operating/sparing sites 6. Resource usage 7. Phase diagrams 8. Tool pedigree 9. Spares optimization method Both families of tools are capable of provisioning spares, but each family of tools has its advantages and disadvantages. Proper selection should be made depending upon the system's operational and maintenance philosophy.","PeriodicalId":299782,"journal":{"name":"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126142437","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
SEU concept to reality (allocation, prediction, mitigation) 从SEU概念到现实(分配、预测、缓解)
2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2010-04-15 DOI: 10.1109/RAMS.2010.5448078
N. Bidokhti
{"title":"SEU concept to reality (allocation, prediction, mitigation)","authors":"N. Bidokhti","doi":"10.1109/RAMS.2010.5448078","DOIUrl":"https://doi.org/10.1109/RAMS.2010.5448078","url":null,"abstract":"For a number of years products are being impacted by transient faults that cause the systems to fail and returned to suppliers as returned material authorization (RMA). After further analysis, they deemed to be good and no problem found and ultimately sent back out to potential customers and replacements. These returns are most likely being caused by Single Event Upsets.","PeriodicalId":299782,"journal":{"name":"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129405812","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 23
Optimal design of step stress accelerated degradation test and reliability assessment for quartz flexible accelerometers 石英挠性加速度计阶跃应力加速退化试验优化设计及可靠性评估
2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2010-04-15 DOI: 10.1109/RAMS.2010.5448018
Huiguo Zhang, Yunxia Chen, R. Kang
{"title":"Optimal design of step stress accelerated degradation test and reliability assessment for quartz flexible accelerometers","authors":"Huiguo Zhang, Yunxia Chen, R. Kang","doi":"10.1109/RAMS.2010.5448018","DOIUrl":"https://doi.org/10.1109/RAMS.2010.5448018","url":null,"abstract":"This paper presents a optimal design approach of step stress accelerated degradation test (SSADT) for quartz flexible accelerometers under the assumption that the degradation of each accelerometer follows a Wiener process and the degradation rate at different stress levels satisfies an Arrhenius function. The asymptotic variance of the pth percentile of lifetime is adopted as optimization objective and its expression formula is provided using the maximum likelihood estimate (MLE) method. The total experimental cost is chosen as a constraint with its expression formula provided. An algorithm is stated to solve the optimal design problem and a Monte Carlo simulation optimization program is developed based on the algorithm. Then, the optimal test plan is obtained after determining the optimization parameters and the SSADT is conducted based on the optimal test plan. At the end of this paper, using SSADT result data, the reliability of quartz flexible accelerometers is assessed by statistical analysis technique of Wiener process and inverse Gaussian distribution (IGD).","PeriodicalId":299782,"journal":{"name":"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130962897","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Analyzing failure frequency and severity in communication networks 分析通信网络故障的频率和严重程度
2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2010-04-15 DOI: 10.1109/RAMS.2010.5447990
T. Matsukawa, H. Funakoshi
{"title":"Analyzing failure frequency and severity in communication networks","authors":"T. Matsukawa, H. Funakoshi","doi":"10.1109/RAMS.2010.5447990","DOIUrl":"https://doi.org/10.1109/RAMS.2010.5447990","url":null,"abstract":"Methods for analyzing failures in communication networks are described and a new method is proposed. Failure frequency and severity are important as criteria to evaluate the impacts of failures on users and network operation. The time trend of failure frequency is analyzed by using the cumulative number failures, and the failure severity is described by the product of outage time and the number of users affected by a failure. The relationship of failure frequency and severity is estimated by the generalized Pareto probability distribution. Examples of analyzing failures by using the outage data collected in an actual communication network are presented. The proposed method facilitates the operation and management of carrier-grade communication networks provided to millions of end users. Our proposed method can be flexibly applied to various types of network structures and has been used successfully in our work.","PeriodicalId":299782,"journal":{"name":"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121723755","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Spare part inventory control driven by condition based maintenance 基于状态维护的备件库存控制
2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2010-04-15 DOI: 10.1109/RAMS.2010.5448059
H. Liao, Mitchell Rausch
{"title":"Spare part inventory control driven by condition based maintenance","authors":"H. Liao, Mitchell Rausch","doi":"10.1109/RAMS.2010.5448059","DOIUrl":"https://doi.org/10.1109/RAMS.2010.5448059","url":null,"abstract":"The ability to predict and prevent equipment failures is essential for managing a manufacturing process. Once failure symptoms are detected, timely maintenance needs to be performed with the support of required spare parts. However, the availability of spare parts often becomes the bottleneck of process throughput, and sometimes expensive emergency orders of spare parts have to be placed to meet a production due date. This paper addresses a joint production and spare part inventory control strategy driven by condition based maintenance (CBM) for a piece of manufacturing equipment with a critical unit. Specifically, the amount of degradation of the unit is monitored continuously during operation and used to drive replacement actions and spare part inventory control under both production lot size and due date constraints. A degradation limit maintenance policy and a base-stock spare part inventory control policy are integrated to manage the manufacturing process. The objective is to ascertain the service level for spare parts while minimizing the total operating cost. To determine the optimal base-stock level of spare parts and maintenance threshold, a two-stage approach using constrained least square approximation and simulation-based optimization techniques is developed. An automotive engine manufacturing process is provided to demonstrate the use of the proposed decision making strategy.","PeriodicalId":299782,"journal":{"name":"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114276258","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 19
Vehicle wide optimization of subsystem trade study option selection 整车优化子系统交易研究方案选择
2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2010-04-15 DOI: 10.1109/RAMS.2010.5448038
C. Mattenberger
{"title":"Vehicle wide optimization of subsystem trade study option selection","authors":"C. Mattenberger","doi":"10.1109/RAMS.2010.5448038","DOIUrl":"https://doi.org/10.1109/RAMS.2010.5448038","url":null,"abstract":"As demand for highly reliable complex systems increases, engineers are being forced to consider the risk implications of design decisions earlier in the conceptual phase of projects and with greater accuracy. In highly mass constrained systems, in order to achieve increased reliability, buying down risk with mass cannot be considered from a ‘stove-piped’ stand point, but rather it must be approached from a global system perspective. The Altair lunar lander design team was able to implement a process of Risk Informed Design utilizing the Valador Reliability Tool [1] (VRT) in order to achieve high reliability. This tool is able to quickly and accurately produce estimates of the risk of Loss of Mission (LOM) and Loss of Crew (LOC) and provide insight to the designers as to how their decisions will impact overall mission success.","PeriodicalId":299782,"journal":{"name":"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125264030","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Using electronic design automation throughout the product life cycle 在整个产品生命周期内采用电子设计自动化
2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2010-04-15 DOI: 10.1109/RAMS.2010.5447999
B. Stallard, M. Silverman
{"title":"Using electronic design automation throughout the product life cycle","authors":"B. Stallard, M. Silverman","doi":"10.1109/RAMS.2010.5447999","DOIUrl":"https://doi.org/10.1109/RAMS.2010.5447999","url":null,"abstract":"Essentially all circuitry in use today has been designed using electronic design automation (EDA) tools to meet the intended requirements. Virtually every EE student in the last three decades has been introduced to these tools in school, and there is general familiarity with their usage paradigm. As their capabilities have evolved, the thrust of the EDA firms has been toward higher performance, more functionality, and more cost, and the emergence of a cadre of highly specialized and skilled professionals who are the houses' de facto gurus for the circuits they design and move into production.","PeriodicalId":299782,"journal":{"name":"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115142885","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
A conceptual model for “inherent reliability” for nuclear weapons 核武器“固有可靠性”的概念模型
2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2010-04-15 DOI: 10.1109/RAMS.2010.5447992
R. Bierbaum
{"title":"A conceptual model for “inherent reliability” for nuclear weapons","authors":"R. Bierbaum","doi":"10.1109/RAMS.2010.5447992","DOIUrl":"https://doi.org/10.1109/RAMS.2010.5447992","url":null,"abstract":"Many people, when thinking about different stages of a particular device's life vis-à-vis defectiveness, use the notion of the “bathtub curve” as a model. However this model is not fully applicable for the class of systems referred to as one-shot or single-shot systems. Key attributes of these systems are outlined in [1]: they typically stay in dormant storage until called upon for one-time use. Common examples of one-shot devices are air-bags in vehicles, fire suppression systems, certain types of safety features in nuclear power plants, missiles, thermal batteries, and some stand-by systems. This paper will focus on a particular example of one-shot systems, nuclear weapons, but the concepts presented are relevant for one-shot devices in general. A new model will be proposed as an alternative to the bathtub curve for one-shot systems. The new model includes two regimes: birth defect dominated and time-dependent dominated. A short discussion of why a bathtub curve might mistakenly be inferred is included. Finally, the relationship between inherent and estimated reliability will be described in the context of this model.","PeriodicalId":299782,"journal":{"name":"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134544095","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Accurate modeling of shared components in high reliability applications 高可靠性应用中共享组件的精确建模
2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2010-04-15 DOI: 10.1109/RAMS.2010.5447969
J. Bukowski, Chris O'Brien
{"title":"Accurate modeling of shared components in high reliability applications","authors":"J. Bukowski, Chris O'Brien","doi":"10.1109/RAMS.2010.5447969","DOIUrl":"https://doi.org/10.1109/RAMS.2010.5447969","url":null,"abstract":"This paper addresses how to model and evaluate the risk reduction factor (RRF) of safety instrumented systems (SIS) when one or more of the components in the SIS can cause the dangerous condition or hazard that the SIS is designed to protect against. Generally a failure that can cause a hazard is referred to as an initiating event (IE). International standards for SIS safety evaluation require that shared components either be prohibited or accurately modeled. Current practice generally falls into one of two extremes, ignoring any degradation of system reliability due to shared components or completely discounting any improvements in reliability as a result of redundancy created by the shared component. This paper shows how to accurately model shared components in an SIS and proposes a methodology for simplified modeling techniques when certain criteria are met. Ignoring the interaction of shared components can result in estimates of reliability being optimistic by a factor of 2 or more. Conversely, taking no credit for the redundancy created by the shared component results in estimates of reliability that can be overly pessimistic. Several examples modeling shared components with varying degrees of independence illustrate the impact on overall system reliability.","PeriodicalId":299782,"journal":{"name":"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133129396","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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