{"title":"An investigation into the fretting behavior of gold flashed palladium-nickel plating systems","authors":"E. Walczuk, D. Boczkowski, D. Wojcik-Grzybek","doi":"10.1109/HOLM.1999.795946","DOIUrl":"https://doi.org/10.1109/HOLM.1999.795946","url":null,"abstract":"The equipment used for the collection of contact resistance data under fretting conditions is presented. The fretting testing apparatus including the computer control measuring system is presented. The investigations of fretting behavior of cobalt-hardened gold surface and two gold flashed palladium-nickel plated surfaces were conducted.","PeriodicalId":299141,"journal":{"name":"Electrical Contacts - 1999. Proceedings of the Forty-Fifth IEEE Holm Conference on Electrical Contacts (Cat. No.99CB36343)","volume":"120 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121388493","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Analysis of field failures of aluminum-copper pigtail splices made with twist-on connectors","authors":"J. Aronstein","doi":"10.1109/HOLM.1999.795931","DOIUrl":"https://doi.org/10.1109/HOLM.1999.795931","url":null,"abstract":"A new type of twist-on splicing connector for use with aluminum and copper wire combinations was utilized to reconnect wire terminations in a group of residential apartment units. The connector differs from conventional twist-on connectors in that it is pre-filled with a corrosion inhibitor compound containing suspended particulates. Burnout occurring among these splices led to removal and replacement of all of the new connectors. In this study, the connectors removed from 102 apartments were inspected for signs of overheating and for indications of abnormal conditions that might cause the failed connectors included samples that were applied to rated wire combinations and showed no sign of abnormal installation or application conditions. Tests of the aluminum conductors from the apartments reveal no abnormalities that could account for the poor performance of the new connector. The inhibitor compound inside the connector was determined to be of limited effectiveness in improving the wire-to-wire contact through the high resistance film on the aluminum wire surface. On the basis of the field failures in combination with previously reported laboratory studies it is concluded that the connector is not suitable for permanent use with aluminum wire residential wiring systems.","PeriodicalId":299141,"journal":{"name":"Electrical Contacts - 1999. Proceedings of the Forty-Fifth IEEE Holm Conference on Electrical Contacts (Cat. No.99CB36343)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116382398","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Preliminary investigation on error code rate of high speed digital circuitry caused by electrical contact failure","authors":"B.S. Sun, J.G. Zhang, G. Liang, L.B. Cheng","doi":"10.1109/HOLM.1999.795943","DOIUrl":"https://doi.org/10.1109/HOLM.1999.795943","url":null,"abstract":"It is found that one of the most important reasons causing high error code rates in digital communication systems is the contact failure of coaxial connectors installed in the systems. Preliminary investigation into the failed connectors collected in-situ has revealed that the contact failure of coaxial connectors may be caused by many factors, such as corroded products or dust particles on the contact surfaces, and the change of normal contact force caused by relaxation of the spring elements, etc. It is interesting to learn how the contact failure causes high and erratic contact impedance and results in error codes in digital communication systems which are still unknown. The effects of tarnish materials on the contact impedance and also the influence of the contact failure on digital signal transmission are studied theoretically and experimentally. Some of the results and tentative conclusions are presented in this paper.","PeriodicalId":299141,"journal":{"name":"Electrical Contacts - 1999. Proceedings of the Forty-Fifth IEEE Holm Conference on Electrical Contacts (Cat. No.99CB36343)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125584278","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The impact of sliding motion and current load on the deterioration of tin-coated connectors","authors":"T. Hammarm","doi":"10.1109/HOLM.1999.795948","DOIUrl":"https://doi.org/10.1109/HOLM.1999.795948","url":null,"abstract":"The deterioration of tin-coated connectors is mainly caused by macro wear during insertion/withdrawal and fretting during operation. The focal point of this macro-wear study is the increase in the contact resistance when the pure-tin layer is removed and the rider slides on the hard and uneven intermetallic compound, which is referred to as Stage II. Stage II has been divided into two \"sub-stages\", referred to as Stage IIa and Stage IIb, with the transition point between the two defined by a sharp rise in the magnitude of the voltage drop. The transition between Stages IIa and IIb ranged between 70-130 mV, independent of current load. The upper and lower ends of this range correspond to the softening and fusion voltages of tin respectively. The sliding speed has a significant effect on the deterioration during Stage IIa, while the current load does not significantly influence the deterioration as long as the electrically-induced heat is low. In this study an outline of an oxidation model is proposed for describing the deterioration during Stage IIa, and to determine an oxidation constant. Furthermore, the length of duration of Stage IIa can be derived and expressed simply as the inverted value of the oxidation constant.","PeriodicalId":299141,"journal":{"name":"Electrical Contacts - 1999. Proceedings of the Forty-Fifth IEEE Holm Conference on Electrical Contacts (Cat. No.99CB36343)","volume":"74 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124364618","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Study of electric field between two electrodes with arc at a low voltage: The experimental verification of the theoretical model","authors":"D. Podolsky, V. Kapustin, V. Metscheraykov","doi":"10.1109/HOLM.1999.795933","DOIUrl":"https://doi.org/10.1109/HOLM.1999.795933","url":null,"abstract":"The purpose of this paper is both the experimental verification of the theoretical model of electric field in arc presence and developing a new circuit breaker design approach. The experimental idea was based on numerical calculation. It consists of measurement of back strike probability for two dummy embodiments. The calculation has shown that the back strike must take place in the first embodiment, but the back strike probability is zero in the second embodiment. The experimental measurements confirm the numerical calculation results fully.","PeriodicalId":299141,"journal":{"name":"Electrical Contacts - 1999. Proceedings of the Forty-Fifth IEEE Holm Conference on Electrical Contacts (Cat. No.99CB36343)","volume":"801 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131633627","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Characteristics of surface film on slipring in the low atmospheric pressure","authors":"T. Ueno, K. Sawa","doi":"10.1109/6144.846761","DOIUrl":"https://doi.org/10.1109/6144.846761","url":null,"abstract":"The surface film of slipring is important for good sliding contact of brush and slipring. This film formation is influenced by the brush material, the atmospheric temperature, humidity and atmospheric pressure. The condition of sliding contact and surface film can be guessed by the measurement of contact voltage drops. The contact resistance is classified into constriction resistance and film resistance. From the results of this paper, in the low atmospheric pressure, the oxidized film scarcely grew on the slipring surface, so the contact resistance is thought to be generated mainly by the current constriction. Further, it can be found that the resistance in the low atmospheric pressure was only constriction resistance, and that the resistance in the air was composed of the constriction resistance and film resistance. The wear length of the test brushes, depending upon the brush grade, was many times larger than the wear in the air.","PeriodicalId":299141,"journal":{"name":"Electrical Contacts - 1999. Proceedings of the Forty-Fifth IEEE Holm Conference on Electrical Contacts (Cat. No.99CB36343)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131044886","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
L. Morin, N. Ben Jemaa, D. Jeannot, J. Pinard, L. Nedelec
{"title":"Make arc erosion and welding in the automotive area","authors":"L. Morin, N. Ben Jemaa, D. Jeannot, J. Pinard, L. Nedelec","doi":"10.1109/6144.846760","DOIUrl":"https://doi.org/10.1109/6144.846760","url":null,"abstract":"A make arc has been investigated using a new testing apparatus. This apparatus which includes a piezotranslator, enables controlled bouncing to be studied at make under mechanical conditions similar to those encountered in automotive relays. Material transfer and welding tendency of silver, silver alloys and silver metal oxide contact materials have been studied under inductive, resistive and lamp loads at 14 V DC and 10-70 A. With all loads, anode to cathode material transfer has been observed, AgCdO, Ag and AgNi under lamp and resistive loads show the highest material transfer, as opposed to non doped and doped AgSnO/sub 2/ under inductive loads. This well known transfer is due to the anodic arc, which occurs during bounces when the gap between the contacts is shorter than /spl sim/5 /spl mu/m, at the beginning and the end of the bounce. We have demonstrated that welding occurs in the beginning of the bounce, i.e. when the contacts begin to separate under arc, and not when the contacts close under arc at the end of the bounce. It was found that welding occurs mainly with Ag, AgCdO, AgZnO, AgFeRe and AgFeOx contact materials, and under high inrush current produced by lamp loads.","PeriodicalId":299141,"journal":{"name":"Electrical Contacts - 1999. Proceedings of the Forty-Fifth IEEE Holm Conference on Electrical Contacts (Cat. No.99CB36343)","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114557675","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Contact current distortion due to the tunnel effect","authors":"E. Takano","doi":"10.1109/HOLM.1999.795939","DOIUrl":"https://doi.org/10.1109/HOLM.1999.795939","url":null,"abstract":"Harmonic analyses and measurements of the tunneling currents through a thin insulating film between two electrodes have been conducted. The equation for tunneling current derived by J.G. Simmons was analyzed by Fourier expansion, and a numerical evaluation of the third harmonic ratio was performed. The theoretical third harmonic ratio was determined to be a function of s/spl psi//sub 0//sup 1/2/ (s is film thickness, /spl psi//sub 0/ is work function) and to fall between -40 and -83 dB when s was in the range of practical importance (0.4 to 2.0 nm) and /spl psi//sub 0/ was between 1 and 4 eV. Experiments on practical contacts (95Au-5Ni) indicated an actual third harmonic ratio between -50 and -130 dB. Contact resistance was measured for copper contacts with a thin insulating film. A small temperature coefficient for resistivity proved that the tunnel effect was contributing to the measurements. It was shown that the harmonic measurement could clearly detect the film, which could further deteriorate the contact performance by corrosion.","PeriodicalId":299141,"journal":{"name":"Electrical Contacts - 1999. Proceedings of the Forty-Fifth IEEE Holm Conference on Electrical Contacts (Cat. No.99CB36343)","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121415187","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
V. Samoilov, S. Akachev, V. Kapustin, V. Mestcheryakov
{"title":"Physical processes at opening contacts","authors":"V. Samoilov, S. Akachev, V. Kapustin, V. Mestcheryakov","doi":"10.1109/HOLM.1999.795935","DOIUrl":"https://doi.org/10.1109/HOLM.1999.795935","url":null,"abstract":"A recent paper investigated causes of high current arc immobility at opening contacts in air. It is shown that the main causes of immobility are small breaker opening speed and inertia of arc concerned with the presence of contact material vapors, metal droplets and plasma jets. Influence of external magnetic field on high current arc mobility in narrow interelectrode gap is analyzed. In this case it is found that the time of arc immobility may be decreased to 130 /spl mu/s at current equal to 2 kA.","PeriodicalId":299141,"journal":{"name":"Electrical Contacts - 1999. Proceedings of the Forty-Fifth IEEE Holm Conference on Electrical Contacts (Cat. No.99CB36343)","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123782691","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The volumetric erosion of electrical contacts","authors":"J. McBride","doi":"10.1109/6144.846756","DOIUrl":"https://doi.org/10.1109/6144.846756","url":null,"abstract":"This paper presents an investigation of worn electrical contacts, to ascertain the volumetric erosion changes. The main emphasis in this paper is on the measurement of volume relative to a contact support surface, allowing severely eroded contacts to be measured. A non-contact system is described, which allows contacts to be evaluated for volume change without the contact being removed from contact supports. The accuracy of the measurement method is discussed and results show how the volume measurement can be used to evaluate contact performance. Results are presented on the erosion characteristics of Ag/SnO/sub 2/ contacts used in automotive relays.","PeriodicalId":299141,"journal":{"name":"Electrical Contacts - 1999. Proceedings of the Forty-Fifth IEEE Holm Conference on Electrical Contacts (Cat. No.99CB36343)","volume":"172 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131698377","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}