SEU concept to reality (allocation, prediction, mitigation)

N. Bidokhti
{"title":"SEU concept to reality (allocation, prediction, mitigation)","authors":"N. Bidokhti","doi":"10.1109/RAMS.2010.5448078","DOIUrl":null,"url":null,"abstract":"For a number of years products are being impacted by transient faults that cause the systems to fail and returned to suppliers as returned material authorization (RMA). After further analysis, they deemed to be good and no problem found and ultimately sent back out to potential customers and replacements. These returns are most likely being caused by Single Event Upsets.","PeriodicalId":299782,"journal":{"name":"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"23","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 Proceedings - Annual Reliability and Maintainability Symposium (RAMS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RAMS.2010.5448078","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 23

Abstract

For a number of years products are being impacted by transient faults that cause the systems to fail and returned to suppliers as returned material authorization (RMA). After further analysis, they deemed to be good and no problem found and ultimately sent back out to potential customers and replacements. These returns are most likely being caused by Single Event Upsets.
从SEU概念到现实(分配、预测、缓解)
多年来,产品一直受到瞬态故障的影响,这些故障导致系统失效,并作为退货材料授权(RMA)退回给供应商。经过进一步的分析,他们认为是好的,没有发现问题,并最终退回给潜在客户和替代品。这些回报很可能是由单一事件引发的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信